公开(公告)号：US20050157293A1

公开(公告)日：2005-07-21

申请号：US10503636

申请日：2003-01-28

Applicant: Stefan Florek ,  Helmut Becker-Ross ,  Uwe Heitmann

Inventor： Stefan Florek ,  Helmut Becker-Ross ,  Uwe Heitmann

IPC: G01J3/02 ,  G01J3/04 ,  G01J3/08 ,  G01J3/12 ,  G01J3/14 ,  G01J3/18 ,  G01J3/28

CPC classification number: G01J3/04 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/08 ,  G01J3/14 ,  G01J3/1809 ,  G01J3/28 ,  G01J2003/1208 ,  G01J2003/2866

Abstract: A spectrometer assembly (10) comprises a light source (11) with a continuous spectrum, a pre-monochromator (2) for generating a spectrum with a relatively small linear dispersion from which a spectral portion is selectable, the spectral bandwidth of such spectral portion being smaller than or equal to the bandwidth of the free spectral range of such order in the echelle spectrum wherein the centre wavelength of the selected spectral interval is measurable with maximum blaze efficiency, an echelle spectrometer (4) with means for wavelength calibration, an entrance slit (21) at the pre-monochromator (2), an intermediate slit assembly (50) with an intermediate slit (3) and a spatially resolving light detector (5) in the exit plane of the spectrometer for the detection of wavelength spectra. The assembly is characterised in that the width of the intermediate slit (3) is larger than the monochromatic image of the entrance slit generated by the pre-monochromator at the location of the intermediate slit, and means for calibrating the pre-monochromator are provided, which are adapted to calibrate the light of the light source with a continuous spectrum on the detector to a reference position.

Abstract translation: 光谱仪组件（10）包括具有连续光谱的光源（11），用于产生光谱部分可选择的相对小的线性色散的光谱的预单色器（2），该光谱部分的光谱带宽 小于或等于梯级光谱中这种顺序的自由光谱范围的带宽，其中所选择的光谱间隔的中心波长可以用最大的火焰效率测量，具有用于波长校准的装置的梯形光谱仪（4），入口 在预分光器（2）处的狭缝（21），具有用于检测波长光谱的光谱仪的出射平面中的中间狭缝（3）和空间分辨光检测器（5）的中间狭缝组件（50）。 组件的特征在于，中间狭缝（3）的宽度大于由中间狭缝位置处的预单色仪产生的入口狭缝的单色图像，并且提供用于校准预单色仪的装置， 其适合于用检测器上的连续光谱校准光源的光到参考位置。

公开(公告)号：US06753959B2

公开(公告)日：2004-06-22

申请号：US09958448

申请日：2001-10-05

Applicant: Michael R. Hammer ,  Martin K. Masters ,  Stewart R. Campbell ,  Peter G. Layton

Inventor： Michael R. Hammer ,  Martin K. Masters ,  Stewart R. Campbell ,  Peter G. Layton

IPC: G01J328

CPC classification number: G01J5/62 ,  G01J3/02 ,  G01J3/0213 ,  G01J3/0227 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/1809 ,  G01J3/2803 ,  G01J2003/1828 ,  G01N21/27 ,  G01N21/31

Abstract: Spectroscopy apparatus for spectrochemical analysis of a sample having an excitation source (60) for providing spectral light (62) of the sample for analysis. The spectral light (62) is analysed via an optical system (64-66-68) that includes a polychromator (70, 74-80) and solid state multielement array detector (82). The elements (i.e. pixels) of the detector (82) are serially reel by means (84) to provide light intensity measurements as a function of wavelength. A problem is that the elements (pixels) of the detector (82) continue to accumulate change during the serial read-out. This is avoided by providing an optical shutter (72) for blocking the spectral light (62) whilst elements (pixels) of the detector (82) are being serially read. Shutter (72) has a piezoelectric actuator which is preferably a bimorph mounted as a cantilever. It is preferably located adjacent to the entrance aperture (70) of the polychromator. Bimorph structures for the actuator and drive and protective circuit arrangements are also disclosed.

