摘要:
In a multilayer bandpass filter, capacitances are produced between a ground electrode provided in a ground electrode formation layer and capacitor electrodes provided in a capacitor electrode formation layer. A plurality of inductor electrodes are defined by via-electrodes and line electrodes such that loop planes of inductor electrodes at least partially overlap each other when seen in a direction in which the inductor electrodes are arranged. The direction of the loop of the inductor electrode of the LC parallel resonator located (at a first stage) at an input end is set to be opposite to the direction of the loop of the inductor electrodes of the LC parallel resonator (at a second stage) adjacent to the inductor electrode of the LC parallel resonator located at the input end. Similarly, the direction of the loop of the inductor electrode of the LC parallel resonator located (at a fifth stage) at an output end is set to be opposite to the direction of the loop of the inductor electrodes of the LC parallel resonator (at a fourth stage) adjacent to the inductor electrode of the LC parallel resonator located at the output end.
摘要:
A stage device suitable for exposure apparatus used to produce semiconductor devices, is movable in an area wider than the measurement area of interferometer for position measurement, and is capable of measuring the position with high precision. When a movable stage moves from the position where the laser beams from laser interferometers are not applied into the measurement area of the laser interferometer, the position of reference mark is measured by a wafer alignment sensor, and the measurement value measured by the laser interferometer is corrected based on the results of the measurement by the wafer alignment sensor. When another movable stage enters the measurement area of the laser interferometer, the position of the reference mark is similarly measured by a wafer alignment sensor, and the measurement value measured by the laser interferometer is corrected based on the results of the measurement by the wafer alignment sensor.
摘要:
An LC filter has a ratio of the inductance of an inductor to the capacitance of a capacitor, defining an input-side parallel LC resonant circuit, which is different from a ratio of the inductance of an inductor to the capacitance of a capacitor, defining an output-side parallel LC resonant circuit. The inductor of the input-side parallel LC resonant circuit includes inductor patterns. The inductor of the output-side parallel LC resonant circuit includes different inductor patterns. The capacitor of the input-side circuit includes capacitor patterns. The capacitor of the output-side circuit includes different capacitor patterns.
摘要:
An imagery characteristic is corrected by changing the position and/or orientation of a reticle or lens elements of a projection lens system. Correction of the imagery characteristic, however, causes displacement of the projected pattern image of the reticle. The relation between the driving amount of the lens elements and reticle and the lateral displacement of the center of the pattern image of the reticle is stored as a table in advance. When the lens elements and/or the reticle are driven, lateral displacement of the pattern image can be obtained by accessing the table. Alternatively, the lateral displacement can be determined using a base-line amount corresponding to a distance between a detection center of a substrate position detector and a center of the projected image. Once the pattern image displacement is determined, the substrate can be accurately positioned. In another arrangement, a mask alignment method prevents positional shift of a projected image of a mask pattern even if the projection magnification of the projection optical system is changed.
摘要:
A scanning type exposure apparatus comprises a mask stage RST for scanning a mask R across an illumination area on the mask R, a projection optical system PL for projecting an image of a pattern on the mask R onto a photosensitive substrate W, and a substrate stage WST for scanning the photosensitive substrate W across an exposure area. The apparatus comprises an image pickup unit 53 having its light-receiving section 1 provided on the substrate stage WST, for photoelectrically detecting an image of a mark pattern on the mask R, and a combining unit 4 for combining signals outputted from the image pickup unit 53 during a period in which the light-receiving section is scanned across the exposure area in synchronization with scanning for the mark pattern across the illumination area. Image formation characteristics or a position of the image of the mark pattern is determined on the basis of an output of the combining unit 4, which may be corrected before actual exposure. Correction is also performed by using synchronization errors. It is also possible to use an edge scan type sensor in place of the image pickup unit 53.
摘要:
A projection exposure apparatus has an illumination optical system for illuminating a mask, on which a predetermined pattern is formed, with light from a light source, a projection optical system for forming an image of the pattern of the mask on a photosensitive substrate, a mask stage for holding the mask and moving the mask within a plane perpendicular to the optical axis of the projection optical system, a substrate stage for moving the photosensitive substrate within a plane conjugate to the plane with respect to the projection optical system, and imaging characteristic correction device for correcting an imaging characteristic of the projection optical system. The apparatus synchronously moves the mask and the photosensitive substrate along the optical axis of the projection optical system so as to expose the entire pattern surface of the mask. The apparatus includes an incident light intensity input device for inputting the intensity of the illumination light, which is incident on the projection optical system through the mask, in accordance with the position of the mask, and an imaging characteristic calculation device for calculating a variation in imaging characteristic of the projection optical system on the basis of information from the incident light intensity input device. The imaging characteristic correction device is controlled on the basis of a result obtained by the imaging characteristic calculation device.
摘要:
A method of detecting a focus position of a projection optical system at a high throughput and with high accuracy. A sensor pattern (SP) which is provided on a wafer stage (WS) as a light-receiving part of a photoelectric sensor (PES) is moved in the direction of an optical axis (AX) of a projection optical system (PL), and at the same time, it is moved in a direction (X) perpendicular to the optical axis (AX). While doing so, a reticle pattern (RP) which is provided on a reticle (R) is illuminated by illuminating light (IL) for exposure, and an image of the reticle pattern (RP) is formed on the sensor pattern (SP) through the projection optical system (PL). Light passing through the sensor pattern (SP) is received by the photoelectric sensor (PES), and a focus position is detected on the basis of the intensity of the transmitted light.
摘要:
Coil electrodes having a U-shape and shield electrodes having a plane shape are formed on plural dielectric layers. The coil electrodes are connected via through holes which are formed through the dielectric layers, and a spiral electrode is formed. An earth terminal and an input/output terminal are drawn out from the coil electrode to the end portion of the dielectric layer. The shield electrodes are formed on both of the coil electrodes. The dielectric layers are laminated, and the shield electrode and the earth terminal are connected by an external electrode. An external electrode connected to the input/output terminal is formed. A band-pass filter is made by forming plural spiral electrodes and magnetically coupling the spiral electrodes.
摘要:
Two coil electrode patterns are formed on one surface of a plate containing a dielectric material. These coil electrode patterns are formed in a loop shape, and disposed in a magnetically connected state with each other. Input/output terminal patterns and earth terminal patterns are drawn out from the coil electrode patterns toward edges on different sides of the plate. The input/output terminal pattern and the earth terminal pattern of one coil electrode pattern are disposed at a selected distance from each other so as to provide a predetermined impedance. An earth electrode pattern is formed opposite the coil electrode patterns with the plate between them. Earth terminal patterns are connected to the earth electrode pattern. The earth terminal patterns of the earth electrode pattern are connected to the earth terminal patterns of the coil electrode patterns. A trimming electrode may be formed for adjusting the passing band frequency of the band-pass filter optionally.
摘要:
Ultrashort optical pulses of a high peak output are generated by gain-switching of a semiconductor laser possessing a current non-injection region with short current pulses. By coupling this semiconductor laser to a wavelength conversion element, a second harmonic wave is generated, and ultrashort optical pulses of a short wavelength and a high peak output are generated.