摘要:
A dynamic random access memory device includes a memory plane including at least one first matrix of memory cells, a read/write amplifier connected to the end of each column of the matrix, and at least one pair of input/output lines associated with the matrix. The dynamic random access memory device also includes at least one cache memory stage connected to each amplifier and is disposed in the immediate vicinity of this amplifier. The cache memory stage includes a static random access memory cell connected between the read/write amplifier and the pair of input/output lines.
摘要:
A method and memory circuits for increasing the data bandwidth per microprocessor operation cycle is provided. The memory circuits provide the additional bandwidth without additional input/output (I/O) pins or requiring decreased cycle times. Multiple bits of data are passed through a single input/output pin with each operation cycle. The multiple bits of data are stored in or retrieved from multiple memory cells in each cycle. The I/O pins carry analog signals which represent multiple values of binary data This method of compressing data can be applied to any device that would benefit from the ability to transfer more data through a limited number of I/O pins.
摘要:
A system for storing data in read-only memory is disclosed that comprises bit level conductors, transistors, and sets of reference level conductors. Each reference level conductor has a reference value. A selected reference level conductor transmits a selected reference value to one of the transistors. The transistor transmits the selected reference value to a selected bit level conductor having a selected bit value. The bit level conductors, the transistors and the reference level conductors store data by encoding data as a combination comprising the selected bit value and the selected reference value. A method for storing data in read-only memory is disclosed. Bit level conductors having bit values, transistors, and sets of reference level conductors having reference values are provided. A selected bit value of a selected bit level conductor and a selected reference value of a selected reference level conductor are selected. Data is encoded by translating the data from a digital form to a combination comprising the selected bit value and the selected reference value. The data is stored by coupling the selected bit level conductor to the selected reference level conductor such that the selected reference level conductor can transmit the selected reference value to the selected bit level conductor.
摘要:
The sensing circuits comparing the current flowing in the cell with a plurality of reference currents are not identical to each other but differently amplify the compared currents. In particular, the sensing circuit associated with the lowest reference current amplifies the cell current more than the other sensing circuits and to the respective reference current. The current dynamics is thereby increased and it is possible to keep the reading voltage low, since the inherent characteristic of the lowest reference current may be very close to or directly superimposed on that of the immediately preceding memory cell current distribution, retaining the possibility of discriminating between the different logic levels.
摘要:
A memory device having a sense trigger coupled to receive an address when available, and to assert a sense trigger signal to the sense trigger when the sense trigger receives the address. The memory device also has an N-NARY, or 1-of-N, input logic gate that provides additional assurance that no more than one word line is asserted when an address is decoded. The memory device also has an N-NARY, or 1-of-N, output driver logic gate that provides an output signal directly useful for providing to another (N-NARY) 1-of-N logic gate.
摘要:
Architecture, circuitry and method are provided for a ternary content addressable memory (TCAM), and use thereof. Each TCAM cell is relatively small in size. If the TCAM cell is called upon to store voltage values indefinitely, provided power is retained on the cell, the TCAM cell employs no more than 16 transistors. Additional savings in size is achieved by using a single common conductor (or dual common conductors in a differential arrangement) to suffice as both the bit line and compare line. The common bit line and compare line connects to not only the X memory cell, but also the Y memory cell and the compare circuit of the TCAM cell. The compare circuit can either be activated or deactivated. During a compare operation, the compare circuit is selectively activated by placing a ground supply upon a match line enable conductor. The ground supply is imputed upon the match line whenever a mismatch occurs to designate that mismatch. Otherwise, during a normal read or write operation, the match line enable is placed at the same voltage value as the pre-charged match line.
摘要:
A sensing circuit for serial dichotomic sensing of multiple-level memory cells which can take one programming level among a plurality of m=2n (n>=2) different programming levels, comprises biasing means for biasing a memory cell to be sensed in a predetermined condition, so that the memory cell sinks a cell current with a value belonging to a plurality of m distinct cell current values, each cell current value corresponding to one of the programming levels, a current comparator for comparing the cell current with a reference current generated by a variable reference current generator, and a successive approximation register supplied with an output signal of the current comparator and controlling the variable reference current generator. The variable reference current generator comprises an offset current generator permanently coupled to the current comparator, and m−2 distinct current generators, independently activatable by the successive approximation register, each one generating a current equal to a respective one of the plurality of cell current values.