-
41.发明授权公开(公告)号：US11251353B2
公开(公告)日：2022-02-15
申请号：US15957952
申请日：2018-04-20
申请人： HITACHI, LTD.
发明人： Akinori Nishide , Jyun Hayakawa , Ken Kurosaki , Sora-at Tanusilp
IPC分类号： H01L35/22 , H01L35/28 , H01L35/34 , C04B35/626 , C01B33/06 , C04B35/645 , C04B35/58 , C22C29/18
摘要： There is provided a thermoelectric material including a compound which is formed of an element R belonging to alkaline earth metal and lanthanoid, and an element X belonging to any of Group 13 elements, Group 14 elements, and Group 15 elements. The composition ratio of the element R and the element X is selected to obtain the compound having an AlB2 type structure.
-
公开(公告)号：US11235334B2
公开(公告)日：2022-02-01
申请号：US16918858
申请日：2020-07-01
摘要： Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement. Further, the automated analysis device 100 includes a controller 21 which controls the drive of the reaction disk 1 such that in one cycle the reaction vessels 2 move by an amount A in the circumferential direction in such a way that N and A are mutually prime, B and C are mutually prime, and the relationship A×B=N×C±1 holds, where N is the total number of reaction vessels 2 accommodated in the reaction disk 1, the reaction disk 1 moves through C (where C>1) rotations+an amount equivalent to one reaction vessel after B (where B>2) cycles, and the number of reaction vessels 2 moved in one cycle is A (where N>A>N/B+1).
-
43.发明授权公开(公告)号：US11216352B2
公开(公告)日：2022-01-04
申请号：US16616177
申请日：2018-06-01
申请人： GREENISLE INC.
发明人： Byung Nyun Park
摘要： The present invention relates to a method for automatically analyzing a bottleneck in real time and an apparatus for performing the method. The method for automatically analyzing a bottleneck in real time may comprise the steps of: an application server receiving a bottleneck analysis component; and the application server installing the bottleneck analysis component, wherein the bottleneck analysis component may add a call code for a performance information collector to an application installed on the application server that is to be monitored, wherein the bottleneck analysis component may call the performance information collector according to execution of a service function of the application, requested by a client, to generate service performance information for analyzing a bottleneck phenomenon.
-
公开(公告)号：US11193099B2
公开(公告)日：2021-12-07
申请号：US15758509
申请日：2016-07-27
摘要： Provided is a highly reliable temperature adjustment apparatus which uses a temperature adjustment element and quantitatively evaluates the temperature adjustment performance of the temperature adjustment element. The temperature adjustment apparatus is provided with: a temperature adjustment element; one or more temperature detection elements provided near the temperature adjustment element; a calculation unit for calculating the output of the temperature detection element; and a display unit for displaying at least one of a time calculated by the calculation unit as a time at which the temperature adjustment performance of the temperature adjustment is predicted to be below a desired level, the number of operations and the time of current conduction or a warning based on the result of calculation.
-
公开(公告)号：US11183362B2
公开(公告)日：2021-11-23
申请号：US16765737
申请日：2017-11-27
IPC分类号： H01J37/28 , H01J37/22 , H01J37/285
摘要： A charged particle beam apparatus includes: an electromagnetic wave generation source 16 that generates an electromagnetic wave with which a sample is irradiated; a charged particle optical system that includes a pulsing mechanism 3 and irradiates the sample with a focused charged particle beam; a detector 10 that detects an emitted electron emitted by an interaction between the charged particle beam and the sample; a first irradiation control unit 15 that controls the electromagnetic wave generation source and irradiates the sample with a pulsed electromagnetic wave to generate an excited carrier; a second irradiation control unit 14 that controls the pulsing mechanism and irradiates an electromagnetic wave irradiation region of the sample with a pulsed charged particle beam; and a timing control unit 13. While the emitted electrons are detected by the detector in synchronization with irradiation of the pulsed charged particle beam, the timing control unit controls the first irradiation control unit and the second irradiation control unit, and controls an interval time between the pulsed electromagnetic wave and the pulsed charged particle beam to the electromagnetic wave irradiation region. As a result, based on a transient change in an electron emission amount, it is possible to detect sample information with nano spatial resolution.
