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公开(公告)号:US20240213327A1
公开(公告)日:2024-06-27
申请号:US18485740
申请日:2023-10-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Boram KIM , Jaejoon OH , Jongseob KIM
IPC: H01L29/15 , H01L29/20 , H01L29/778
CPC classification number: H01L29/155 , H01L29/2003 , H01L29/7786
Abstract: Provided are a superlattice buffer structure and a semiconductor device having the superlattice buffer structure. The superlattice buffer structure includes a plurality of superlattice blocks, and each of the plurality of superlattice blocks has a structure in which a first layer including Al(1−x)GaxN (0≤x≤1) and a second layer including Al(1−y)GayN (0≤y≤1, x>y) are alternately stacked on each other.
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公开(公告)号:US20230378993A1
公开(公告)日:2023-11-23
申请号:US18363908
申请日:2023-08-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ohhyuck KWON , Jaeyoung HUH , Daesuk KANG , Boram KIM , Jonghoon LIM , Sungchul PARK
CPC classification number: H04B1/44 , H01Q3/24 , H01Q21/0025 , H04B1/0064 , H04M1/026 , H04M2250/12
Abstract: An electronic device and method thereof are provided. A method includes, while a wireless communication of a first frequency band is performed via a first 5G antenna, obtaining first status information related to the first 5G antenna and second status information related to a second 5G antenna; if the first status information does not satisfy a first predetermined condition and the second status information satisfies a second predetermined condition, switching from the first 5G antenna to the second 5G antenna, and performing the wireless communication in the first frequency band via the second 5G antenna; and if the first status information does not satisfy the first predetermined condition and the second status information does not satisfy the second predetermined condition, switching from the first 5G antenna to a legacy communication antenna, and performing the wireless communication in a second frequency band via the legacy communication antenna.
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公开(公告)号:US20200319307A1
公开(公告)日:2020-10-08
申请号:US16840037
申请日:2020-04-03
Inventor: Jaeyoung HUH , Kyungwan PARK , Jungho BAE , Boram KIM , Youngjin KIM , Hyun KIM , Byeonghoon PARK , Yoonsun PARK , Woontahk SUNG , Kyungwoo LEE , Kihoon JANG , Younho CHOI
IPC: G01S7/481 , G03B17/55 , H01S5/024 , H01S5/022 , H05K5/00 , H05K1/02 , H05K1/14 , H05K7/20 , G01S17/10
Abstract: An electronic device including a heat-radiant structure of a camera is provided. The electronic device includes a housing including a front plate facing a first direction and a back plate facing a second direction opposite to the first direction, an image sensor to receive light through a first region of the back plate, the image sensor disposed inside the housing, a laser emitter to emit light through a second region of the back plate, adjacent to the first region, the laser emitter disposed inside the housing, adjacent to the image sensor, a laser driver disposed between the laser emitter and the front plate, a housing structure surrounding at least a part of a side face of the image sensor and driver, a first metal structure disposed between the laser emitter and the laser driver, a first heat transfer member including a first portion disposed between the first metal structure and the driver, a second portion extended from the first portion along an outer face of the housing structure, and a third portion extended from the second portion to a space between the driver and the front plate, while in contact with the first metal structure, a second heat transfer member extended from the third portion of the first heat transfer member, and a first Thermal Interface Material (TIM) disposed between the second heat transfer member and the front plate, the first TIM being in contact with the second heat transfer member.
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公开(公告)号:US20250147080A1
公开(公告)日:2025-05-08
申请号:US19012554
申请日:2025-01-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Boram KIM , Younggon JEON
IPC: G01R19/165
Abstract: An electronic device is disclosed. The electronic device includes: a power detection IC which, based on abnormality of at least one voltage among multiple voltages being detected, outputs a detection signal having a specified level, and at least one processor, comprising processing circuitry, individually and/or collectively, configured to perform an operation corresponding to the level of a detection signal output from the power detection IC, wherein the multiple voltages include a first voltage and a second voltage, at least one of multiple input ends of the power detection IC is in common connection with a first resistance to which the first voltage is applied and a switching element comprising a switch connected to a second resistance to which the second voltage is applied, and based on the switching element being turned on based on the second voltage and a reference voltage applied to the switching element, the power detection IC is configured to compare the second voltage applied to the at least one input end with a threshold voltage to detect whether the second voltage is abnormal.