Abstract translation: 具有用于提供用于分析的样品的光谱光（62）的激发源（60）的样品的光谱分析用光谱仪。 分光光（62）通过包括多色分光器（70,74-80）和固态多元件阵列检测器（82）的光学系统（64-66-68）进行分析。 检测器（82）的元件（即，像素）通过装置（84）串联卷绕以提供作为波长的函数的光强度测量。 问题在于，在串行读出期间，检测器（82）的元件（像素）继续积累变化。 这是通过提供用于阻挡分光光（62）的光学快门（72）而避免的，同时检测器（82）的元件（像素）被串行读取。 快门（72）具有压电致动器，其优选地是作为悬臂安装的双压电晶片。 它优选地位于多色调色板的入口孔（70）附近。 还公开了用于致动器和驱动器和保护电路装置的双压电晶片结构。

公开(公告)号：US20040114139A1

公开(公告)日：2004-06-17

申请号：US10416566

申请日：2003-10-03

Inventor： Stefan Florek ,  Michael Okruss ,  Helmut Becker-Ross

IPC: G01J003/28

CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/06 ,  G01J3/1809 ,  G01J3/28 ,  G01J2003/2866

Abstract: A method for the wavelength calibration of echelle spectra, in which the wavelengths are distributed across number of orders is characterised by the steps: recording of a line-rich reference spectrum with known wavelengths for a number of the lines, determination of the position of a number of peaks of the reference spectrum in the recorded spectrum, selection of at least two first lines of known order, position and wavelength, determination of a wavelength scale for the order in which the known lines lie, by means of a fit function nullm(x), determination of a provisional wavelength scale nullnullm 1(x) for at least one neighbouring order m 1, by means of addition/subtraction of a wavelength difference nullFSR which corresponds to a free spectral region, according to nullm 1 null(x)null0nullm(x)nullFSR with nullFSRnullnullm(x)/m, determination of the wavelengths of lines in said neighbouring order m 1, by means of the provisional wavelength scale null 1(x), replacement of the provisional wavelength of at least two lines by the reference wavelength for said lines as obtained in step (a) and repeat of steps (d) to (g) for at least one further neighbouring order.

Abstract translation: 用于波长校准的方案，其中波长分布在多个阶数上，其特征在于以下步骤：对多条线记录具有已知波长的线路丰富的参考频谱，确定一个 在记录光谱中参考光谱的峰数，已知顺序，位置和波长的至少两条第一行的选择，已知线所在的顺序的波长标度的确定，借助于拟合函数g x），临时波长标度的确定γ？m 1 （ 根据γ m 1 ？（x）= 0 gammam（x）gammaFSR with gammaFSR = gamma m（x）/ m，通过临时波长标度gamma 1（x）确定所述相邻次序m 1中的线的波长，将所述线的参考波长的至少两条线的临时波长的替换 如在步骤（a）中获得的并且对于至少一个更进一步的相邻顺序重复步骤（d）至（g）。

公开(公告)号：US06573989B2

公开(公告)日：2003-06-03

申请号：US09801001

申请日：2001-03-08

Applicant: Toru Suzuki ,  Osamu Wakabayashi

Inventor： Toru Suzuki ,  Osamu Wakabayashi

IPC: G01J328

CPC classification number: G01J3/1809 ,  G01J3/1838 ,  G01J3/22

Abstract: A spectrometer measures a spectrum of a light beam supplied from a light source so as to obtain fine information and coarse information of the spectrum easily. This spectrometer has a holographic grating, an Echelle grating, a rotation stage and a line sensor. In the case where a single pass beam is to be detected, a control processing unit controls the rotation stage so as to rotate the Echelle grating from the Littrow arrangement by a predetermined angle &dgr;1. On the other hand, in the case where a double pass beam is to be detected, the control processing unit controls the rotation stage so as to rotate the Echelle grating from the Littrow arrangement by a predetermined angle &dgr;2.