-
46.发明授权公开(公告)号：US11170972B2
公开(公告)日：2021-11-09
申请号：US16979263
申请日：2018-03-27
发明人： Teruo Kohashi , Hideo Morishita , Junichi Katane
IPC分类号： H01J37/28 , H01J37/20 , H01J37/244
摘要： A scanning electron microscope includes a spin detector configured to measure spin polarization of a secondary electron emitted from a sample, and an analysis device configured to analyze measurement data of the spin detector. The analysis device determines a width of a region where the secondary electron spin polarization locally changes in the measurement data. The analysis device further evaluates a strain in the sample based on the width of the region. With a configuration of the scanning electron microscope, it is possible to perform analysis of a strain in a magnetic material with high accuracy.
-
公开(公告)号：US11164766B2
公开(公告)日：2021-11-02
申请号：US16641329
申请日：2019-02-07
IPC分类号： H01L21/67 , H01L21/677 , H01L21/683
摘要： Provided is a technique capable of implementing efficient transport and processing related to multi-step processing in the case of a link-type vacuum processing apparatus with related to an operating method of a vacuum processing apparatus. The operating method of the vacuum processing apparatus according to the embodiment, in order to minimize time required for all processing of a plurality of wafers in a multi-step processing, includes a first step (steps 601 to 607) of selecting one first processing unit and one second processing unit from a plurality of processing units for each wafer and determining a transport schedule including a transport path using the selected processing units. In the first step, for at least one wafer, a transport schedule including a transport path is configured using the selected first processing unit by excluding at least one first processing unit from the plurality of first processing units. The operating method selects an optimal transport schedule when a second step is rate-limited.
-
公开(公告)号：US11159258B2
公开(公告)日：2021-10-26
申请号：US17058727
申请日：2019-07-03
IPC分类号： H04B3/46 , H04B17/364 , H04B7/08 , H04B17/336 , H04B17/318
摘要： The invention addresses the problem of recovering an unknown signal from multiple records of brief duration which are presumed to contain the signal at mutually random delays in a background of independent noise. The scenario is relevant to many applications, among which are the recovery of weak transients from large arrays of sensors and the identification of recurring patterns through a comparison of sequential intervals within a single record of longer duration. A simple and practical approach is provided by solving this problem through higher-order spectra. Applying the method to the third-order spectrum, the bispectrum, leads to filters derived from cross bicoherence.
-
公开(公告)号：US11156624B2
公开(公告)日：2021-10-26
申请号：US16326673
申请日：2017-08-04
发明人： Naohiko Fukaya
IPC分类号： G06F16/00 , G01N35/00 , G06F16/245 , G06F16/248 , G06T11/60
摘要： The present invention has been made to solve the above problem, and an object of the present invention is to provide an automatic analyzer that enables control related to a search screen display of an automatic analyzer. The automatic analyzer includes: an analysis unit 2 that analyzes a specimen, a storage unit 20 that stores specimen information including specimen IDs and a plurality of attribute information pieces recorded correspondingly for each of the specimen IDs, a priority setting unit 11 that sets attribute information to be extracted from the plurality of attribute information pieces at the time of searching the specimen information, and a screen control unit 12 that controls a screen for displaying the specimen ID which conforms to a character string of an input specimen ID as a search result among the specimen information stored in the storage unit according to the character string, in which the screen control unit 12 displays specific specimen information from the specimen information stored in the storage unit as the search result on the screen, based on the attribute information set by the priority setting unit 11 and a first character string including less than the number of digits of the character string of the specimen ID when the first character string is input to the screen.
-
公开(公告)号：US11143600B2
公开(公告)日：2021-10-12
申请号：US16961340
申请日：2018-02-16
摘要： The invention includes a pulse oscillated light source, an illumination unit that guides light output from the light source to a sample, a scanning unit that controls a position at which the sample is scanned by the illumination unit, a light converging unit that converges light reflected from the sample, a first photoelectric conversion unit that outputs an electric signal corresponding to the light converged by the light converging unit, an AD conversion unit that converts the electric signal output from the first photoelectric conversion unit into a digital signal in synchronization with pulse oscillation of the light source, a linear restoration unit that processes a digital signal converted by the AD conversion unit in synchronization with a pulse oscillation output by the AD conversion unit and corrects nonlinearity of the first photoelectric conversion unit, a defect detection unit that detects a defect of the sample based on an output of the linear restoration unit, and a processing unit that obtains and outputs a position and a size of the defect detected by the defect detection unit.
-
-
-
-
-
-
-
-
-
搜索结果
4620 条记录 (耗时 0.04 秒)
