公开(公告)号：US11740189B2

公开(公告)日：2023-08-29

申请号：US16932939

申请日：2020-07-20

申请人： ROLLS-ROYCE plc

发明人： Jacqueline Griffiths ,  Scott Dufferwiel ,  Jonathan Eyre

IPC分类号： G01N23/20

CPC分类号： G01N23/20 ,  G01N2223/316

摘要： A method of defining at least one scan parameter for an x-ray scan of a single crystal structure, the method comprising: determining a target orientation of the structure for the scan; and defining different non-zero levels of x-ray exposure for different parts of a scan area based on either or both of the target orientation and characteristics of the structure; and, defining the scan area so that substantially all x-rays of the scan are directed to the structure in the target orientation.

公开(公告)号：US11099143B2

公开(公告)日：2021-08-24

申请号：US16741926

申请日：2020-01-14

申请人： ROLLS-ROYCE plc

发明人： Jacqueline Griffiths ,  Scott Dufferwiel ,  Narcisa C Pinzariu ,  Carlos Eduardo Mesquita Frias

IPC分类号： G01N23/2055 ,  G01N23/205 ,  G01N23/20008 ,  G01N23/207 ,  G01N29/06

摘要： A method of detecting an anomaly in a crystallographic structure, the method comprising: illuminating the structure with x-ray radiation in a known direction relative to the crystallographic orientation; positioning the structure such that its crystallographic orientation is known; detecting a pattern of the diffracted x-ray radiation transmitted through the structure; generating the simulated pattern based on the known direction relative to the crystallographic orientation; comparing the detected pattern to a simulated pattern for x-ray radiation illuminating in the known direction; and, detecting the anomaly in the crystallographic structure based on the comparison.