WAVEFRONT ANALYSER
    2.
    发明申请
    WAVEFRONT ANALYSER 审中-公开
    WAVEFRONT分析仪

    公开(公告)号:US20160135680A1

    公开(公告)日:2016-05-19

    申请号:US14899563

    申请日:2014-06-20

    Applicant: Cylite Pty Ltd

    Abstract: Interferometry-based methods and apparatus are presented for analysing one or more wavefronts from a sample, in which the sample wavefronts are interfered with two or more reference wavefronts to produce two or more interferograms in a sufficiently short time period for the interferograms to be captured in a single exposure of an image capture device such as a CCD array. Each interferogram has a unique carrier frequency dependent on the angle between a respective pair of sample and reference wavefronts. In certain embodiments multiple sample and/or reference wavefronts are generated using scanning mirrors, while in other embodiments utilising multi-wavelength beams multiple sample and/or reference wavefronts are generated with wavelength dispersive elements. The methods and apparatus are suitable for measuring aberrations at one or more positions on the retina of an eye.

    Abstract translation: 介绍基于干涉测量的方法和装置,用于分析来自样本的一个或多个波前,其中样本波前被干扰两个或更多个参考波前,以在足够短的时间周期内产生两个或更多个干涉图,以便将干涉图捕获在 诸如CCD阵列的图像捕获装置的单次曝光。 每个干涉图具有取决于相应的一对样本和参考波前之间的角度的唯一载波频率。 在某些实施例中,使用扫描反射镜产生多个采样和/或参考波阵面,而在其他实施例中利用多波长光束,使用波长色散元件产生多个采样和/或参考波前。 所述方法和装置适于测量眼睛视网膜上的一个或多个位置处的像差。

    Apparatus and method for laser beam diagnosis
    4.
    发明授权
    Apparatus and method for laser beam diagnosis 失效
    用于激光束诊断的装置和方法

    公开(公告)号:US5042950A

    公开(公告)日:1991-08-27

    申请号:US526757

    申请日:1990-05-22

    CPC classification number: G01J9/0215 G01J1/4257 G01J2009/0238

    Abstract: An apparatus and method is disclosed for accurate, real time monitoring of the wavefront curvature of a coherent laser beam. Knowing the curvature, it can be quickly determined whether the laser beam is collimated, or focusing (converging), or de-focusing (diverging). The apparatus includes a lateral interferometer for forming an interference pattern of the laser beam to be diagnosed. The interference pattern is imaged to a spatial light modulator (SLM), whose output is a coherent laser beam having an image of the interference pattern impressed on it. The SLM output is focused to obtain the far-field diffraction pattern. A video camera, such as CCD, monitors the far-field diffraction pattern, and provides an electrical output indicative of the shape of the far-field pattern. Specifically, the far-field pattern comprises a central lobe and side lobes, whose relative positions are indicative of the radius of curvature of the beam. The video camera's electrical output may be provided to a computer which analyzes the data to determine the wavefront curvature of the laser beam.

    Abstract translation: 公开了一种用于精确实时监测相干激光束的波前曲率的装置和方法。 知道曲率,可以快速确定激光束是准直的,还是聚焦(会聚)或去聚焦(发散)。 该装置包括用于形成待诊断的激光束的干涉图案的横向干涉仪。 干涉图案被成像到空间光调制器(SLM),其空间光调制器(SLM)的输出是具有印在其上的干涉图案的相干激光束。 SLM输出集中在获得远场衍射图。 诸如CCD的摄像机监视远场衍射图案,并且提供指示远场图案的形状的电输出。 具体地,远场图案包括中心凸角和旁瓣,其相对位置指示梁的曲率半径。 摄像机的电输出可以被提供给分析数据以确定激光束的波前曲率的计算机。

    METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND DEVICE
    5.
    发明申请
    METHOD AND DEVICE FOR MEASURING WAVEFRONT, AND EXPOSURE METHOD AND DEVICE 审中-公开
    用于测量波形的方法和装置,以及曝光方法和装置

    公开(公告)号:US20150160073A1

    公开(公告)日:2015-06-11

    申请号:US14401860

    申请日:2013-05-29

    Abstract: There is provided a wavefront measuring method for obtaining wavefront information of an optical system. The method including: irradiating the optical system with a light beam; allowing the light beam passed via the optical system to come into a diffraction grating having periodicity in a first direction; and obtaining the wavefront information based on an interference fringe formed by light beams generated from the diffraction grating. The diffraction grating including: first portions which allow light to pass therethrough; and second portions which shield light, each of the second portions being provided between two of the first portions. A ratio between a width of one of the first portions in the first direction and a width of one of the second portions in the first direction is changed in the first direction, the one of the first portions and the one of the second portions being adjacent to each other.

