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公开(公告)号：US10145906B2
公开(公告)日：2018-12-04
申请号：US14973314
申请日：2015-12-17
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , Robert Guyol , Maria Jose Martinez , Jan Kubik , Padraig L. Fitzgerald , Javier Calpe Maravilla , Michael P. Lynch , Eoin E. English
Abstract: A magnetic device may include a magnetic structure, a device structure, and an associated circuit. The magnetic structure may include a patterned layer of material having a predetermined magnetic property. The patterned layer may be configured to, e.g., provide a magnetic field, sense a magnetic field, channel or concentrate magnetic flux, shield a component from a magnetic field, or provide magnetically actuated motion, etc. The device structure may be another structure of the device that is physically connected to or arranged relative to the magnetic structure to, e.g., structurally support, enable operation of, or otherwise incorporate the magnetic structure into the magnetic device, etc. The associated circuit may be electrically connected to the magnetic structure to receive, provide, condition or process of signals of the magnetic device.
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公开(公告)号：US09871373B2
公开(公告)日：2018-01-16
申请号：US14671767
申请日：2015-03-27
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
CPC classification number: H02H9/04 , H01L27/0248 , H01L2224/32145 , H01L2224/48091 , H01L2224/48247 , H01L2224/73265 , H01L2924/181 , H02H9/02 , H02H9/042 , H02H9/046 , H01L2924/00012 , H01L2924/00014 , H01L2924/00
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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公开(公告)号：US20170299649A1
公开(公告)日：2017-10-19
申请号：US15291742
申请日：2016-10-12
Applicant: Analog Devices Global
Inventor： Edward John Coyne , Alan J. O'Donnell , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Thomas G. O'Dwyer , David Aherne , Michael A. Looby
IPC: G01R31/26
CPC classification number: G01R31/2879 , G01R31/2874
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring. An integrated circuit device includes a core circuit and a wear-out monitor device. The wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated The integrated circuit further includes a sensing circuit coupled to the wear-out monitor device and configured to detect an electrical property of the wear-out monitor device that is indicative of a wear-out level of the core-circuit.
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公开(公告)号：US20160285255A1
公开(公告)日：2016-09-29
申请号：US14671767
申请日：2015-03-27
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
CPC classification number: H02H9/04 , H01L27/0248 , H01L2224/32145 , H01L2224/48091 , H01L2224/48247 , H01L2224/73265 , H01L2924/181 , H02H9/02 , H02H9/042 , H02H9/046 , H01L2924/00012 , H01L2924/00014 , H01L2924/00
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
Abstract translation: 本公开的方面涉及检测和记录与电应力（EOS）事件相关的信息，例如静电放电（ESD）事件。 例如，在一个实施例中，一种装置包括电过压保护装置，被配置为检测EOS事件的发生的检测电路，以及被配置为存储指示EOS事件的信息的存储器。
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