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公开(公告)号:US12019333B2
公开(公告)日:2024-06-25
申请号:US18352776
申请日:2023-07-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yoonki Park , Hyungjin Kim , Yongsung Yoo , Youngwook Jung , Minnyeong Han
IPC: G02F1/1335 , G02F1/017 , G02F1/13357 , G02F1/137 , G02F1/35
CPC classification number: G02F1/133614 , G02F1/01791 , G02F1/133553 , G02F1/133603 , G02F1/133605 , G02F1/133617 , G02F1/13762 , G02F1/353 , G02F2202/046 , G02F2202/36
Abstract: A display apparatus includes a liquid crystal panel; light sources configured to emit blue light; and a reflective sheet including a first edge portion and a second edge portion, wherein a plurality of holes are disposed on the reflective sheet, the plurality of holes includes a first hole, a second hole, and a third hole. The first hole is disposed at a first distance from an edge of the first edge portion, the second hole is disposed at the first distance from an edge of the second edge portion, and the third hole is disposed at a second distance from the edge of the first edge portion. The display apparatus further includes first light conversion dots disposed around the first hole, second light conversion dots disposed around the second hole, and third light conversion dots disposed around the third hole.
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公开(公告)号:US20230392925A1
公开(公告)日:2023-12-07
申请号:US18123788
申请日:2023-03-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jiyoung Chu , Hyungjin Kim , Minhwan Seo , Wondon Joo , Dongyoon Koo , Sangwoo Bae , Sungmin Ahn , Jungyu Lee , Yunpyo Hong
CPC classification number: G01B11/272 , G02B27/283 , G02B27/286 , G02B5/0808
Abstract: A method of bonding a die to a wafer using a die bonding system measures, using an obtained image showing interference fringes, a parallelism between the die and the wafer. In some embodiments, parallelism and die deformation are detected using interference fringes produced by an optical apparatus of the die bonding system. A parallelism measurement optical apparatus includes a light source, an optical assembly configured to control polarization of a reference light and a measurement light. In some embodiments, the measurement light is sequentially incident on and reflected from a first measurement surface and a second measurement surface that are spaced apart along a vertical direction to face each other, and is emitted to have information on parallelism between the first and second measurement surfaces. In some embodiments, a first polarizer is configured to interfere the reference light and the measurement light emitted from the optical assembly with each other. A light detector is configured to detect an interference signal of lights including the interference fringes.
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公开(公告)号:US11538506B2
公开(公告)日:2022-12-27
申请号:US17356080
申请日:2021-06-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyungjin Kim , Yongjun Kim , Yonghun Kim , Minsu Ahn , Reum Oh , Jinyong Choi
IPC: G11C5/06 , G11C5/02 , H01L23/538 , H01L25/065
Abstract: A semiconductor device includes a cell area in which a plurality of memory cells are arranged in an array structure, and a peripheral area in which circuits configured to drive the memory cells are arranged, the peripheral area being next to the cell area. The cell area is divided into a plurality of banks, and the plurality of banks comprise first banks having a base size and second banks having a size of 1/(2*n) (wherein n is an integer greater than or equal to 1) of the base size. The plurality of banks are arranged in a first direction and a second direction perpendicular to the first direction, and the semiconductor device has a shape of a rectangular chip which is elongated in the second direction.
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公开(公告)号:US11415834B2
公开(公告)日:2022-08-16
申请号:US17473128
申请日:2021-09-13
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yoonki Park , Hyungjin Kim , Yongsung Yoo , Youngwook Jung , Minnyeong Han
IPC: G02F1/00 , G02F1/13357 , G02F1/1335
Abstract: A display apparatus includes a liquid crystal panel; a plurality of light sources configured to emit blue light; a reflective sheet comprising four edge portions, wherein a plurality of holes are disposed on the reflective sheet, the plurality of holes comprises a first hole and a second hole on each of the four edge portions of the reflective sheet, each of the four edge portions comprises an edge of the reflective sheet, the first hole is disposed at a first distance from the edge of the reflective sheet, and the second hole is disposed at a second distance from the edge of the reflective sheet, wherein the second distance is greater than the first distance; and a plurality of light conversion dots comprising a plurality of first light conversion dots and a plurality of second light conversion dots.
