公开(公告)号：US07693689B2

公开(公告)日：2010-04-06

申请号：US11960803

申请日：2007-12-20

Applicant: Jun Koshoubu ,  Tetsuji Sunami ,  Kenichi Akao ,  Keisuke Watanabe

Inventor： Jun Koshoubu ,  Tetsuji Sunami ,  Kenichi Akao ,  Keisuke Watanabe

IPC: G03H1/26 ,  H04B15/00

CPC classification number: G06K9/0051

Abstract: A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.

Abstract translation: 一种噪声分量去除方法，用于从通过在样本表面的测量点执行的测量产生的多点频谱数据中去除噪声分量，所述方法包括：PLS分析步骤，用于确定每个测量点的多点频谱数据的分量 通过使用通过量化关于每个测量点的特性的特性信息获得的值而获得多点频谱数据进行多变量分析的多点分析数据，除了测量点的光谱信息以外，以及 在偏最小二乘回归中使用光谱信息作为独立变量; 以及频谱重构步骤，根据在PLS分析步骤中确定的分量，重构每个测量点的多点频谱数据以消除具有低于预定值的特征值的分量。

公开(公告)号：US07492460B2

公开(公告)日：2009-02-17

申请号：US11337817

申请日：2006-01-23

Applicant: Jun Koshoubu ,  Noriaki Soga

Inventor： Jun Koshoubu ,  Noriaki Soga

IPC: G01N21/55

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01N21/552

Abstract: The present invention provides an attenuated-total-reflection (“ATR”) measurement apparatus that collects light onto a contact surface between a sample and an ATR prism at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus according to the invention includes: a light-irradiating system for emitting the light which is collected onto the contact surface; a photodetector for detecting the total-reflection light from the contact surface; an aperture for restricting the light which the photodetector detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror provided in a light path extending from the ATR prism to the aperture.

Abstract translation: 本发明提供了一种衰减全反射（“ATR”）测量装置，其以大于或等于临界角的入射角将光聚集到样品和ATR棱镜之间的接触表面上，并测量来自 接触面。 根据本发明的衰减全反射测量装置包括：用于发射被收集在接触表面上的光的光照射系统; 用于检测来自接触表面的全反射光的光电检测器; 用于限制光电检测器检测到的光仅在来自接触表面中的特定测量位置的光的孔; 以及设置在从ATR棱镜延伸到光圈的光路中的检测侧扫描镜。

公开(公告)号：US20080154549A1

公开(公告)日：2008-06-26

申请号：US11960803

申请日：2007-12-20

Applicant: Jun Koshoubu ,  Tetsuji Sunami ,  Kenichi Akao ,  Keisuke Watanabe

Inventor： Jun Koshoubu ,  Tetsuji Sunami ,  Kenichi Akao ,  Keisuke Watanabe

IPC: G06F15/00

CPC classification number: G06K9/0051

Abstract: A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.

Abstract translation: 一种噪声分量去除方法，用于从通过在样本表面的测量点执行的测量产生的多点频谱数据中去除噪声分量，所述方法包括：PLS分析步骤，用于确定每个测量点的多点频谱数据的分量 通过使用通过量化关于每个测量点的特性的特性信息获得的值而获得多点频谱数据进行多变量分析的多点分析数据，除了测量点的光谱信息以外，以及 在偏最小二乘回归中使用光谱信息作为独立变量; 以及频谱重构步骤，根据在PLS分析步骤中确定的分量，重构每个测量点的多点频谱数据以消除具有低于预定值的特征值的分量。

公开(公告)号：US06867417B2

公开(公告)日：2005-03-15

申请号：US10355030

申请日：2003-01-31

Applicant: Toshiyuki Nagoshi ,  Seiichi Kashiwabara ,  Jun Koshoubu

Inventor： Toshiyuki Nagoshi ,  Seiichi Kashiwabara ,  Jun Koshoubu

IPC: G01J3/45 ,  G01J3/453 ,  G01J5/10 ,  H04N5/33 ,  G01J5/02

CPC classification number: G01J5/10 ,  G01J3/453 ,  G01N2021/3595 ,  H04N5/33 ,  H04N5/349

Abstract: It is an object of the present invention to provide a data acquiring method in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of scanning each element of the multi-element detector in order synchronously with a sampling signal (12) generated by a reference signal (10) of an interferometer and repeating a series of scanning operations after completely scanning all the elements, thereby carrying out scan, shifting a starting point of sampling in next scan by one element from the starting point of the previous scan, thereby carrying out the same scanning, and repeating the scan at the number of times corresponding to the number of all the elements and then extracting data for each element from storing sampling data, thereby acquiring a data sequence of all the sampling points for each element.

