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    Tuned dynamic eigen spectroscopy systems
    241.
    发明授权
    Tuned dynamic eigen spectroscopy systems 有权
    调谐动态特征光谱系统

    公开(公告)号：US08928880B2

    公开(公告)日：2015-01-06

    申请号：US13560220

    申请日：2012-07-27

    Applicant: Daniel Youngner ,  Yue Liu ,  Lisa Lust

    Inventor： Daniel Youngner ,  Yue Liu ,  Lisa Lust

    IPC: G01J3/04 ,  G01J3/28 ,  G01J3/457 ,  G01J3/02 ,  G01J3/18 ,  G01J3/14

    CPC classification number: G01J3/0237 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/14 ,  G01J3/1804 ,  G01J3/2803 ,  G01J3/457

    Abstract: An apparatus for detecting gas concentrations includes a coded filter to oscillate proximate a resonant frequency. A photo detector is positioned below the coded filter such that the coded filter selectively blocks light that is directed at the photo detector. Optics are positioned to project spectral information on to the coded filter. A processor analyzes a signal received from the photo detector. The processor is adapted to weight a harmonic attic signal.

    Abstract translation: 用于检测气体浓度的装置包括在谐振频率附近振荡的编码滤波器。 光检测器位于编码滤波器的下方，使得编码滤波器选择性地阻挡指向光检测器的光。 定位光学器件将光谱信息投影到编码滤波器上。 处理器分析从光电检测器接收的信号。 处理器适用于加重谐波阁楼信号。

    Broad band Czerny-Turner spectrometer, methods, and applications
    243.
    发明授权
    Broad band Czerny-Turner spectrometer, methods, and applications 有权
    宽带Czerny-Turner光谱仪，方法和应用

    公开(公告)号：US08873049B2

    公开(公告)日：2014-10-28

    申请号：US13695298

    申请日：2011-04-29

    Applicant: Jannick P. Rolland ,  Kevin P. Thompson ,  Kye-Sung Lee

    Inventor： Jannick P. Rolland ,  Kevin P. Thompson ,  Kye-Sung Lee

    IPC: G01J3/28

    CPC classification number: G01J3/1804 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/10

    Abstract: A low-cost optics, broadband, astigmatism-corrected practical spectrometer. An off-the-shelf cylindrical lens is used to remove astigmatism over the full bandwidth, providing better than 0.1 nm spectral resolution and more than 50% throughput over a bandwidth of 400 nm centered at 800 nm. The spectrometer includes a first spherical mirror disposed along an optical path in an off-axis (tilted) orientation; a diffraction grating disposed along the optical axis in a location optically downstream from the first mirror; a second spherical mirror disposed along the optical path in an off-axis orientation in a location optically downstream from the diffraction grating; a cylindrical optic disposed in the optical path; and a detector disposed in the optical path in a location optically downstream from the second spherical mirror.

    Abstract translation: 低成本的光学，宽带，散光校正实用光谱仪。 一个现成的柱面透镜用于去除全带宽上的散光，提供比0.1纳米光谱分辨率更好的超过50％的吞吐量，以800纳米为中心的400纳米带宽。 光谱仪包括沿着离轴（倾斜）取向的光路布置的第一球面镜; 衍射光栅，沿着光轴布置在第一反射镜光学下游的位置; 第二球面反射镜，其在离开衍射光栅的光学下游的位置处以离轴取向沿光路设置; 设置在光路中的圆柱形光学器件; 以及检测器，设置在所述光路中，在所述第二球面镜的光学下游的位置。

    Linearized variable-dispersion spectrometers and related assemblies
    244.
    发明授权
    Linearized variable-dispersion spectrometers and related assemblies 有权
    线性化可变色散光谱仪及相关组件

    公开(公告)号：US08797530B2

    公开(公告)日：2014-08-05

    申请号：US13428247

    申请日：2012-03-23

    Applicant: Christopher Saxer ,  Robert H. Hart ,  Eric L. Buckland ,  Pete Huening ,  Bradley A. Bower

    Inventor： Christopher Saxer ,  Robert H. Hart ,  Eric L. Buckland ,  Pete Huening ,  Bradley A. Bower

    IPC: G01J3/28

    CPC classification number: G01J3/0208 ,  A61B3/1005 ,  A61B5/0066 ,  G01J3/14 ,  G01J3/1804 ,  G01J3/28 ,  G01J2003/1208

    Abstract: Wavenumber linear spectrometers are provided including an input configured to receive electromagnetic radiation from an external source; collimating optics configured to collimate the received electromagnetic radiation; a dispersive assembly including first and second diffractive gratings, wherein the first diffraction grating is configured in a first dispersive stage to receive the collimated electromagnetic radiation and wherein the dispersive assembly includes at least two dispersive stages configured to disperse the collimated input; and an imaging lens assembly configured to image the electromagnetic radiation dispersed by the at least two dispersive stages onto a linear detection array such that the variation in frequency spacing along the linear detection array is no greater than about 10%.

