Display apparatus
    24.
    发明授权

    公开(公告)号:US11415834B2

    公开(公告)日:2022-08-16

    申请号:US17473128

    申请日:2021-09-13

    Abstract: A display apparatus includes a liquid crystal panel; a plurality of light sources configured to emit blue light; a reflective sheet comprising four edge portions, wherein a plurality of holes are disposed on the reflective sheet, the plurality of holes comprises a first hole and a second hole on each of the four edge portions of the reflective sheet, each of the four edge portions comprises an edge of the reflective sheet, the first hole is disposed at a first distance from the edge of the reflective sheet, and the second hole is disposed at a second distance from the edge of the reflective sheet, wherein the second distance is greater than the first distance; and a plurality of light conversion dots comprising a plurality of first light conversion dots and a plurality of second light conversion dots.

    SEMICONDUCTOR MEASUREMENT APPARATUS

    公开(公告)号:US20240418645A1

    公开(公告)日:2024-12-19

    申请号:US18408247

    申请日:2024-01-09

    Abstract: An example semiconductor measurement apparatus includes a light source, a pattern generator, a stage, an image sensor, and a controller. The light source is configured to output light in a predetermined wavelength band. The pattern generator is configured to generate light including a speckle pattern by scattering the light output from the light source. The stage is disposed on a movement path of the light including the speckle pattern, and a sample reflecting the light including the speckle pattern is seated on the stage. The image sensor is configured to receive light reflected from the sample and generate an original image representing a diffractive pattern of light reflected from the sample. The controller is configured to generate a prediction image for estimating diffractive characteristics of light incident on the image sensor.

    MEMORY DEVICE INCLUDING FLEXIBLE COLUMN REPAIR CIRCUIT

    公开(公告)号:US20240006013A1

    公开(公告)日:2024-01-04

    申请号:US18296640

    申请日:2023-04-06

    CPC classification number: G11C29/4401 G06F11/1044

    Abstract: A memory device includes a memory cell array having a plurality of memory cells therein that span a plurality of rows, which are grouped into segments, and a plurality of columns, which are grouped into ticks. The ticks include normal ticks, and a spare tick that spans at least one redundancy column of memory cells in the memory cell array. A repair circuit is provided, which is configured to: (i) repair a first source address of a first failed column, which spans a plurality of the segments, with a first destination address of a pass column in one of the normal ticks, and then (ii) further repair the first destination address of the pass column with a first redundancy column within the spare tick that corresponds to the first destination address.

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