公开(公告)号：US20240167967A1

公开(公告)日：2024-05-23

申请号：US18512598

申请日：2023-11-17

申请人： Woorien Co., Ltd. ,  VATECH EWOO Holdings Co., Ltd.

发明人： Taehee HAN ,  In CHOI

IPC分类号： G01N23/046

CPC分类号： G01N23/046 ,  G01N2223/1016 ,  G01N2223/316 ,  G01N2223/3303

摘要： An X-ray imaging apparatus is proposed. The proposed X-ray imaging apparatus is configured to include an imaging part including a generator part including the X-ray generator for emitting X-rays to an imaging target area and a sensor part including the X-ray sensor for receiving the X-rays transmitted through the imaging target area, a first driving part for rotating the generator part and sensor part about a rotation axis therebetween, and a second driving part for moving the X-ray sensor in a direction of rotation about the rotation axis with respect to the sensor part or a direction tangential to the rotation, wherein, during X-ray imaging, the first driving part rotates the imaging part reciprocally between first and second positions, and the second driving part moves the X-ray sensor either from the first position or from the second position.

公开(公告)号：US20230314346A1

公开(公告)日：2023-10-05

申请号：US18023967

申请日：2021-09-02

申请人： FORCE Technology

发明人： Finn Falentin Olesen ,  Torben Haugaard Jensen ,  Jan Sletsgaard

IPC分类号： G01N23/18 ,  G01N23/083

CPC分类号： G01N23/18 ,  G01N23/083 ,  G01N2223/643 ,  G01N2223/316

摘要： A device adapted for examining and detecting foreign objects in a flat plate-shaped material comprises a transport device for transporting a flat plate-shaped material to be examined through the device in a transport direction. The device comprising a first X-ray source and a second X-ray source adapted for, in operation, emitting a first X-ray beam and a second X-ray beam. The device comprising a first sensor unit and a second sensor unit arranged to detect the first and second X-ray beam. The first and second sensor unit being adapted for detecting data indicative of the presence and the indirect or direct position in the transport direction of a foreign object in a flat plate-shaped material. The first and second sensor unit comprise or are connected to a data processing unit adapted for processing the detected data to determine the presence of a foreign object in the flat plate-shaped material.

公开(公告)号：US11774380B1

公开(公告)日：2023-10-03

申请号：US18107026

申请日：2023-02-08

申请人： SICHUAN UNIVERSITY

发明人： Yuanjun Xu ,  Ze He ,  Peng Wang ,  Ning Huang ,  Zhu An

IPC分类号： G01N23/20008 ,  G01N23/207 ,  G01N23/2206 ,  G01N23/223

CPC分类号： G01N23/2206 ,  G01N23/207 ,  G01N23/20008 ,  G01N23/223 ,  G01N2223/045 ,  G01N2223/056 ,  G01N2223/076 ,  G01N2223/1016 ,  G01N2223/301 ,  G01N2223/306 ,  G01N2223/316 ,  G01N2223/321 ,  G01N2223/323 ,  G01N2223/3303 ,  G01N2223/402 ,  G01N2223/605

摘要： A diffraction analysis device and a method for a full-field X-ray fluorescence imaging analysis are disclosed. The device includes a switching assembly, collimation assemblies, an X-ray source, an X-ray detector, a laser indicator, and a computer control system. The switching assembly combines with the collimation assemblies to achieve a functional effect that is previously achieved by two different types of devices through only one device by changing the positioning layout of the X-ray source and the X-ray detector. The full-field X-ray fluorescence imaging analysis can be realized, and the crystal phase composition information and the element distribution imaging information of the sample can be quickly obtained through the same device without scanning, which not only greatly improves the utilization rate of each assembly in the device, reduces the assemblies cost of the device, makes the device structure more compact, but also greatly improves the analysis efficiency and detection accuracy.

