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公开(公告)号：US20190162597A9
公开(公告)日：2019-05-30
申请号：US14494482
申请日：2014-09-23
Applicant: SpectraSensors, Inc.
Inventor： Lutz Keller , Alfred Feitisch , Peter Scott , Mathias Schrempel , Nathan St. John
Abstract: A spectrometer cell can include a spacer, at least one end cap, and at least one mirror with a reflective surface. The end cap can be positioned proximate to a first contact end of the spacer such that the end cap and spacer at least partially enclose an internal volume of the spectrometer cell. The mirror can be secured in place by a mechanical attachment that includes attachment materials that are chemically inert to at least one reactive gas compound. The mechanical attachment can hold an optical axis of the reflective surface in a fixed orientation relative to other components of the spectrometer cell and or a spectrometer device that comprises the spectrometer cell. The mirror can optionally be constructed of a material such as stainless steel, ceramic, or the like. Related methods, articles of manufacture, systems, and the like are described.
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公开(公告)号：US09816860B2
公开(公告)日：2017-11-14
申请号：US14466819
申请日：2014-08-22
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Xiang Liu , Keith Benjamin Helbley , Douglas Beyer
CPC classification number: G01J3/0205 , G01J3/0237 , G01J3/027 , G01J3/0278 , G01J3/0291 , G01J3/42 , G01J2003/421 , G01N21/31 , G01N2201/06113 , G01N2201/062
Abstract: A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).
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公开(公告)号：US20170317468A1
公开(公告)日：2017-11-02
申请号：US15652177
申请日：2017-07-17
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Gabi Neubauer , Mathias Schrempel
CPC classification number: H01S5/02272 , H01L24/03 , H01L24/05 , H01L24/29 , H01L24/32 , H01L24/83 , H01L2224/0383 , H01L2224/04026 , H01L2224/05573 , H01L2224/05624 , H01L2224/05663 , H01L2224/05664 , H01L2224/05666 , H01L2224/05669 , H01L2224/0567 , H01L2224/0568 , H01L2224/05681 , H01L2224/05684 , H01L2224/05686 , H01L2224/29109 , H01L2224/29111 , H01L2224/29139 , H01L2224/29144 , H01L2224/32245 , H01L2224/83801 , H01L2924/12042 , H01L2924/15747 , H01S5/02212 , H01S5/0425 , H01L2924/04941 , H01L2924/01022 , H01L2924/053 , H01L2924/049 , H01L2924/00014 , H01L2924/01032 , H01L2924/01014 , H01L2924/014 , H01L2924/0105 , H01L2924/01029 , H01L2924/01082 , H01L2924/00
Abstract: A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.
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24.发明授权公开(公告)号：US09360415B2
公开(公告)日：2016-06-07
申请号：US14263942
申请日：2014-04-28
Applicant: SpectraSensors, Inc.
Inventor： Xiang Liu , John Lewison , Wenhai Ji , Alfred Feitisch
IPC: G01N21/00 , G01N21/27 , G01N21/39 , G01N21/3504 , G01J3/28 , G01J3/42 , G01N21/03 , G01N21/31 , G01N21/3518
CPC classification number: G01N21/274 , G01J3/28 , G01J3/42 , G01N21/031 , G01N21/31 , G01N21/3504 , G01N21/3518 , G01N21/39 , G01N2021/399
Abstract: A reference harmonic absorption curve of a laser absorption spectrometer can have a reference curve shape derived from a reference signal generated by the detector in response to light passing from the laser light source through a reference gas or gas mixture. The reference gas or gas mixture can include one or more of a target analyte and a background gas expected to be present during analysis of the target analyte. A test harmonic absorption curve having a test curve shape is compared with the reference harmonic absorption curve to detect a difference between the test curve shape and the reference curve shape. Operating and/or analytical parameters of the laser absorption spectrometer are adjusted to correct the test curve shape to reduce the difference between the test curve shape and the reference curve shape.
Abstract translation: 激光吸收光谱仪的参考谐波吸收曲线可以具有根据由检测器响应于从激光源通过参考气体或气体混合物的光而产生的参考信号导出的参考曲线形状。 参考气体或气体混合物可以包括目标分析物和预期在目标分析物的分析期间存在的背景气体中的一种或多种。 将具有测试曲线形状的测试谐波吸收曲线与参考谐波吸收曲线进行比较，以检测测试曲线形状与参考曲线形状之间的差异。 调整激光吸收光谱仪的操作和/或分析参数以校正测试曲线形状，以减小测试曲线形状与参考曲线形状之间的差异。
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公开(公告)号：US20160084710A1
公开(公告)日：2016-03-24
申请号：US14494482
申请日：2014-09-23
Applicant: SpectraSensors, Inc.
Inventor： Lutz Keller , Alfred Feitisch , Peter Scott , Mathias Schrempel , Nathan St. John
CPC classification number: G01N21/031 , G01N2021/399
Abstract: A spectrometer cell can include a spacer, at least one end cap, and at least one mirror with a reflective surface. The end cap can be positioned proximate to a first contact end of the spacer such that the end cap and spacer at least partially enclose an internal volume of the spectrometer cell. The mirror can be secured in place by a mechanical attachment that includes attachment materials that are chemically inert to at least one reactive gas compound. The mechanical attachment can hold an optical axis of the reflective surface in a fixed orientation relative to other components of the spectrometer cell and or a spectrometer device that comprises the spectrometer cell. The mirror can optionally be constructed of a material such as stainless steel, ceramic, or the like. Related methods, articles of manufacture, systems, and the like are described.
