Abstract:
A circuit for the reading of charges injected at its input comprises a read MOS transistor, the type of which conditions the polarity of the charges that the read circuit is capable of reading without getting blocked, and an integration capacitor mounted between a first electrode of the drain-source pair of the read MOS transistor and a reference potential. The input of the circuit is at the second electrode of the drain-source pair of the read MOS transistor. The injected charges must cross the read MOS transistor to be integrated by the capacitor. The read MOS transistor is controlled by a control voltage that varies in a manner that is substantially inversely proportional to the input voltage. The circuit has means to detect the arrival, at the input, of charges with a polarity opposite to the polarity of the charges that it is capable of reading and means for the imposing, on the input voltage, after a detection of this kind, of an equilibrium value equal or close to a basic value that it takes between two successive operations of integrating charges with the desired polarity so as to prevent a prolonged blocking of the read MOS transistor at the arrival of charges with a desired polarity
Abstract:
In a sample hold circuit (6, 50, 60) capable of relaxing a dependency of a voltage of an analogue input signal on an ON resistance of a switch (2). In the sample hold circuit (6, 50, 60), plural reference voltages VrefN are supplied, and unit switches (11e) forming the switch (2) are selectively activated (an ON state) based on a comparison results (whether or not the voltage of the analogue input signal is greater than each reference voltage) from plural comparison circuits (13e) whose operations are performed based on the voltage of the analogue input signal (1).
Abstract:
A semiconductor device includes a sample and hold circuit which has an analog switch and a first capacitor and which samples and holds an analog input signal, and a boost circuit which has a boost part which boosts a sampling clock pulse and a clamp part which limits a boosted voltage to a predetermined level. The sample and hold circuit operates a boosted sampling clock pulse. The boost circuit includes a control circuit which operates the clamp part only at the moment the sampling clock pulse changes to a high level.
Abstract:
An operational amplifier charges a charge storage capacitor in response to an input signal supplied to a non-inverting input terminal. When a switching signal is low, NPN transistors disposed in an output open circuit are on. Therefore, output transistors disposed in a push-pull circuit are off and the output signal is cut off. Further, in this situation, the potential of a phase compensation capacitor is held because AC coupling of the phase compensation capacitor does not occur.
Abstract:
A comparator (22) compares the output signal (Vout) supplied by an output amplifier (21) with an input signal (Vin). Dependent on the result of the comparison, it controls the conduction of one or the other of two sources (IGA, IGB) which supply opposite currents. Two complementary assemblies (A, B) each comprise a first transistor (T1A, T1B) and a second transistor (T2A, T2B). Each first transistor (T1A, T1B) has its base controlled by one of the current sources for charging a first capacitance (C1) connected to the output, and also controls the conduction of the corresponding second transistor. The bases of the second transistors (T2A, T2B) are jointly connected to the first capacitance (C1) and their emitters are jointly connected to the negative input of the output amplifier (21). The negative input of the output amplifier (21) is also connected to a reference voltage (Vref) via a resistor (20) and to the output (Vout) via a second capacitance (C2).
Abstract:
A very low voltage sampling circuit which is capable of a full ranging output when powered with a very low voltage, e.g., of about 1 volt. A pre-charge circuit is combined with a sample and hold circuit to avoid the need for low threshold switching devices in the sampling circuit, thus avoiding output droop due to the increased leakage of low threshold devices. The pre-charge circuit is placed between the sample and hold circuit and an output of the sampling circuit to `boost` the voltage level of the output of the sample and hold circuit to above a predetermined threshold voltage level. The pre-charge circuit includes an output voltage boost capacitor which is charged before the hold cycle of the sampling circuit. The negative node of the output voltage boost capacitor is charged to a reference voltage, and the positive node is charged approximately to a level of the input signal itself.
Abstract:
A fully differential sample-and-hold amplifier 60 includes a common-mode feedback circuit 100 for adjusting the common-mode input so that the common-mode output remains near a desired level. During a first switching state, the sample-and-hold amplifier samples voltages and is coupled to the feedback circuit 100 for the adjustment of the common-mode input level. During a second switching state, sample-and-hold amplifier performs its charge transfer and amplification function while the feedback circuit 100 is not coupled to the sample-and-hold amplifier. During the first switching state, the feedback circuit 100 receives as an input the common-mode voltage of the operational amplifier and outputs an amplification of the difference between the common-mode voltage and a regulating input voltage. The output of the sample-and-hold amplifier is coupled to the common-mode input of the operational amplifier. In this manner, differences between the common-mode voltage of the operational amplifier and the regulating voltage are used to adjust the common-mode input of the operational amplifier so that the common-mode output of the operational amplifier approximates the regulating voltage. The common-mode feedback circuit 100 includes a current source I1, a pair of differential input transistors M3 and M4, and a pair of load transistors M1 and M2. The gate of the input transistor M3 is coupled to the regulating voltage, while the gate of the input transistor M4 is coupled by a switching means to the output of the operational amplifier. The load transistors M1 and M2 are connected in an active load configuration. The output of the common-mode feedback circuit 100 is taken from the drain of the load transistor M1. The operational amplifier used in the sample-and-hold amplifier may be a telescopic cascode operational transconductance amplifier.
Abstract:
A BiCMOS process which provides both low voltage (digital) and high voltage (analog) CMOS devices. The high voltage NMOS devices have a compensated drain formed by the NPN and PNP base implants. The PNP base plus the high voltage NMOS drain carrier concentrations are both optimized by adjustment of the two variables N base implant dose and P base implant dose; this determines the NPN base carrier concentration which turns out to provide good NPN characteristics. Low voltage NMOS source and drain implants employ a higher dose and may also be used for the high voltage NMOS source. The NPN emitter doping may also be used for a contact to the high voltage NMOS drain contact.
Abstract:
A low distortion track-and-hold circuit in which a simple, four-transistor amplifier makes the circuit characteristics independent of the source impedance, and compensates for unequal voltage drops caused by mismatched diodes. An additional pair of bipolar transistors is used to eliminate errors caused by switching transients coupled through the diodes. In the track mode, the differential output voltage between two sampling capacitors tracks the differential input voltage of the circuit. At the end of the track time, this differential output voltage is equal to the differential input voltage. During the hold period, the sampling capacitors are isolated from the differential input voltage. The voltages controlling the switching diodes reverse symmetrically during the transition from track to hold, resulting in a cancellation of any feedthrough of the switching transients to the sampling capacitor. Beta and temperature compensation circuits are also included in the differential track-and-hold circuit. In a single-ended in and single-ended out configuration, an operational amplifier can be used to provide a unity-gain buffer and the correct voltage offset. The invention may be implemented using bipolar transistors, MOSFET and JFET technologies.
Abstract:
A charge amplifier with DC offset cancelling for use in a pixel element of an MOS image sensor is disclosed. The charge amplifier can be manufactured using a standard CMOS single polycrystalline process, making it much more cost effective than prior art designs. The charge amplifier includes an operational amplifier, a source capacitor, a series capacitor, and a feedback capacitor. The source capacitor holds the input signal. The output of the operational amplifier provides the output signal. Switches control the routing of the signal flow from the source capacitor, the series capacitor, and the feedback capacitor.