Abstract translation: 本发明的目的是提供一种红外成像装置中的数据获取方法，该方法包括用于通过多元素检测器检测信号的连续扫描类型的FTIR装置。 一种从红外成像设备中的多元件检测器获取数据的方法，包括以下步骤：与由干涉仪的参考信号（10）产生的采样信号（12）同步地扫描多元件检测器的每个元件， 并且在完全扫描所有元件之后重复一系列扫描操作，从而进行扫描，从下次扫描中的采样起始点从先前扫描的起始点移位一个元件，从而执行相同的扫描，并重复 扫描与所有元素的数量相对应的次数，然后从存储采样数据中提取每个元素的数据，从而获取每个元素的所有采样点的数据序列。

公开(公告)号：US20100110441A1

公开(公告)日：2010-05-06

申请号：US12613586

申请日：2009-11-06

Applicant: Jun Koshoubu

Inventor： Jun Koshoubu

IPC: G01J3/45

CPC classification number: G01J3/453 ,  G01J3/2889 ,  G02B21/0096

Abstract: A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler.

Abstract translation: 一种显微镜，包括：用于收集来自样品的测量区域的光的光采样器; 具有多个光电元件的多元件检测器，用于检测由光采样器收集的光，每个光电元件对应于测量区域中的微小测量区域与一一对应; 傅里叶变换分光光度计作为分光镜; 数据采样器，用于在由傅里叶变换分光光度计确定的时刻同时采样从多元素检测器的每个光电元件发送的强度数据; 以及数据处理器，用于根据由数据采样器获得的时间上改变的干涉光数据，为每个微小测量区域获得时间分辨的光谱数据。

公开(公告)号：US20090103173A1

公开(公告)日：2009-04-23

申请号：US12255687

申请日：2008-10-22

Applicant: Kenichi Akao ,  Jun Koshoubu

Inventor： Kenichi Akao ,  Jun Koshoubu

IPC: G02B21/00

CPC classification number: G02B21/0004 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0289 ,  G01J3/453 ,  G02B21/002 ,  G02B21/365

Abstract: A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system. The microscopic-measurement apparatus for acquiring optical information from desired portions of a sample by moving a measuring optical axis on a surface of the sample includes an observation-image display section for displaying a sample surface image as an observation image, in a range of visual field which is observable at a present sample position; an optical-axis display section for displaying areas to be measured and a present position of the measuring optical axis in an overlapped state with the observation image; an area setting section capable of setting measuring areas by expanding, reducing, changing in shape and moving the areas to be measured; and an optical-information acquisition section for measuring one set measuring area or several set measuring areas successively with an instruction of starting measurement.

Abstract translation: 一种能够在几个设定区域中依次进行测量而不管舞台驱动系统的类型或舞台驱动系统的精度的微观测量装置。 用于通过在样品的表面上移动测量光轴从样品的期望部分获取光学信息的微观测量装置包括用于在视觉范围内显示样品表面图像作为观察图像的观察图像显示部分 在当前样本位置可观察到的场; 用于以与观察图像重叠的状态显示测量区域和测量光轴的当前位置的光轴显示部分; 区域设定部，其能够通过扩大，缩小，变形和移动要测量的区域来设定测量区域; 以及光学信息获取部分，用于连续地用开始测量的指令测量一个设置的测量区域或多个设置的测量区域。

公开(公告)号：US20080282197A1

公开(公告)日：2008-11-13

申请号：US12117252

申请日：2008-05-08

Applicant: Masaaki Yumoto ,  Kenichi Akao ,  Yoshiko Akao ,  Jun Koshoubu

Inventor： Masaaki Yumoto ,  Kenichi Akao ,  Yoshiko Akao ,  Jun Koshoubu

IPC: G06F17/00

CPC classification number: G02B21/365

Abstract: A microscopic-measurement apparatus capable of displaying, on a display device, an enlarged view of a particular part of a specimen placed on a movable stage and providing optical information of a desired portion includes an observation-image display section for displaying an enlarged view of a specific part of the specimen on the display device; a thumbnail-image display section for acquiring the enlarged image of the specific part as a thumbnail image when the enlarged observation image is specified and displaying the thumbnail image together with the enlarged image on the display device; a thumbnail-coordinate storage section for storing coordinate information of the specific part, where the thumbnail image is acquired, in association with the thumbnail image; and a thumbnail jump display section for causing the observation-image display section to display an enlarged image of the position of the thumbnail image by specifying the thumbnail image.

