Semiconductor device comprising low power retention flip-flop

    公开(公告)号:US10404240B2

    公开(公告)日:2019-09-03

    申请号:US15399146

    申请日:2017-01-05

    Abstract: Provided is a semiconductor device including low power retention flip-flop. The semiconductor device includes a first line to which a global power supply voltage is applied, a second line to which a local power supply voltage is applied, the second line being separated from the first line, a first operating circuit connected to the second line to use the local power supply voltage, a first power gating circuit determining whether the local power supply voltage is applied to the first operating circuit and a first retention flip-flop connected to the first line and the second line, wherein the first retention flip-flop comprises a first circuit including a master latch, a second circuit including a slave latch, and a first tri-state inverter connected between the master latch and the slave latch.

    Low-power, small-area, high-speed master-slave flip-flop circuits and devices including same

    公开(公告)号:US10333498B2

    公开(公告)日:2019-06-25

    申请号:US15586011

    申请日:2017-05-03

    Abstract: An integrated circuit includes a plurality of positive edge-triggered master-slave flip-flop circuits sharing a clock signal. At least one of the positive edge-triggered master-slave flip-flop circuits includes; an input stage that provides a first output signal generated from an input signal in response to the clock signal and an inverted clock signal, a first inverting circuit that generates the inverted clock signal by delaying the clock signal, a transmission gate that receives a second output signal and generates a final output signal, and a second inverting circuit that receives the first output signal and generates the second output signal from the first output signal. The clock signal is applied to an NMOS transistor of the transmission gate and a PMOS transistor of the input stage, and the inverted clock signal is applied to a PMOS transistor of the transmission gate and an NMOS transistor of the input stage.

    MASTER-SLAVE FLIP FLOP
    23.
    发明申请

    公开(公告)号:US20190089338A1

    公开(公告)日:2019-03-21

    申请号:US15969437

    申请日:2018-05-02

    Abstract: A master-slave flip flop includes a master latch and a slave latch which are sequentially disposed on a substrate in a first direction. The master latch includes a first NMOS transistor and a first PMOS transistor each gated by a first clock signal. The first NMOS transistor and the first PMOS transistor share a first gate line extending in a second direction intersecting with the first direction. The slave latch includes a second NMOS transistor and a second PMOS transistor each gated by the first clock signal. The second NMOS transistor and the second NMOS transistor share a second gate line extending in the second direction. The first gate line and the second gate line are electrically connected to each other.

    Semiconductor circuit
    25.
    发明授权

    公开(公告)号:US10447248B2

    公开(公告)日:2019-10-15

    申请号:US16164329

    申请日:2018-10-18

    Inventor: Min Su Kim

    Abstract: A semiconductor circuit includes a first logic gate that receives inputs of a first input signal, a clock signal and a feedback signal and performs a first logical operation to output a first output signal. A second logic gate that receives inputs of the first output signal of the first logic gate, the clock signal, and an inverted output signal of the first input signal and performs a second logical operation to output the feedback signal.

    Semiconductor circuit
    26.
    发明授权

    公开(公告)号:US09876500B2

    公开(公告)日:2018-01-23

    申请号:US15499257

    申请日:2017-04-27

    Abstract: A semiconductor circuit includes a first circuit, a second circuit, a third circuit, and a fourth circuit. The first circuit determines a value of a first node based on a voltage level of a clock signal, and a voltage level of an enable signal or a voltage level of a scan enable signal. The second circuit determines a value of a second node based on the voltage levels of the first node and the clock signal. The third circuit determines a value of a third node based on a voltage level of the second node. The fourth circuit determines a value of a fourth node based on the voltage levels of the second node and the clock signal. The third circuit includes a first transistor and a second transistor connected in series with each other and gated to the voltage level of the second node to determine the value of the third node. The fourth circuit includes a third transistor that is gated to the voltage level of the clock signal to electrically connect the third node and the fourth node.

    SCAN FLIP-FLOP, METHOD OF OPERATING THE SAME, AND DEVICE INCLUDING THE SCAN FLIP-FLOP
    27.
    发明申请
    SCAN FLIP-FLOP, METHOD OF OPERATING THE SAME, AND DEVICE INCLUDING THE SCAN FLIP-FLOP 有权
    扫描FLOP-FLOP,其操作方法和包括扫描FLIP-FLOP的设备

    公开(公告)号:US20140176212A1

    公开(公告)日:2014-06-26

    申请号:US14028806

    申请日:2013-09-17

    Inventor: Min Su Kim

    CPC classification number: G01R31/318541 H03K3/037

    Abstract: A scan flip-flop may include a selector outputting a data signal or a scan input signal in response to a scan enable signal, and a flip-flop that latches an output signal of the selector or the data signal, based on a clock signal and a low voltage signal.

    Abstract translation: 扫描触发器可以包括响应于扫描使能信号而输出数据信号或扫描输入信号的选择器和基于时钟信号锁存选择器或数据信号的输出信号的触发器,以及 低电压信号。

    Semiconductor circuit
    28.
    发明授权

    公开(公告)号:US11526194B2

    公开(公告)日:2022-12-13

    申请号:US17385182

    申请日:2021-07-26

    Abstract: A semiconductor circuit may include a first flip-flop configured to output a first input data as a first output signal in response to an inverted input clock signal, a second flip-flop configured to output a second input data as a second output signal in response to an input clock signal, a glitch-free circuit configured to receive the inverted input clock signal, the input clock signal, the first output signal, and the second output signal, and to determine a voltage level of a node on the basis of the inverted input clock signal, the input clock signal, the first output signal, and the second output signal, and an inverter configured to output an output clock signal obtained by inverting the voltage level of the node determined by the glitch-free circuit. The glitch-free circuit does not include a transistor having a gate connected to the node.

    Semiconductor device
    30.
    发明授权

    公开(公告)号:US11152922B2

    公开(公告)日:2021-10-19

    申请号:US16792343

    申请日:2020-02-17

    Abstract: A semiconductor device includes a scan input circuit, a master latch, a slave latch, a first inverter, and a scan output circuit. The scan input circuit is configured to receive a scan input signal, a first data signal, and a scan enable signal and select any one of the first data signal and the scan input signal in response to the scan enable signal to output a first select signal. The master latch is configured to latch the first select signal and output a first output signal. The slave latch is configured to latch the first output signal and output a second output signal. The first inverter is configured to invert the second output signal. The scan output circuit is configured to receive a signal output from the slave latch and an external signal and output a first scan output signal.

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