Method for determining a correction value function and method for generating a frequency-corrected hyperspectral image

    公开(公告)号:US11994430B2

    公开(公告)日:2024-05-28

    申请号:US17474431

    申请日:2021-09-14

    CPC classification number: G01J5/10 G01J2005/0077 G01J5/80

    Abstract: A method for determining a correcting quantity function kF(x, y) for calibrating an FTIR measurement arrangement with an IR detector. The IR detector includes a plurality of sensor elements, which are each located at a position (x, y), and the method includes: (a) recording interferograms IFGRxy of a reference sample using the sensor elements of the IR detector, (b) calculating spectra Rxy of the reference sample by Fourier transforming the interferograms of the reference sample for at least four sensor elements, (c) calculating correcting quantities kxy by comparing each spectrum Rxy of the reference sample calculated in step b) with a reference data set of the reference sample, and (d) determining the correcting quantity function kF(x, y) using the correcting quantities kxy calculated in step c). This permits frequency shifts that occur in FTIR spectrometers with extensive detectors to be effectively corrected regardless of the position of the sensor element.

    Thermal Imaging with Scanning at Sub-Pixel Levels

    公开(公告)号:US20240147085A1

    公开(公告)日:2024-05-02

    申请号:US17974149

    申请日:2022-10-26

    Abstract: A thermal imaging device having a scan mechanism operable to effectuate sequentially predetermined offsets, each configured between a thermal image of thermal radiations in a defined area on an imaging plane and an array of micro mirrors configured on a substrate. A respective image of a light pattern of a light beam reflected by a light reflection portion of each respective micro mirror in the array can be captured, when a rotation of the respective micro mirror, caused by radiation incident on a radiation absorption surface of the respective micro mirror, is stabilized at a respective offset. After computing a respective measurement of intensity measured by the respective micro mirror based on the respective image captured for the respective offset, a processor computes measurements of intensity of radiation in sub-areas of the thermal image, from measurements of intensity for the predetermined offsets, to generate a high resolution output.

Patent Agency Ranking