Abstract translation: 一种能够在显示装置上显示放置在可移动台上的试样的特定部分并提供所需部分的光学信息的微观测量装置，包括观察图像显示部分，用于显示放大视图 显示装置上的样本的特定部分; 缩略图像显示部分，用于在指定放大的观察图像时获取特定部分的放大图像作为缩略图像，并且将显示缩略图与放大的图像一起显示在显示装置上; 缩略图坐标存储部分，用于存储与缩略图相关联的获取缩略图的特定部分的坐标信息; 以及缩略图跳转显示部分，用于使观察图像显示部分通过指定缩略图来显示缩略图像的位置的放大图像。

公开(公告)号：US07224460B2

公开(公告)日：2007-05-29

申请号：US10970518

申请日：2004-10-21

Applicant: Noriaki Soga ,  Jun Koshoubu ,  Hiroshi Tsukada

Inventor： Noriaki Soga ,  Jun Koshoubu ,  Hiroshi Tsukada

IPC: G01N21/00 ,  G01N21/55

CPC classification number: G01N21/3563 ,  G01N21/55 ,  G01N21/59 ,  G01N2201/1053 ,  G01N2201/117

Abstract: A mapping-measurement apparatus includes a light illumination unit, a photodetector for detecting, through an aperture, reflection light or transmission light from a sample, and adjustable scanning mirrors on the illumination and detection sides of the sample, each mirror having two independent rotational axes about which they can be independently rotated by a controller. The aperture restricts light incident on the photodetector from a predetermined portion of the sample surface.

Abstract translation: 映射测量装置包括光照射单元，用于通过孔径检测来自样品的反射光或透射光的光电检测器，以及在样品的照射和检测侧上的可调扫描反射镜，每个反射镜具有两个独立的旋转轴 它们可以由控制器独立旋转。 孔径从样品表面的预定部分限制入射在光电检测器上的光。

公开(公告)号：US20060119856A1

公开(公告)日：2006-06-08

申请号：US11293931

申请日：2005-12-05

Applicant: Jun Koshoubu

Inventor： Jun Koshoubu

IPC: G01B9/02

CPC classification number: G01J3/453 ,  G01J3/2889 ,  G02B21/0096

Abstract: A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler.

Abstract translation: 一种显微镜，包括：用于收集来自样品的测量区域的光的光采样器; 具有多个光电元件的多元件检测器，用于检测由光采样器收集的光，每个光电元件对应于测量区域中的微小测量区域与一一对应; 傅里叶变换分光光度计作为分光镜; 数据采样器，用于在由傅里叶变换分光光度计确定的时刻同时采样从多元素检测器的每个光电元件发送的强度数据; 以及数据处理器，用于根据由数据采样器获得的时间上改变的干涉光数据，为每个微小测量区域获得时间分辨的光谱数据。

公开(公告)号：US07002692B2

公开(公告)日：2006-02-21

申请号：US10457400

申请日：2003-06-10

Applicant: Kenichi Akao ,  Jun Koshoubu

Inventor： Kenichi Akao ,  Jun Koshoubu

IPC: G01B9/02

CPC classification number: G01N21/19

Abstract: The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy.An infrared circular dichroism measuring apparatus 101 comprising: AC signal extractors 110–112 where an interference light beam from an IR light source 102 which has passed an interferometer 103 is converted into a clockwise and a counterclockwise circularly polarized light beams and is irradiated on a sample to extract from a detected signal of detector 107 an interferogram by each of the circularly polarized light beams; DC signal extractors 113, 112 for extracting an interferogram by the IR absorption of the sample; a calculator 114 for figuring out the circular dichroism; and a selective transmitter 120 for narrowing down the wavelength region to be measured based on an IR absorption wavelength region corresponding to a vibration mode of the structure to be measured in the sample molecule.

Abstract translation: 本发明的目的是提供一种改善测量时间和测量精度的红外圆二色性测量装置。