Abstract:
A flip flop circuit for a scan test comprises a first latch circuit for latching and outputting data signal D in synchronization with control signal CLK when control signal SC1 is set at one level and latching and outputting scan in data signal SIN in synchronization with control signal SC1 when control signal CLK is set at the other level, and a second latch circuit for latching and outputting an output of the first latch circuit in synchronization with control signal CLK when control signal SC2 is set at one level and latching and outputting an output of the first latch circuit in synchronization with control signal SC2 when control signal CLK is set at the other level. In this way, the area of the circuit is decreased by commonly using one latch circuit for a data signal and a scan in data signal. Also, the skew adjustment is not required during a scan test by operating with two-phase clocks during both scan shift operation and scan normal operation.
Abstract:
A communication circuit sends asynchronous digital signals in parallel to an external device. A first parity circuit in the communication circuit computes a first bit which indicates the parity of the control signals. This first bit is sent to the external device. When the digital signals and the parity bit are received by the external device, a first control signal is produced when each of the received digital signals has the same logic level for a defined period of time. A second parity circuit produces a second control signal when a parity error is found in the received digital signals. An error signal is generated in response to the presence of both the first and second control signals.
Abstract:
Techniques for displaying on a cathode ray tube a plurality of logic signals either from a single electronic circuit under test wherein the signals are acquired by a single probe, or in comparison to signals from a known good electronic circuit of the same type wherein compensation is provided to eliminate differences in the logic signals that are due to differences in the timing signal frequencies of the two circuits.
Abstract:
A control panel which provides an interface to a digital computer, and which comprises at least a data input device such as a keyboard and a data output device such as an alphanumeric display or a light emitting diode display, is tested without the use of the digital computer. The digital computer is disconnected or bypassed and the timing and other functions of the computer are simulated to enable an independent test of the data input device and the data output device which make up at least a part of the control panel.
Abstract:
An apparatus is associated with scanning apparatus for a number of peripheral input and output devices connected to a common input/output bus of a terminal system. The apparatus includes means for detecting a failure in any one of the peripheral devices by monitoring the condition of the terminal bus. Upon detecting the presence of a failed device on the bus, the apparatus then determines automatically whether the device is operating as an input or output device and thereafter selectively disables the failed device whereby the terminal system is placed in a state in which it can still continue system data transfer operations.
Abstract:
A process control computer scans test points arranged in groups to perform operations in accordance with changes in the states of the test points. The data store of the computer stores the states of the test points as words wherein each work represents a group of test points and the bits of the words represent the test points of the group. A flag resister of the data store comprises a group of bit cells with each bit cell being associated with one of the words. During the scan if the change of state of a test point changes, the associated bit in the data store is changed and the flange bit of the associated word is marked. Thereafter, the computer need only scan those words whose flag bits have been marked.
Abstract:
Apparatus and method for determining how a computer program is performing by sampling the operative conditions of a number of operating elements of a computer, such as the elements of the processing unit and the memory thereof. The information obtained from such sampling can be used to establish whether the program is ''''waiting,'''' ''''executing'''' or ''''actively computing.'''' Thus, a review of this information can be used to determine if the computer is being adequately utilized by the program and, if not, how it can be more efficiently utilized. The information is extracted randomly during the execution of the program following which the information is categorized and read out so as to be in an observable form.
Abstract:
An automatic testing instrument determines the operational status of an equipment under test on a real time basis by first generating from a stimulus memory a pattern for stimulating the equipment which, when stimulated by the pattern, sends out a response pattern, which is transmitted back to the automatic testing instrument. The testing instrument then takes the received response pattern and compares it with a pre-determined pattern stored in a comparator. If the response pattern differs from the expected pattern, an error signal is sent to indicate to the user of the testing instrument that the equipment under test is operating erroneously, for that particular pattern.
Abstract:
A computer based process control system includes a digital event counter input circuit wherein a number of data sources are scanned. A sensed status of the individual input point is compared with the previous status of that point to determine if a change of status has occurred, indicative of an event to be counted. The previous status is stored in a dedicated register. If the comparison indicates that a countable event has occurred, a counter is incremented; also the dedicated register is updated to indicate the present status of the scanned point. The counter status is stored in an accompanying memory which may then be read out by an external device such as a processor.
Abstract:
A dual data processing system comprising a first data processing unit having a first control unit and a first logic switching circuit; a second control unit having a second logic switching circuit; a pair of switch circuits coupled to the first and second logic switching circuits, respectively; adapter buffers to be coupled selectively to the first and second control units according to the operation of the switch circuits; a first power source for supplying electric power to the first control unit and the adapter buffers coupled thereto; and a second power source for supplying electric power to the second control unit and the adapter buffers coupled thereto. The switch circuits are operated to connect the adapter buffers selectively to the first and second control units so that load balance is kept between the first and second control units.