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公开(公告)号:US11333928B1
公开(公告)日:2022-05-17
申请号:US17463932
申请日:2021-09-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yoonki Park , Hyungjin Kim , Yongsung Yoo , Youngwook Jung , Minnyeong Han
IPC: G02F1/1335 , G02F1/13357 , G02F1/017 , G02F1/35 , G02F1/137
Abstract: A display device includes a liquid crystal panel; a plurality of light sources configured to emit blue light; and a reflective sheet including a first hole and a second hole on a same edge portion of the reflective sheet, wherein the edge portion includes an edge of the reflective sheet, the first hole is disposed at a first distance from the edge of the reflective sheet, and the second hole is disposed at a second distance from the edge of the reflective sheet, wherein the second distance is greater than the first distance. First light conversion dots are disposed around the first hole of the reflective sheet, and second light conversion dots are disposed around the second hole of the reflective sheet, wherein a size of each of the first light conversion dots is greater than a size of each of the second light conversion dots.
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公开(公告)号:US20240418645A1
公开(公告)日:2024-12-19
申请号:US18408247
申请日:2024-01-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hojun Lee , Jangwoon Sung , Wookrae Kim , Hyungjin Kim , Seungbeom Park , Junho Shin , Myungjun Lee
Abstract: An example semiconductor measurement apparatus includes a light source, a pattern generator, a stage, an image sensor, and a controller. The light source is configured to output light in a predetermined wavelength band. The pattern generator is configured to generate light including a speckle pattern by scattering the light output from the light source. The stage is disposed on a movement path of the light including the speckle pattern, and a sample reflecting the light including the speckle pattern is seated on the stage. The image sensor is configured to receive light reflected from the sample and generate an original image representing a diffractive pattern of light reflected from the sample. The controller is configured to generate a prediction image for estimating diffractive characteristics of light incident on the image sensor.
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公开(公告)号:US11972836B2
公开(公告)日:2024-04-30
申请号:US17355746
申请日:2021-06-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Soong-Man Shin , Hyungjin Kim , Youngwook Kim
CPC classification number: G11C7/222 , G06F13/1689 , G11C7/1066 , G11C7/1093 , G11C8/18
Abstract: A storage device including a nonvolatile memory device including memory blocks and a controller connected with the nonvolatile memory device through data input and output lines and a data strobe line may be provided. The nonvolatile memory device and the controller may be configured to perform training on the data input and output lines by adjusting a delay of a data strobe signal sent through the data strobe line and adjust delays of the data input and output lines based on the training result.
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28.
公开(公告)号:US20240071447A1
公开(公告)日:2024-02-29
申请号:US18496693
申请日:2023-10-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungjin Kim , Jungsik Park , Soongmann Shin
CPC classification number: G11C7/222 , G11C7/1045 , G11C7/1063 , G11C7/109 , G11C8/18
Abstract: In an apparatus, a memory controller, a memory device, and a method for switching frequencies of clock signals to reduce power consumption, when the memory device performs an internal operation according to a command of the memory controller, a frequency of a clock signal of the memory controller is changed. The memory controller switches the frequency of the clock signal to a low frequency according to assertion of a status signal that indicates a busy operation status of the memory device according to the command, and switches the frequency of the clock signal to a high frequency according to de-assertion of the status signal that indicates a ready operation status of the memory device.
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公开(公告)号:US20240006013A1
公开(公告)日:2024-01-04
申请号:US18296640
申请日:2023-04-06
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyungjin Kim , Seunghyun Cho
CPC classification number: G11C29/4401 , G06F11/1044
Abstract: A memory device includes a memory cell array having a plurality of memory cells therein that span a plurality of rows, which are grouped into segments, and a plurality of columns, which are grouped into ticks. The ticks include normal ticks, and a spare tick that spans at least one redundancy column of memory cells in the memory cell array. A repair circuit is provided, which is configured to: (i) repair a first source address of a first failed column, which spans a plurality of the segments, with a first destination address of a pass column in one of the normal ticks, and then (ii) further repair the first destination address of the pass column with a first redundancy column within the spare tick that corresponds to the first destination address.
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公开(公告)号:US11069388B2
公开(公告)日:2021-07-20
申请号:US17012767
申请日:2020-09-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Soong-Man Shin , Hyungjin Kim , YoungWook Kim
Abstract: A storage device including a nonvolatile memory device including memory blocks and a controller connected with the nonvolatile memory device through data input and output lines and a data strobe line may be provided. The nonvolatile memory device and the controller may be configured to perform training on the data input and output lines by adjusting a delay of a data strobe signal sent through the data strobe line and adjust delays of the data input and output lines based on the training result.
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