Abstract translation: 光谱仪测量从光源提供的光束的光谱，以便容易地获得光谱的精细信息和粗略信息。 该光谱仪具有全息光栅，Echelle光栅，旋转台和线传感器。 在要检测单程光束的情况下，控制处理单元控制旋转阶段，以使Echelle光栅从Littrow布置旋转预定角度δ1。 另一方面，在要检测双通光束的情况下，控制处理单元控制旋转台，以便将梯形光栅从Littrow布置旋转预定角度δ2。

公开(公告)号：US5719672A

公开(公告)日：1998-02-17

申请号：US721148

申请日：1996-09-26

Applicant: Ring-Ling Chien

Inventor： Ring-Ling Chien

IPC: G21K1/06 ,  G01J3/18 ,  G02B5/18 ,  G01J3/04

CPC classification number: G01J3/1809 ,  G01J3/189

Abstract: An improved echelle spectrometer comprises a slit in light blocking plate, an echelle grating, and a detector array. The slit is shaped and oriented to align an image of a light beam projected through the slit, onto the echelle grating and onto the detector in a desired orientation and shape relative to the detector array. Precise adjustment of the shape and orientation of the slit is dependent on the orientation of the detector with respect to the dispersion direction of the echelle grating. The echelle spectrometer provides high detector resolution with reduced read-out time.

Abstract translation: 改进的电子光谱仪包括遮光板中的狭缝，梯形光栅和检测器阵列。 狭缝被成形并定向成使得通过狭缝投射的光束的图像以相对于检测器阵列的期望的取向和形状对准到梯形光栅并且到达检测器上。 狭缝的形状和取向的精确调整取决于检测器相对于梯形光栅的色散方向的取向。 梯形光谱仪提供高检测器分辨率，减少读出时间。

公开(公告)号：US5018856A

公开(公告)日：1991-05-28

申请号：US428529

申请日：1989-10-30

Applicant: James M. Harnly ,  Gary P. Moulton ,  Thomas C. O'Haver

Inventor： James M. Harnly ,  Gary P. Moulton ,  Thomas C. O'Haver

IPC: G01J3/20 ,  G01J3/28 ,  G01J3/42 ,  G01N21/31 ,  G01N21/74

CPC classification number: G01J3/1809 ,  G01J3/20 ,  G01J3/42 ,  G01N21/3103 ,  G01J3/2803 ,  G01N21/74

Abstract: The instant invention relates to a process and apparatus for atomic absorption analysis, utilizing: atomization of a sample (containing one or more elements), illuminating the atomized sample with a continuum light source to produce a resultant light, directing the resultant light through a light dispersing means, detection of light at the focal plane of the light dispersing means using an integrating array detector (e.g. linear photodiode array) for converting the incident light into amplified electrical signals, blocking the incident light from striking the detector means and during this blocking utilizing the detector means to convert integrated intensities into amplified electrical signals, and deriving from these signals a value proportional to concentration. The present invention permits the aforementioned analysis to be performed at a very high rate i.e. at least 40 times per second.

Abstract translation: 本发明涉及用于原子吸收分析的方法和装置，其利用：样品的雾化（含有一种或多种元素），用连续光源照射雾化样品以产生所得光，将所得光引导通过光 分散装置，使用用于将入射光转换成放大的电信号的积分阵列检测器（例如线性光电二极管阵列）检测光分散装置的焦平面处的光，阻止入射光撞击检测器装置，并在该阻挡期间利用 检测器意味着将集成的强度转换成放大的电信号，并从这些信号中得出与浓度成比例的值。 本发明允许以非常高的速率进行上述分析，即每秒至少40次。

公开(公告)号：US4940325A

公开(公告)日：1990-07-10

申请号：US320674

申请日：1989-03-08

Applicant: Helmut Becker-Ross ,  Stefan Florek ,  Reinhard Tischendorf ,  Klaus-Eberhard Engel ,  Wolf-Ekkehard Matzke ,  Susanne Engel

Inventor： Helmut Becker-Ross ,  Stefan Florek ,  Reinhard Tischendorf ,  Klaus-Eberhard Engel ,  Wolf-Ekkehard Matzke ,  Susanne Engel

IPC: G01J3/18 ,  G01J3/28

CPC classification number: G01J3/1809 ,  G01J3/2803

Abstract: The invention refers to a device for investigating highly resolved partial spectra of an echelle spectrum, being applicable to the simultaneous determination of the intensities of different spectral elements of a radiation spectrum produced by an echelle spectrometer. The device consists of a position-resolving photoelectric detector including several photosensors arranged on an IC chip, where said photosensors are arranged on the chip surface discretely at the positions of preselected spectral lines, each of the photosensors consisting of a CCD sensor row and a logic circuit which, depending on activation levels, enables supply potentials and clock signals to be connected and output signals to be transferred to a common output signal line; the areas of the individual sensor elements of the CCD sensor rows being matched to the spectral elements of the echelle spectrum and extending successively in the direction of dispersion of the echelle grating; the total number of sensor elements of all CCD sensor rows on the chip being smaller than the number of spectral elements in the echelle spectrum; and a digital logic circuit enabling, by means of the activation levels managed by it, the serial readout of the signals from a selsotable subset of all CCD sensor rows in a selectable order of succession, via the common output signal line, depending on external control signals.

