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    CHEMICAL CHARACTERIZATION OF SURFACE FEATURES
    2.
    发明申请
    CHEMICAL CHARACTERIZATION OF SURFACE FEATURES 有权
    表面特征的化学特征

    公开(公告)号：US20140098368A1

    公开(公告)日：2014-04-10

    申请号：US14032192

    申请日：2013-09-19

    Applicant: Seagate Technology LLC

    Inventor： Joachim Walter Ahner ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  David M. Tung ,  Florin Zavaliche ,  Stephen Keith McLaurin

    IPC: G01N21/47

    CPC classification number: G01N21/4738 ,  G01N21/95 ,  G01N2021/4764 ,  G01N2021/4792 ,  G01N2201/0635 ,  G01N2201/0683

    Abstract: Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.

    Abstract translation: 本文提供的装置包括光学表征装置; 光子检测器阵列，其被配置为顺序地接收从制品的表面特征散射并随后由所述光学表征装置处理的物品的表面特征散射的第一组光子和第二组光子; 以及用于化学表征所述制品的表面特征的化学表征装置，其中所述化学表征装置被配置用于处理由所述光子检测器阵列接收的第一组光子和由所述光子检测器阵列接收的所述第二组光子。

    Distinguishing foreign surface features from native surface features
    5.
    发明授权
    Distinguishing foreign surface features from native surface features 有权
    区分异常表面特征与原生表面特征

    公开(公告)号：US09377394B2

    公开(公告)日：2016-06-28

    申请号：US14032186

    申请日：2013-09-19

    Applicant: Seagate Technology LLC

    Inventor： Joachim Walter Ahner ,  David M. Tung ,  Samuel Kah Hean Wong ,  Henry Luis Lott ,  Stephen Keith McLaurin ,  Maissarath Nassirou ,  Florin Zavaliche

    IPC: G01N21/00 ,  G01N21/94 ,  G01N21/95

    CPC classification number: G01N21/956 ,  G01N21/00 ,  G01N21/94 ,  G01N21/95

    Abstract: Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.

    Abstract translation: 本文提供的装置包括光子检测器阵列; 以及处理装置，其被配置用于处理光子检测器阵列信号，所述光子检测器阵列信号对应于从聚焦在第一焦平面中的物体的表面特征散射的第一组光子和从聚焦在第二焦点的物体的表面特征散射的第二组光子散射的光子 焦平面，其中所述处理装置还被配置用于将所述制品的外来表面特征与所述制品的外来本机特征区分开。

    FEATURE DETECTION WITH LIGHT TRANSMITTING MEDIUM
    7.
    发明申请
    FEATURE DETECTION WITH LIGHT TRANSMITTING MEDIUM 审中-公开
    具有光传输介质的特征检测

    公开(公告)号：US20140104603A1

    公开(公告)日：2014-04-17

    申请号：US14053493

    申请日：2013-10-14

    Applicant: Seagate Technology LLC

    Inventor： Joachim Walter Ahner ,  Florin Zavaliche ,  David M. Tung ,  Samuel Kah Hean Wong ,  Maissarath Nassirou ,  Henry Luis Lott ,  Stephen Keith McLaurin

    IPC: G01N21/95

    CPC classification number: G01N21/95 ,  G01B11/24 ,  G01N21/47

    Abstract: An apparatus for detecting surface features is disclosed. The apparatus may include a plurality of strands configured to contain light and further configured to transmit light from a light source to a surface of an article. The apparatus may also include a detector configured to receive light reflected from the surface of the article via the plurality of strands, wherein the detector is further configured to detect features associated with the article.

    Abstract translation: 公开了一种用于检测表面特征的装置。 该装置可以包括被配置为容纳光并且进一步被配置为将光从光源透射到物品的表面的多个股线。 该装置还可以包括检测器，其被配置为经由多个股线接收从物品的表面反射的光，其中该检测器还被配置为检测与该物品相关联的特征。

    Method for grain size analysis
    8.
    发明授权
    Method for grain size analysis 有权

    公开(公告)号：US12229933B2

    公开(公告)日：2025-02-18

    申请号：US17539964

    申请日：2021-12-01

    Applicant: Seagate Technology LLC

    Inventor： Sha Zhu ,  Maissarath Nassirou ,  Cindy Ng ,  Caiyan Lu

    IPC: G06T7/00 ,  G06T5/77 ,  G06T7/11

    Abstract: Methods for analysis of the magnetic grain using a software program effectively and accurately by improving the magnetic grain boundary contrast from an image prior to analyzing the grain size with an imaging analysis program. A method for automated grain size analysis includes obtaining a SEM electronic image of a magnetic material composed of a plurality of grains and modifying the image by smoothing the image, removing high spatial and low spatial frequencies from the image, improving contrast of the image, pixelating the image, processing the image to a binary image, and clearing outer edges of the binary image to remove at least incomplete grains to generate grain size data from the image.

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