公开(公告)号：US11740189B2

公开(公告)日：2023-08-29

申请号：US16932939

申请日：2020-07-20

申请人： ROLLS-ROYCE plc

发明人： Jacqueline Griffiths ,  Scott Dufferwiel ,  Jonathan Eyre

IPC分类号： G01N23/20

CPC分类号： G01N23/20 ,  G01N2223/316

摘要： A method of defining at least one scan parameter for an x-ray scan of a single crystal structure, the method comprising: determining a target orientation of the structure for the scan; and defining different non-zero levels of x-ray exposure for different parts of a scan area based on either or both of the target orientation and characteristics of the structure; and, defining the scan area so that substantially all x-rays of the scan are directed to the structure in the target orientation.

公开(公告)号：US11644431B2

公开(公告)日：2023-05-09

申请号：US17268922

申请日：2019-08-15

申请人： MICROTRACE PTY LIMITED

发明人： Gregory John Roach

IPC分类号： G01N23/223 ,  G01N33/24

CPC分类号： G01N23/223 ,  G01N33/24 ,  G01N2223/076 ,  G01N2223/313 ,  G01N2223/316 ,  G01N2223/317 ,  G01N2223/507 ,  G01N2223/616

摘要： Disclosed is a measurement probe for a measurement of elements in a mineral slurry. The measurement probe includes a housing having an X-ray window. The housing encloses: an X ray source positioned to emit source X-rays at the X-ray window; an X-ray detector positioned to detect X-rays from the X-ray window; and a control module. The control module is configured to: control an operation of the X-ray source and the X-ray detector; process X-rays detected by the X-ray detector to generate X-ray spectra data; and process the X-ray spectra data to determine a quantity of one or more elements of interest in the mineral slurry. The measurement probe further includes a probe mount adapted to couple the measurement probe to a pipe mount on a pipe carrying the mineral slurry; when the probe mount is coupled to the pipe mount, the X-ray window provides a transmission window for X-rays into a lumen of the pipe.

公开(公告)号：US20180292333A1

公开(公告)日：2018-10-11

申请号：US15578131

申请日：2016-05-19

申请人： Nuctech Company Limited ,  Nuctech Jiangsu Company Limited

发明人： Zhiqiang Chen ,  Wanlong Wu ,  Ziran Zhao ,  Guangwei Ding ,  Ming Ruan ,  Xilei Luo

IPC分类号： G01N23/083

CPC分类号： G01N23/083 ,  G01N23/02 ,  G01N2223/316 ,  G21K1/025

摘要： Embodiments of the present disclosure provide a collimating device and a ray inspection device. The collimating device comprises: a beam guiding cylinder, a first collimator mounted at an inlet end of the beam guiding cylinder; a second collimator mounted an outlet end of the beam guiding cylinder; a beam guiding cylinder adjusting device disposed adjacent to the inlet of the beam guiding cylinder to adjust a direction of the beam guiding cylinder such that the first collimator is aligned with the first direction. The outlet end of the beam guiding cylinder is fixed to the frame and the second collimator is aligned with an object to be irradiated by a radiation beam, and the beam guiding cylinder is configured to have flexibility to allow the adjusting device to adjust a direction towards which the inlet end of the beam guiding cylinder is directed, in a direction transverse to the first direction.

公开(公告)号：US20180238818A1

公开(公告)日：2018-08-23

申请号：US15888823

申请日：2018-02-05

申请人： KOBELCO RESEARCH INSTITUTE, INC.

发明人： Kenichi INOUE ,  Hiroyasu YAMASAKI ,  Masayuki INABA

IPC分类号： G01N23/207 ,  G21K1/02

CPC分类号： G01N23/2076 ,  G01N23/20008 ,  G01N2223/056 ,  G01N2223/316 ,  G21K1/02 ,  G21K1/06 ,  G21K2201/062

摘要： An inspection apparatus 20 is for an inspection of a target region 13 including a part of a subsurface portion 12 of a sample 10 having an approximately circular cross section. The inspection apparatus 20 includes an X-ray source 40 that emits X-rays, a crystal plate 70 being a single crystal, and a detector 80. The crystal plate 70 is disposed to reflect and diffract X-rays (refractive X-rays X5) having been emitted by the X-ray source 40 and refracted in the target region 13. The crystal plate 70 is disposed to allow X-rays (rectilinear X-rays X3) having been emitted by the X-ray source 40 and entering the crystal plate 70 without having been incident on the sample 10 to transmit through the crystal plate 70. The detector 80 detects an intensity of the X-rays (reflected and diffracted X-rays X7) reflected and diffracted by the crystal plate 70.

