公开(公告)号：US4520267A

公开(公告)日：1985-05-28

申请号：US301196

申请日：1981-09-11

申请人： Heikki Sipila ,  Erkki Kiuru ,  Seppo Vaijarvi

发明人： Heikki Sipila ,  Erkki Kiuru ,  Seppo Vaijarvi

IPC分类号： B07C5/34 ,  G01N23/22 ,  G01N23/00

CPC分类号： G01N23/22 ,  G01N2223/05 ,  G01N2223/063 ,  G01N2223/071 ,  G01N2223/084 ,  G01N2223/206 ,  G01N2223/505

摘要： Disclosed is a method and an apparatus for analyzing pieces of ore for the purpose of sorting. Each piece falling by the analyzer is irradiated individually by means of two gamma radiation sources operating at different energy levels so selected that, as to the scattering effect, at one level the Compton effect is predominant and at the other level the Compton effect and the photoelectric effect compete with each other. The former effect is strongly dependent on the ordinal number of the element and, thus, by detecting with at least one detector the scattering intensities produced with the said two sources of radiation and comparing the scattering intensities with each other, the proportion of heavy elements in the ore piece can be determined and the ore piece can be classified on the basis thereof. For example, one energy dispersively operating scintillation detector can be used for detecting the scattered radiation.

摘要翻译： 公开了一种用于分选矿石块的方法和装置。 由分析仪落下的每个片段通过以不同能级操作的两个伽马辐射源单独照射，所选择的散射效应在一个级别上，康普顿效应是主要的，而在另一个级别，康普顿效应和光电 效果相互竞争。 前者的作用很大程度上取决于元素的序数，因此通过用至少一个检测器检测所述两个辐射源产生的散射强度，并将散射强度彼此比较，重元素的比例 可以确定矿石块，并且可以基于其分类矿石块。 例如，可以使用一种能量分散操作的闪烁检测器来检测散射辐射。

公开(公告)号：US20170299734A1

公开(公告)日：2017-10-19

申请号：US15515639

申请日：2015-09-30

申请人： Rayence Co., Ltd. ,  VATECH EWOO Holdings Co., Ltd.

发明人： Dong-Jin LEE ,  Tae-Woo KIM ,  Yu-Sung JEON

IPC分类号： G01T1/24

CPC分类号： G01T1/241 ,  G01N23/227 ,  G01N2223/084 ,  G01N2223/50 ,  G01T1/24 ,  H01L27/14 ,  H01L31/02019 ,  H01L31/115 ,  H04N5/32

摘要： Disclosed is an x-ray detector includes a first electrode formed on a substrate, a photoconductive layer formed on the first electrode, a second electrode formed on the photoconductive layer and configured to be in a voltage applied state with a bias voltage or a floating state, and a power supply circuit configured to control an output of the bias voltage to be on/off.

公开(公告)号：US3567928A

公开(公告)日：1971-03-02

申请号：US3567928D

申请日：1969-06-12

申请人： DU PONT

发明人： DAVIES ROBERT D ,  HERGLOTZ HERIBERT K

IPC分类号： G01N23/22 ,  G01N23/223 ,  H01J35/02 ,  H01J35/04

CPC分类号： G01N23/223 ,  G01N23/22 ,  G01N2223/072 ,  G01N2223/076 ,  G01N2223/084 ,  G01N2223/204 ,  H01J35/02 ,  H01J35/04

摘要： A fluorescent analytical radiation source concurrently producing fluorescent soft X-ray and secondary electron emissions with high efficiency provided with means for selective energy cut off of the secondary electrons in order to isolate secondary electron emission characteristic of specific elements under analysis.

公开(公告)号：US20230168213A1

公开(公告)日：2023-06-01

申请号：US17719623

申请日：2022-04-13

申请人： National Institute of Meteorological Sciences

发明人： Young Suk OH ,  Su Ryon SHIN ,  Hyun Young JUNG ,  Sang Won JOO ,  Hae Young LEE ,  Chang Kee LEE ,  Yeon Hee KIM ,  Chu Yong CHUNG

IPC分类号： G01N23/227 ,  G01N33/00

CPC分类号： G01N23/227 ,  G01N33/0036 ,  G01N2223/084 ,  G01N2223/638

摘要： This application relates to an optical sensor element. In one aspect, the optical sensor element includes a graphite column including one or more graphite rods. The optical sensor element may also include one or more first graphene layers partly or entirely covering each of both ends of the graphite column. The optical sensor element may further include one or more second graphene layers partly or entirely covering the outer circumferential surface of the graphite column. This application also relates to an optical sensor for measuring the concentration of a greenhouse gas and the optical sensor includes the optical sensor element.

公开(公告)号：US4255656A

公开(公告)日：1981-03-10

申请号：US42439

申请日：1979-05-25

申请人： Andrew Barrie ,  Quentin C. Herd

发明人： Andrew Barrie ,  Quentin C. Herd

IPC分类号： G01Q30/02 ,  G01N23/22 ,  G01Q30/04 ,  H01J39/00

CPC分类号： G01N23/22 ,  G01N2223/084 ,  G01N2223/085 ,  G01N2223/316 ,  G01N2223/323

摘要： Charged-particle spectroscopy apparatus for the chemical analysis of a sample in which an apertured plate receives charged particles emitted from the sample and transmits them to an analyzer for analyzing the energies of the particles, the aperture of the plate being such as to restrict the particles passing therethrough to a pencil beam of particles from a selected area of the sample.

摘要翻译： 用于对样品进行化学分析的带电粒子光谱仪器，其中孔板接收从样品发射的带电粒子并将其传输到用于分析颗粒能量的分析仪，板的孔径限制粒子 从样品的选定区域穿过其中的铅笔束。