Abstract translation: 光谱仪单元可以包括间隔物，至少一个端盖和至少一个具有反射表面的反射镜。 端盖可以定位成靠近隔离物的第一接触端，使得端盖和间隔件至少部分地包围光谱仪单元的内部体积。 镜子可以通过机械附件固定在适当的位置，该机械附件包括对至少一种反应性气体化合物具有化学惰性的附着材料。 机械附件可以将反射表面的光轴相对于分光计单元的其他部件和包括光谱仪单元的光谱仪装置固定在一定方向。 镜子可以任意地由诸如不锈钢，陶瓷等的材料构成。 描述了相关方法，制品，系统等。
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Patent Agency Ranking
26.发明申请公开(公告)号：US20140253922A1
公开(公告)日：2014-09-11
申请号：US14263942
申请日：2014-04-28
Applicant: SpectraSensors, Inc.
Inventor： Xiang Liu , John Lewison , Wenhai Ji , Alfred Feitisch
CPC classification number: G01N21/274 , G01J3/28 , G01J3/42 , G01N21/031 , G01N21/31 , G01N21/3504 , G01N21/3518 , G01N21/39 , G01N2021/399
Abstract: A reference harmonic absorption curve of a laser absorption spectrometer can have a reference curve shape derived from a reference signal generated by the detector in response to light passing from the laser light source through a reference gas or gas mixture. The reference gas or gas mixture can include one or more of a target analyte and a background gas expected to be present during analysis of the target analyte. A test harmonic absorption curve having a test curve shape is compared with the reference harmonic absorption curve to detect a difference between the test curve shape and the reference curve shape. Operating and/or analytical parameters of the laser absorption spectrometer are adjusted to correct the test curve shape to reduce the difference between the test curve shape and the reference curve shape.
Abstract translation: 激光吸收光谱仪的参考谐波吸收曲线可以具有根据由检测器响应于从激光源通过参考气体或气体混合物的光而产生的参考信号导出的参考曲线形状。 参考气体或气体混合物可以包括目标分析物和预期在目标分析物的分析期间存在的背景气体中的一种或多种。 将具有测试曲线形状的测试谐波吸收曲线与参考谐波吸收曲线进行比较，以检测测试曲线形状与参考曲线形状之间的差异。 调整激光吸收光谱仪的操作和/或分析参数以校正测试曲线形状，以减小测试曲线形状与参考曲线形状之间的差异。
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公开(公告)号：US10224693B2
公开(公告)日：2019-03-05
申请号：US15652177
申请日：2017-07-17
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Gabi Neubauer , Mathias Schrempel
Abstract: A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.
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公开(公告)号：US10073028B2
公开(公告)日：2018-09-11
申请号：US14842642
申请日：2015-09-01
Applicant: SpectraSensors, Inc.
Inventor： Joshua Cohen , Nathan St. John , Alfred Feitisch
IPC: G01N21/01 , G01J3/02 , G02B7/02 , H01S3/131 , H01S5/00 , H01S3/00 , G01N21/27 , G02B7/00 , H01S5/068 , G01J3/42
CPC classification number: G01N21/01 , G01J3/0286 , G01J3/42 , G01N21/27 , G01N2201/0231 , G01N2201/0636 , G02B7/008 , G02B7/028 , H01S3/0071 , H01S3/1317 , H01S5/0071 , H01S5/06804
Abstract: An optical head assembly for use in a spectrometer is provided that is configured to characterize one or more constituents within a sample gas. The assembly includes a thermoelectric cooler (TEC) having a cold side on one end and a hot side on an opposite end, a cold plate in thermal communication with the cold side of the TEC, a hot block in thermal communication with the hot side of the TEC, a light source in thermal communication with the cold plate such that a change in temperature of the TEC causes one or more properties of the light source (e.g., wavelength, etc.) to change, and an optical element in thermal communication with the cold plate positioned to collimate light emitted by the light source through the sample gas (such that properties of the optical element vary based on a change in temperature of the TEC).
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公开(公告)号：US10072980B2
公开(公告)日：2018-09-11
申请号：US15376541
申请日：2016-12-12
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Xiang Liu , Chih-Husan Chang , Hsu-Hung Huang
CPC classification number: G01J3/0291 , G01J3/027 , G01J3/42
Abstract: At least one light source is configured to emit at least one beam into a sample volume of an absorbing medium. In addition, at least one detector is positioned to detect at least a portion of the beam emitted by the at least one light source. Further, at least one beam modification element is positioned between the at least one detector and the at least one light source to selectively change at least one of (i) a power intensity of, or (ii) a shape of the beam emitted by the at least one light source as detected by the at least one detector. A control circuit is coupled to the beam modification element. Related apparatus methods, articles of manufacture, systems, and the like are described.
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公开(公告)号：US09711937B2
公开(公告)日：2017-07-18
申请号：US14873080
申请日：2015-10-01
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Gabi Neubauer , Mathias Schrempel
CPC classification number: H01S5/02272 , H01L24/03 , H01L24/05 , H01L24/29 , H01L24/32 , H01L24/83 , H01L2224/0383 , H01L2224/04026 , H01L2224/05573 , H01L2224/05624 , H01L2224/05663 , H01L2224/05664 , H01L2224/05666 , H01L2224/05669 , H01L2224/0567 , H01L2224/0568 , H01L2224/05681 , H01L2224/05684 , H01L2224/05686 , H01L2224/29109 , H01L2224/29111 , H01L2224/29139 , H01L2224/29144 , H01L2224/32245 , H01L2224/83801 , H01L2924/12042 , H01L2924/15747 , H01S5/02212 , H01S5/0425 , H01L2924/04941 , H01L2924/01022 , H01L2924/053 , H01L2924/049 , H01L2924/00014 , H01L2924/01032 , H01L2924/01014 , H01L2924/014 , H01L2924/0105 , H01L2924/01029 , H01L2924/01082 , H01L2924/00
Abstract: A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.
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