公开(公告)号：US20170184518A1

公开(公告)日：2017-06-29

申请号：US15389819

申请日：2016-12-23

申请人： Commissariat a L'Energie Atomique et aux Energies Aternatives

发明人： Damien BARBES ,  Caroline PAULUS ,  Joachim TABARY

IPC分类号： G01N23/207 ,  G01N23/20

CPC分类号： G01N23/2076 ,  G01N23/20025 ,  G01N23/20091 ,  G01N2223/316

摘要： The invention is a method for analysing an object by x-ray diffraction spectroscopy, in which a spectroscopic detector comprising a plurality of adjacent pixels is placed facing an object irradiated by an x-ray beam. Each pixel is able to acquire an energy spectrum of radiation elastically scattered by the object, the radiation propagating in a direction making an acute angle to the propagation direction of the collimated beam. The method allows, on the basis of each measured spectrum, a nature of the materials composing various portions of the object to be determined.

公开(公告)号：US20170176351A1

公开(公告)日：2017-06-22

申请号：US15257595

申请日：2016-09-06

申请人： Tsinghua University ,  Nuctech Company Limited

发明人： Zhiqiang CHEN ,  Li ZHANG ,  Tianyi YANG DAI ,  Ji ZHAO ,  Xin JIN ,  Ming CHANG

IPC分类号： G01N23/04 ,  G01N23/20 ,  G21K1/02

CPC分类号： G01N23/046 ,  G01N23/20 ,  G01N23/20083 ,  G01N2223/056 ,  G01N2223/316 ,  G01N2223/419 ,  G01N2223/637 ,  G01V5/0016 ,  G01V5/005 ,  G21K1/02

摘要： Systems and methods for liquid detection are disclosed. An illustrative method for liquid detection herein may include implementing CT imaging and XRD imaging on one or more liquid planes of liquid contained in a container at once by rotating the container so that X-rays from a same radiation source scan a whole area of each of the one or more liquid planes, and generating a substance identification result for the liquid contained in the container based on a CT image and a XRD image, wherein the CT imaging and the XRD imaging are implemented on a same liquid plane or different liquid planes. Consistent with various aspects and features, implementations may identify substances contained in the liquid more quickly and accurately.

公开(公告)号：US09551676B2

公开(公告)日：2017-01-24

申请号：US14527543

申请日：2014-10-29

申请人： University of Rochester

发明人： Frederic J. Mis

IPC分类号： G01N23/20 ,  G21K1/02

CPC分类号： G01N23/20091 ,  G01N23/06 ,  G01N2223/3035 ,  G01N2223/316 ,  G01N2223/628 ,  G21K1/02

摘要： There is provided a System and Method For Determining The Radiological Composition of Material Layers Within a Conduit. The system and method disclosed is equally applicable to pipes, vessels, and conduits as well as medical applications such as determining vessel thickness, occlusion, scarring, or the like in humans and animals. A phantom setup is disclosed that has a phantom containing a test standard such as a reactor water test standard, removable plates, a collimator and probe with a spectrometer display. The phantom setup provides a baseline data set that can be used in conjunction with field measurements to determine the composition of materials within the conduit, such as corrosion or the like. The baseline data set may be semi-logarithmic and contains spectrometer readings of various plate thicknesses or quantities of plates.

摘要翻译： 提供了一种用于确定管道内材料层的放射组成的系统和方法。 所公开的系统和方法同样适用于管，血管和管道以及医疗应用，例如确定人和动物中的血管厚度，闭塞，瘢痕形成等。 公开了一种幻影装置，其具有包含测试标准的体模，例如反应器水测试标准，可移除板，准直仪和具有光谱仪显示器的探针。 幻影设置提供了可以与现场测量一起使用的基线数据集，以确定导管内的材料的组成，例如腐蚀等。 基线数据集可以是半对数的，并且包含各种板厚度或板数的光谱仪读数。