    Abstract translation: 提供了一种用于获得光学系统的波前信息的波前测量方法。 该方法包括:用光束照射光学系统; 允许经由光学系统通过的光束进入具有在第一方向上的周期性的衍射光栅; 并且基于由衍射光栅产生的光束形成的干涉条纹获得波前信息。 衍射光栅包括:允许光通过的第一部分; 以及第二部分,其屏蔽光,每个第二部分设置在两个第一部分之间。 第一方向上的第一部分中的一个的宽度与第一方向上的第二部分之一的宽度在第一方向上变化,第一部分中的一个和第二部分中的一个相邻 对彼此。

    Device And Method For Characterizing A Light Beam
    6.
    发明申请
    Device And Method For Characterizing A Light Beam 有权
    用于表征光束的装置和方法

    公开(公告)号:US20140098367A1

    公开(公告)日:2014-04-10

    申请号:US14124781

    申请日:2012-06-08

    Applicant: Fabien Quere

    Inventor: Fabien Quere

    CPC classification number: G01J3/45 G01J9/02 G01J11/00 G01J2009/0238

    Abstract: Method of characterizing a light beam (FL) comprising the steps consisting in: a) disposing the input ends (EE1-EE11) of N>3 optical fibres (F01-F011) on the path of said light beam, in such a way that a respective portion of said beam is coupled and propagates in each optical fibre and is emitted from its output end (ES1-ES11) so as to form a respective secondary beam; b) introducing an angular spectral dispersion into said secondary beams by means of at least one dispersive element (RD); c) propagating the dispersed secondary beams in such a way that they overlap to form an interferogram; d) acquiring an image of said interferogram; and e) extracting from said image of said interferogram an item of information relating to the spatial variation of the phase of said light beam at a plurality of wavelengths. Device for the implementation of such a method.

    Abstract translation: 表征光束(FL)的方法包括以下步骤:a)将N> 3根光纤(F01-F011)的输入端(EE1-EE11)设置在所述光束的路径上,使得 所述光束的相应部分被耦合并在每个光纤中传播并从其输出端(ES1-ES11)发射,以便形成相应的次光束; b)通过至少一个色散元件(RD)将角光谱色散引入所述次光束; c)以这样的方式传播分散的次级束,使得它们重叠以形成干涉图; d)获取所述干涉图的图像; 以及e)从所述干涉图的所述图像中提取与多个波长的所述光束的相位的空间变化有关的信息的项目。 设备实现这种方法。

    Device and method for characterizing a light beam
    10.
    发明授权
    Device and method for characterizing a light beam 有权
    用于表征光束的装置和方法

    公开(公告)号:US09243957B2

    公开(公告)日:2016-01-26

    申请号:US14124781

    申请日:2012-06-08

    Applicant: Fabien Quere

    Inventor: Fabien Quere

    CPC classification number: G01J3/45 G01J9/02 G01J11/00 G01J2009/0238

    Abstract: Method of characterizing a light beam having the steps of: a) disposing the input ends of N >3 optical fibers on the path of the light beam, in such a way that a respective portion of the beam is coupled and propagates in each optical fiber and is emitted from its output end so as to form a respective secondary beam; b) introducing an angular spectral dispersion into the secondary beams by means of at least one dispersive element; c) propagating the dispersed secondary beams in such a way that they overlap to form an interferogram; d) acquiring an image of the interferogram; and e) extracting from the image of the interferogram an item of information relating to the spatial variation of the phase of the light beam at a plurality of wavelengths. Device for the implementation of such a method.

    Abstract translation: 表征光束的方法,具有以下步骤:a)将N> 3根光纤的输入端设置在光束的路径上,使得光束的相应部分耦合并在每条光纤中传播 并从其输出端发射以形成相应的次光束; b)借助于至少一个色散元件将角分光谱色散引入次光束; c)以这样的方式传播分散的次级束,使得它们重叠以形成干涉图; d)获取干涉图的图像; 以及e)从干涉图像的图像中提取与多个波长的光束的相位的空间变化有关的信息的项目。 设备实现这种方法。

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