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公开(公告)号:US20240204092A1
公开(公告)日:2024-06-20
申请号:US18321284
申请日:2023-05-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Junhyuk PARK , Jaejoon OH , Sunkyu HWANG , Boram KIM , Jongseob KIM , Joonyong KIM
IPC: H01L29/778 , H01L23/31 , H01L29/20 , H01L29/66
CPC classification number: H01L29/7786 , H01L23/3171 , H01L29/2003 , H01L29/66462
Abstract: A semiconductor device includes a channel layer, a lower barrier layer on the channel layer and including first impurities, an upper barrier layer arranged on the lower barrier layer and including second impurities having a concentration greater than a concentration of the first impurities, a gate electrode on the upper barrier layer, a gate semiconductor layer between the upper barrier layer and the gate electrode, and a source and a drain that are on the channel layer and are spaced apart from each other.
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公开(公告)号:US20230343830A1
公开(公告)日:2023-10-26
申请号:US18306341
申请日:2023-04-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Boram KIM , Jongseob KIM , Woochul JEON , Joonyong KIM , Junhyuk PARK , Jaejoon OH , Sunkyu HWANG , Injun HWANG
IPC: H01L29/15 , H01L29/20 , H01L29/207 , H01L29/778
CPC classification number: H01L29/157 , H01L29/2003 , H01L29/207 , H01L29/7786
Abstract: Provided are a nitride semiconductor buffer structure and a semiconductor device including the same. The buffer structure may include a plurality of buffer layers between a substrate and an active layer. The active layer may include a nitride semiconductor. The plurality of buffer layers may be stacked on each other on the substrate. Each of the plurality of buffer layers may have a super lattice structure and may include a doped nitride semiconductor. The plurality of buffer layers may have different compositions from each other. Adjacent buffer layers, among the plurality of buffer layers, may have different doping concentrations from each other.
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公开(公告)号:US20220310833A1
公开(公告)日:2022-09-29
申请号:US17386729
申请日:2021-07-28
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dongchul SHIN , Boram KIM , Younghwan PARK , Jongseob KIM , Joonyong KIM , Junhyuk PARK , Jaejoon OH , Minchul YU , Soogine CHONG , Sunkyu HWANG , Injun HWANG
IPC: H01L29/778 , H01L29/20 , H01L29/205
Abstract: A high electron mobility transistor (HEMT) includes a channel layer, a plurality of barrier layers, and a p-type semiconductor layer. The barrier layers have an energy band gap greater than that of the channel layer. A gate electrode is arranged on the p-type semiconductor layer. A source electrode and a drain electrode are apart from the p-type semiconductor layer and the gate electrode on the barrier layers. Impurity concentrations of the barrier layers are different from each other in a drift area between the source electrode and the drain electrode.
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公开(公告)号:US20200322467A1
公开(公告)日:2020-10-08
申请号:US16839534
申请日:2020-04-03
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jaeyoung HUH , Kyungwan PARK , Seunghoon KANG , Boram KIM , Youngjin KIM , Sunghoon MOON , Hongki MOON , Yoonsun PARK , Hajoong YUN , Jonghoon LIM
Abstract: An electronic device including: a housing including a frame structure that forms a portion of a surface of the electronic device, a plate structure that is surrounded by the frame structure and that includes a first opening, a metal portion containing a metallic material and a polymer portion containing a polymer material; a support plate that faces the plate structure and that includes a polymer area formed of a polymer material; a printed circuit board that makes contact with part of the metal portion of the housing; a camera module disposed between the polymer portion included in the plate structure and the polymer area included in the support plate, the camera module including a camera bracket, a camera PCB, and a light emitting unit and a light receiving unit; and a heat dissipating structure that transfers heat generated from the camera module to the metal portion included in the housing
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