摘要:
A DNA chip includes a carrier and a microarray of spots containing immobilised catcher molecules which are arranged on the carrier. Each spot contains a microelectrode system for the impedance spectroscopic detection of binding events occurring between the catcher molecules and target molecules of an analyte solution applied to the spots. The microelectrode system has a pair of polarisation electrodes in order to produce an alternating electromagnetic field and a pair of sensor electrodes for measuring a voltage drop in the analyte.
摘要:
The circuit configuration and the associated method allow reducing the 1/f noise of MOSFETs in an electronic circuit, especially in an integrated circuit with one or more MOSFETs. At least one direct current and/or at least one direct voltage source for adjusting constant working point(s) of the MOSFET(s) is/are assigned to one or more or all MOSFETs. At least one periodically oscillating current and/or voltage source is assigned to one or more or all MOSFETs so that the respective working points periodically oscillate about the constant working point(s) in such a manner that impurity states in the oxide of the MOSFET, which are recharged under the condition of a constant working point according to the principles of statistics such that they determine the 1/f noise signal, are no longer recharged statistically but at a lower probability due to the modulatory frequency of the periodically oscillating sources.
摘要:
The invention relates to a test circuit configuration. Every gate terminal of a transistor to be tested is coupled to a gate voltage source in such a manner that the gate voltage can be measured and adjusted individually on every gate terminal. The source terminal of every transistor to be tested can be coupled to the source voltage source in such a manner that the source voltage can be measured and adjusted individually on every source terminal.
摘要:
An apparatus and method for testing a plurality of electrical components that are coupled to one another. Further, an electrical selection unit, coupled to the electrical components to be tested, is provided for selecting at least one electrical component to be tested. A parasitic voltage drop in the testing circuit can be at least partially compensated using a control element coupled to the electrical components to be tested. The invention makes it possible, for testing of electrical components on a wafer over a large distance, i.e., several millimeters, to permit automated compensation of interference influences which occur as a result of the lines coupling or connecting the components to be tested.
摘要:
Sensor elements are arranged in a hexagonal grid. A processor element in the form of a primitive automaton is assigned to each of the sensor elements in the grid. The processor elements are set up to perform algorithms which enable lines of a fingerprint to be simplified such that characteristic minutiae of the fingerprint (endings and branchings of the lines) can be extracted. The processor elements are embodied using CMOS/Neuron MOS threshold value logic or using CMOS/NMOS pass transistor logic. The image grid can be read out via read-out circuits as a matrix.
摘要:
A magnetoresistive memory is described and contains a common word line voltage source, bit lines, word lines crossing the bit lines, and a memory cell array having memory cells with cell resistors. The memory cell array further has reference cells with reference cell resistors. The memory cell array is configured such that for testing a respective cell resistor in each case two of the reference cell resistors nearest the respective cell resistor and the reference cell are simultaneously connected to a common word line voltage. A first feedback amplifier together with the two reference cell resistors form a summing amplifier. A second feedback amplifier together with the respective cell resistor form an amplifier having an equivalent gain as the summing amplifier. A comparator is connected to the summing amplifier and the amplifier. The comparator has an output supplying an evaluation signal dependent on the respective cell resistor.
摘要:
The memory cell arrangement has MOS transistors (10) connected between bitlines (4, 4.sub.1) and connected row-by-row by means of selection lines (5). For pre-charging of all the bitlines (4, 4.sub.1) without a blocking of an access to these lines, further MOS transistors (20), connected between the bitlines (4, 4.sub.1) and a supply line (7), are provided, whose gate terminals (20.sub.2) are connected to a common pre-charging line (6).
摘要:
In an arrangement for signal transmission between chip layers of a vertically integrated circuit, a defined, capacitive signal transmission ensues between a part of the vertically integrated circuit in one chip layer and a further part of the vertically integrated circuit in a further chip layer by means of a coupling capacitance. Particularly given high connection densities, a large number of freely placeable and reliable vertical signal connections can be produced directly from the inside of one chip layer to the inside of a neighboring chip layer without extremely high demands being made on the adjustment of the chip layers relative to one another and on the surface planarity of the individual chip layers.
摘要:
In an arrangement for signal transmission between chip layers of a vertically integrated circuit, a defined, inductive signal transmission ensues between a part of the vertically integrated circuit in one chip layer and a further part of the vertically integrated circuit in a further chip layer by means of a coupling inductance formed by respective coils in the two layers. Particularly given high connection densities, a large number of freely placeable and reliable vertical signal connections can be produced directly from the inside of one chip layer to the inside of a neighboring chip layer without extremely high demands being made on the adjustment of the chip layers relative to one another and on the surface planarity of the individual chip layers.
摘要:
The invention relates to an electronic component that can be operated by means of an alternating voltage. Said component includes at least one input, at least one output and a pair of electronic sub-components with an identical function. The input(s) of the electronic component is/are coupled to a respective input of the electronic sub-components with an identical function and the output(s) of the electronic component is/are coupled to a respective output of said electronic sub-components. In addition, the electronic component is configured in such a way that at least one output only one output signal of the first sub-component of the pair of functionally identical electronic components can be picked up during a first half-wave of an alternating voltage, whereas only one output signal of the second sub-component of the pair of functionally identical electronic can be picked up during the second half-wave of the alternating voltage.