Back-to-back NPN/PNP protection diodes
    11.
    发明授权
    Back-to-back NPN/PNP protection diodes 有权
    背对背NPN / PNP保护二极管

    公开(公告)号:US07285827B1

    公开(公告)日:2007-10-23

    申请号:US11194449

    申请日:2005-08-02

    CPC classification number: H01L27/0266 H01L27/0255

    Abstract: A device includes a memory device and an NPN or PNP diode coupled to a word-line of the memory device. The NPN or PNP diode reduces device damage and performance impairment that may result from device charging by drawing charges away from the memory device.

    Abstract translation: 一种设备包括存储器件和耦合到存储器件的字线的NPN或PNP二极管。 NPN或PNP二极管通过从存储器件中抽取电荷来减少设备充电所造成的器件损坏和性能损害。

    DEVICE WITH ESD PROTECTION
    12.
    发明申请
    DEVICE WITH ESD PROTECTION 失效
    具有ESD保护功能的设备

    公开(公告)号:US20070223148A1

    公开(公告)日:2007-09-27

    申请号:US11745787

    申请日:2007-05-08

    Abstract: A device according to one embodiment includes an electronic component such as an MR sensor, a pair of leads operatively coupled to the electronic component, and shorting material between the leads, the shorting material having been applied by a laser deposition process, the shorting material having been severed. A magnetic storage system according to another embodiment includes magnetic media; and at least one head for reading from and writing to the magnetic media, each head having: a sensor; and a writer coupled to the sensor. The system also includes a pair of pads or leads operatively coupled to the head; shorting material between the leads, the shorting material having been applied by a laser deposition process, the shorting material having been severed; a slider for supporting the head; and a control unit coupled to the head for controlling operation of the head.

    Abstract translation: 根据一个实施例的装置包括诸如MR传感器的电子部件,可操作地耦合到电子部件的一对引线以及引线之间的短路材料,通过激光沉积工艺施加了短路材料,所述短路材料具有 被切断 根据另一实施例的磁存储系统包括磁介质; 以及用于从磁介质读取和写入至少一个头部,每个头部具有:传感器; 以及耦合到传感器的写入器。 该系统还包括可操作地耦合到头部的一对垫或引线; 在引线之间短路材料,通过激光沉积工艺施加的短路材料,短路材料已被切断; 用于支撑头部的滑块; 以及耦合到头部用于控制头部的操作的控制单元。

    Method of forming an embedded read element
    13.
    发明授权
    Method of forming an embedded read element 失效
    形成嵌入式读取元素的方法

    公开(公告)号:US07062838B2

    公开(公告)日:2006-06-20

    申请号:US10666679

    申请日:2003-09-19

    Abstract: A method of forming an embedded read element is used in the fabrication process of a magnetic head assembly including write and read heads. In this method, three photolithographic patterning steps are applied for defining the designed height of the embedded read element, defining its designed width, and connecting it with conducting layers, respectively. An in-line lapping guide is also formed with a spacing in front of the embedded read element. In this method, two mechanical lapping steps are applied, one monitored by measuring the resistance of a parallel circuit of the embedded read element and the in-line lapping guide, and the other monitored by measuring the GMR response of the embedded read element.

    Abstract translation: 在包括写入和读取头的磁头组件的制造过程中使用形成嵌入式读取元件的方法。 在该方法中,应用三个光刻图案步骤来定义嵌入式读取元件的设计高度,限定其设计宽度,并将其与导电层连接。 在嵌入式读取元件的前面还形成有间距的在线研磨引导件。 在这种方法中,应用了两个机械研磨步骤,一个通过测量嵌入式读取元件的并联电路的电阻和在线研磨导轨进行监测,另一个通过测量嵌入式读取元件的GMR响应进行监测。

    Flash memory programming and verification with reduced leakage current
    15.
    发明授权
    Flash memory programming and verification with reduced leakage current 有权
    闪存编程和验证,减少漏电流

    公开(公告)号:US08031528B2

    公开(公告)日:2011-10-04

    申请号:US12557721

    申请日:2009-09-11

    Abstract: A flash memory system configured in accordance with an example embodiment of the invention employs a virtual ground array architecture. During programming operations, target memory cells are biased with a positive source bias voltage to reduce or eliminate leakage current that might otherwise conduct through the target memory cells. A positive source bias voltage may also be applied to target memory cells during verification operations (program verify, soft program verify, erase verify) to reduce or eliminate leakage current that might otherwise introduce errors in the verification operations.

    Abstract translation: 根据本发明的示例性实施例配置的闪存系统采用虚拟接地阵列架构。 在编程操作期间,目标存储器单元被偏置为正的源偏置电压,以减少或消除否则可能通过目标存储器单元传导的漏电流。 在验证操作(程序验证,软程序验证,擦除验证)期间,也可以将正源偏置电压施加到目标存储器单元,以减少或消除可能在验证操作中引入错误的泄漏电流。

    Device with ESD protection utilizing a shorting material between electrical pads or leads which are shorted then unshorted by severing the shorting material and then recreating the short by reapplying the shorting material
    17.
    发明授权
    Device with ESD protection utilizing a shorting material between electrical pads or leads which are shorted then unshorted by severing the shorting material and then recreating the short by reapplying the shorting material 失效
    具有ESD保护的装置,利用电焊盘或导线之间的短路材料,短路材料短路,然后通过切断短路材料,然后通过重新应用短路材料重建短路

    公开(公告)号:US07345853B2

    公开(公告)日:2008-03-18

    申请号:US11745787

    申请日:2007-05-08

    Abstract: A device according to one embodiment includes an electronic component such as an MR sensor, a pair of leads operatively coupled to the electronic component, and shorting material between the leads, the shorting material having been applied by a laser deposition process, the shorting material having been severed. A magnetic storage system according to another embodiment includes magnetic media; and at least one head for reading from and writing to the magnetic media, each head having: a sensor; and a writer coupled to the sensor. The system also includes a pair of pads or leads operatively coupled to the head; shorting material between the leads, the shorting material having been applied by a laser deposition process, the shorting material having been severed; a slider for supporting the head; and a control unit coupled to the head for controlling operation of the head.

    Abstract translation: 根据一个实施例的装置包括诸如MR传感器的电子部件,可操作地耦合到电子部件的一对引线以及引线之间的短路材料,通过激光沉积工艺施加了短路材料,所述短路材料具有 被切断 根据另一实施例的磁存储系统包括磁介质; 以及用于从磁介质读取和写入至少一个头部,每个头部具有:传感器; 以及耦合到传感器的写入器。 该系统还包括可操作地耦合到头部的一对垫或引线; 在引线之间短路材料,通过激光沉积工艺施加的短路材料,短路材料已被切断; 用于支撑头部的滑块; 以及耦合到头部用于控制头部的操作的控制单元。

Patent Agency Ranking