REDUCED FALSE POSITIVE IDENTIFICATION FOR SPECTROSCOPIC QUANTIFICATION

    公开(公告)号:US20190234866A1

    公开(公告)日:2019-08-01

    申请号:US16034901

    申请日:2018-07-13

    发明人: Changmeng HSIUNG

    IPC分类号: G01N21/25 G01N21/27

    摘要: A device may receive information identifying results of a spectroscopic measurement performed on an unknown sample. The device may determine a decision boundary for a quantification model based on a configurable parameter, such that a first plurality of training set samples of the quantification model is within the decision boundary and a second plurality of training set samples of the quantification model is not within the decision boundary. The device may determine a distance metric for the spectroscopic measurement performed on the unknown sample relative to the decision boundary. The device may determine a plurality of distance metrics for the second plurality of training set samples of the quantification model relative to the decision boundary. The device may provide information indicating whether the spectroscopic measurement performed on the unknown sample corresponds to the quantification model.

    ABNORMALITY WARNING METHOD AND ABNORMALITY WARNING SYSTEM

    公开(公告)号:US20190210387A1

    公开(公告)日:2019-07-11

    申请号:US16243707

    申请日:2019-01-09

    IPC分类号: B41J29/46 G08B21/18

    摘要: A method for warning an abnormality of a target object by using a self-organizing map prescribed by a plurality of nodes indicating a normal state of the target object includes acquiring detection data indicating a state of the target object, performing learning of the self-organizing map by using the detection data indicating a distance between a feature value and a node smaller than an abnormality threshold value predefined, storing the detection data indicating the distance larger than the abnormality threshold value in a storage unit as recorded data, and performing notification of the abnormality of the target object when the number of pieces of the recorded data stored in the storage unit reaches a predetermined number.

    ABNORMAL WAVEFORM SENSING SYSTEM, ABNORMAL WAVEFORM SENSING METHOD, AND WAVEFORM ANALYSIS DEVICE

    公开(公告)号:US20180260656A1

    公开(公告)日:2018-09-13

    申请号:US15903116

    申请日:2018-02-23

    申请人: HITACHI, LTD.

    IPC分类号: G06K9/62 G06F5/01 G06F17/18

    摘要: The present invention includes acquiring an event point which is part of a reference waveform and which satisfies a predetermined condition, and extracting a singular point being part of the reference waveform in a period to which the acquired event point belongs, and has a value that indicates predetermined change, acquiring, when part of a target waveform corresponds to the event point, the part as a correspondence event point, and detecting a correspondence singular point in the period of the target waveform to which the correspondence event point belongs and corresponding to the singular point of the reference waveform, calculating a dissimilarity degree between a correction waveform generated based on the above four points and the reference waveform and the target waveform newly acquired, determining whether the target waveform has abnormality based on the dissimilarity degree, and outputting abnormality information.