    Abstract translation: 提供波数线性光谱仪，其包括被配置为从外部源接收电磁辐射的输入; 准直光学器件，被配置成准直所接收的电磁辐射; 包括第一和第二衍射光栅的分散组件，其中所述第一衍射光栅被配置在第一色散级中以接收所述准直电磁辐射，并且其中所述色散组件包括被配置为分散所述准直输入的至少两个色散级; 以及成像透镜组件，被配置为将由至少两个色散级分散的电磁辐射成像到线性检测阵列上，使得沿着线性检测阵列的频率间隔的变化不大于约10％。

    Multi-Function Spectrometer-On-Chip with a Single Detector Array
    246.
    发明申请
    Multi-Function Spectrometer-On-Chip with a Single Detector Array 有权
    具有单个检测器阵列的片上多功能光谱仪

    公开(公告)号：US20140085634A1

    公开(公告)日：2014-03-27

    申请号：US14035348

    申请日：2013-09-24

    Applicant: Kyle Preston ,  Arthur Nitkowski ,  Nicholas Sherwood ,  Arsen Hajian

    Inventor： Kyle Preston ,  Arthur Nitkowski ,  Nicholas Sherwood ,  Arsen Hajian

    IPC: G01J3/02

    CPC classification number: G01J3/447 ,  G01J3/0205 ,  G01J3/0218 ,  G01J3/0224 ,  G01J3/0259 ,  G01J3/18 ,  G01J3/1804 ,  G01J3/1895 ,  G01J3/2803 ,  G01J3/36

    Abstract: Various embodiments of apparatuses, systems and methods are described herein for a spectrometer comprising at least two dispersive elements configured to receive at least one input optical signal and generate two or more pluralities of spatially separated spectral components, at least a portion of the at least two dispersive elements being implemented on a first substrate; and a single detector array coupled to the at least two dispersive elements and configured to receive and measure two or more pluralities of narrowband optical signals derived from the two or more pluralities of spatially separated spectral components, respectively.

    Abstract translation: 本文描述了用于光谱仪的装置，系统和方法的各种实施例，其包括至少两个分散元件，其被配置为接收至少一个输入光信号并产生两个或更多个空间上分离的光谱分量，至少两个 分散元件被实施在第一基板上; 以及耦合到所述至少两个色散元件并被配置为分别接收和测量从所述两个或更多个空间分离的光谱分量导出的两个或更多个窄带光信号的单个检测器阵列。

    Spectrometry apparatus, detection apparatus, and method for manufacturing spectrometry apparatus
    249.
    发明授权
    Spectrometry apparatus, detection apparatus, and method for manufacturing spectrometry apparatus 有权
    光谱测定装置，检测装置以及光谱测定装置的制造方法

    公开(公告)号：US08570509B2

    公开(公告)日：2013-10-29

    申请号：US13106373

    申请日：2011-05-12

    Applicant: Jun Amako ,  Kohei Yamada

    Inventor： Jun Amako ,  Kohei Yamada

    IPC: G01J3/28 ,  G02B21/36

    CPC classification number: G01J3/1804 ,  G01J3/44 ,  G02B5/1857 ,  G02B5/1866 ,  G02B27/4261

    Abstract: A spectrometry apparatus includes a transmissive diffraction grating that transmits incident light. The transmissive diffraction grating has inclined surfaces made of a first dielectric material. The inclined surfaces are arranged so that they are inclined relative to a reference line. When the angle of incidence of light incident on the transmissive diffraction grating is measured with respect to the reference line and defined as an angle α, and the angle of diffraction of diffracted light is measured with respect to the reference line and defined as an angle β, the angle of incidence α is smaller than a Bragg angle θ defined with respect to the inclined surfaces, and the angle of diffraction β is greater than the Bragg angle θ.

    Abstract translation: 分光装置包括透射入射光的透射衍射光栅。 透射衍射光栅具有由第一介电材料制成的倾斜表面。 倾斜表面被布置成使得它们相对于参考线倾斜。 当入射到透射衍射光栅上的光的入射角相对于参考线被测量并被定义为角度α时，衍射光的衍射角相对于参考线被测量并被定义为角度β ，入射角α小于相对于倾斜面限定的布拉格角θ，衍射角β大于布拉格角θ。

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