Abstract translation: 本发明涉及一种用于研究échelle光谱的高度分辨的部分光谱的装置，其适用于同时确定由échelle光谱仪产生的辐射光谱的不同光谱元素的强度。 该装置包括位置分辨光电检测器，其包括布置在IC芯片上的几个光电传感器，其中所述光电传感器分散地布置在芯片表面上的预选光谱线的位置处，每个光电传感器由CCD传感器行和逻辑 取决于激活电平使得电源电位和时钟信号被连接并且输出信号被传送到公共输出信号线的电路; CCD传感器行的各个传感器元件的区域与échelle光谱的光谱元件匹配并且沿着échelle光栅的色散方向连续延伸; 芯片上所有CCD传感器行的传感器元件的总数小于échelle光谱中的光谱元素的数量; 以及数字逻辑电路，通过其所管理的激活电平，可以根据外部控制通过公共输出信号线从所有CCD传感器行的可控子集以可选择的顺序读取信号 信号。

公开(公告)号：US4135820A

公开(公告)日：1979-01-23

申请号：US846509

申请日：1977-10-28

Applicant: Udo W. Drews ,  Norman Shifrin

Inventor： Udo W. Drews ,  Norman Shifrin

IPC: G01J3/08 ,  G01J3/18 ,  G01J3/42 ,  G02B27/14 ,  G01J3/02

CPC classification number: G02B27/147 ,  G01J3/42 ,  G02B27/1006 ,  G02B27/143 ,  G01J3/08 ,  G01J3/1809

Abstract: A pair of optical beams of radiant energy from separate paths in a spectrophotometer are coaxially merged into a single composite beam with an optical member which resembles a coarse echelette grating. A reflective surface which includes the surfaces of sidewalls within a plurality of parallel grooves is disposed on the optical member. The grooves are arranged in a lateral array and are generally V-shaped cross-sectionally. The beams to be combined are directed upon the sidewalls and the composite beam is emitted therefrom in accordance with the law of reflection. When the beams to be combined include non-collimated rays, shadowing is provided by the portion of the optical member between adjoining sidewalls of adjacent grooves to reduce flare. Furthermore, image aberrations as caused by off-axis operation due to use of a spherical mirror in the beam combining arrangement, are substantially corrected by the optical member.

Abstract translation: 在分光光度计中的来自分离路径的一对辐射能量的光束被同轴地合并成单个复合束，其具有类似于粗小行星光栅的光学构件。 包括在多个平行凹槽内的侧壁表面的反射表面设置在光学构件上。 凹槽布置成横向阵列，并且横截面通常为V形。 要组合的光束被引导到侧壁上，并且根据反射定律从其发射合成光束。 当待组合的光束包括非准直射线时，光学构件的部分在相邻凹槽的相邻侧壁之间提供阴影以减少耀斑。 此外，由于在光束组合装置中使用球面镜由离轴操作引起的图像像差被光学构件基本上校正。

公开(公告)号：US3658424A

公开(公告)日：1972-04-25

申请号：US3658424D

申请日：1971-01-14

Applicant: SPECTRA METRICS INC

Inventor： ELLIOTT WILLIAM G

IPC: G01J3/00 ,  G01J3/06 ,  G01J3/12 ,  G01J3/14 ,  G01J3/18 ,  G01J3/02

CPC classification number: G01J3/1809 ,  G01J3/06 ,  G01J3/14 ,  G01J2003/1204 ,  G01J2003/1828

Abstract: A method for focusing the horizontal and vertical components of energy reflected from an echelle grating which includes rotating the grating about a first axis substantially parallel to a prism face and rotating the grating about a second axis substantially normal to the first axis.

Abstract translation: 一种用于聚焦从电梯光栅反射的能量的水平和垂直分量的方法，该方法包括围绕基本上平行于棱镜面的第一轴旋转光栅，并围绕基本上垂直于第一轴线的第二轴旋转光栅。