知搜-全球专利检索

  1. Login
  2. Sign Up

Search Results

11 records (took 0.023 seconds)

    Method and structure for variable pitch microwave probe assembly
    4.
    发明申请
    Method and structure for variable pitch microwave probe assembly 有权
    可变节距微波探头组件的方法和结构

    公开(公告)号：US20050231187A1

    公开(公告)日：2005-10-20

    申请号：US10827230

    申请日：2004-04-20

    Applicant: Young Kwark

    Inventor： Young Kwark

    IPC: G01R1/067 ,  G01R31/02

    CPC classification number: G01R1/06772 ,  Y10T29/49002

    Abstract: A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center contact point and the at least one peripheral contact point is adjustable.

    Abstract translation: 共面波导（CPW）探针包括至少一个中心探针元件，每个中心探针元件具有相应的中心探针接触点和至少一个外围探针元件，每个具有相应的外围接触点。 所述至少一个中心接触点和所述至少一个外围接触点之间的间距是可调节的。

    Contactless circuit testing for adaptive wafer processing
    5.
    发明申请
    Contactless circuit testing for adaptive wafer processing 失效
    用于自适应晶片处理的非接触电路测试

    公开(公告)号：US20050168234A1

    公开(公告)日：2005-08-04

    申请号：US10769115

    申请日：2004-01-30

    Applicant: Young Kwark

    Inventor： Young Kwark

    IPC: G01R31/28 ,  G01R31/311 ,  G01R31/26

    CPC classification number: G01R31/2884 ,  G01R31/311

    Abstract: A system and method for measuring circuits on an integrated circuit substrate includes a measurement circuit formed on the integrated circuit substrate that measures at least one characteristic of an integrated circuit. The measurement circuit has a power transfer device including a power transfer component, which receives energy from a source where the source does not make physical contact with the integrated circuit substrate to transfer power to the measurement circuit. Measurements are taken to provide feedback for in-situ adjustments to circuit parameters and responses.

    Abstract translation: 用于测量集成电路基板上的电路的系统和方法包括：测量电路，其形成在集成电路基板上，其测量集成电路的至少一个特性。 该测量电路具有功率传递装置，该功率传输装置包括功率传输部件，该功率传输部件从源极接收来自与源极不与集成电路基板物理接触的能量以将功率传递到测量电路。 进行测量以提供对电路参数和响应的原位调整的反馈。

    Testing of transimpedance amplifiers
    6.
    发明申请
    Testing of transimpedance amplifiers 有权
    跨阻放大器测试

    公开(公告)号：US20050129414A1

    公开(公告)日：2005-06-16

    申请号：US10736424

    申请日：2003-12-15

    Applicant: John Guckenberger ,  Young Kwark ,  Jeremy Schaub

    Inventor： John Guckenberger ,  Young Kwark ,  Jeremy Schaub

    IPC: H04B10/06 ,  H04B10/12 ,  H04B10/158

    CPC classification number: H04B10/25

    Abstract: Testing is performed on an amplifier wafer housing a transimpedance amplifier prior to packaging the transimpedance amplifier with an external photodetector, wherein the transimpedance amplifier includes a small, auxiliary, integrated silicon photodetector provided at the input of the transimpedance, in parallel with external photodetector attachment points. The small auxiliary photodetector does not significantly affect the high speed performance of the transimpedance amplifier. The small auxiliary photodetector is provided to facilitate wafer-level testing at the transimpedance amplifier input. To test the transimpedance amplifier, the transimpedance amplifier is stimulated by optically exciting the small auxiliary photodetector, wherein the small auxiliary photodetector is excited using short wavelength light, whereby advantages such as higher efficiency may be obtained. The testing method includes placing the amplifier wafer in a testing system, probing the power and ground connections on the amplifier wafer, illuminating the small auxiliary photodetector on the amplifier wafer, and detecting the output of the transimpedance amplifier housed on the amplifier wafer. The output of the transimpedance amplifier may detected by probing the supply voltage and detecting the switching currents passing through a bias tee using a spectrum analyzer, using a high gain antenna and a sensitive narrow band receiver, or using a high speed electrical probe.

    Abstract translation: 在将跨阻抗放大器封装在外部光电检测器之前，在放大器晶片上进行测试，其中跨导放大器包括一个小的辅助集成硅光电检测器，其设置在跨阻抗的输入处，与外部光电检测器连接点 。 小型辅助光电探测器不会显着影响跨阻放大器的高速性能。 提供小型辅助光电探测器以便于跨阻放大器输入端的晶圆级测试。 为了测试跨阻抗放大器，通过光学激励小型辅助光电探测器来刺激跨阻放大器，其中使用短波长光来激发小的辅助光电探测器，由此可以获得诸如更高效率的优点。 测试方法包括将放大器晶片放置在测试系统中，探测放大器晶片上的电源和接地连接，照射放大器晶片上的小辅助光电检测器，以及检测放大晶片上的跨阻放大器的输出。 跨导放大器的输出可以通过使用高增益天线和敏感窄带接收机，或使用高速电探测器，利用频谱分析仪探测电源电压和检测通过偏置三通的开关电流来检测。

    APPARATUS AND METHOD FOR DETERMINING CONTACT DYNAMICS
    7.
    发明申请
    APPARATUS AND METHOD FOR DETERMINING CONTACT DYNAMICS 失效
    用于确定接触动力学的装置和方法

    公开(公告)号：US20050237064A1

    公开(公告)日：2005-10-27

    申请号：US10831296

    申请日：2004-04-26

    Applicant: Young Kwark

    Inventor： Young Kwark

    IPC: G01R31/02 ,  G01R31/327

    CPC classification number: G01R31/327

    Abstract: The invention relates to an apparatus and method to determine contact dynamics between conductive surfaces, and more particularly to determine the dynamics of contact closure in mechanical switches and analysis of the dynamics of other mechanical systems, in general. A log amp is in electrical communication with the RF synthesizer via a transmission line. The log amp outputs a voltage converted from an envelope of an RF waveform to determine a capacitance between at least two conductive surfaces.

    Abstract translation: 本发明涉及一种用于确定导电表面之间的接触动力学的装置和方法，更具体地，涉及确定机械开关中接触闭合的动力学以及其他机械系统的动力学分析。 对数放大器通过传输线与RF合成器电气通信。 对数放大器输出从RF波形的包络转换的电压，以确定至少两个导电表面之间的电容。

    Mapping system and method for determining optimal radio transponder placement
    9.
    发明申请
    Mapping system and method for determining optimal radio transponder placement 失效
    用于确定最佳无线电应答器放置的映射系统和方法

    公开(公告)号：US20070093983A1

    公开(公告)日：2007-04-26

    申请号：US11257408

    申请日：2005-10-24

    Applicant: Han Chen ,  Young Kwark ,  John Martin ,  Paul Moskowitz

    Inventor： Han Chen ,  Young Kwark ,  John Martin ,  Paul Moskowitz

    IPC: G01K1/08 ,  G06F17/50 ,  H04N7/18 ,  H04N5/33 ,  G08B13/14

    CPC classification number: G01R29/0871 ,  G01R29/0814

    Abstract: A mapping system and method. The mapping system comprises an electromagnetic field generator, a layer of electromagnetic field absorbing material over an object, and an infrared camera. The electromagnetic field generator is adapted to generate an electromagnetic field and expose the electromagnetic field absorbing material and object to the electromagnetic field. The layer of electromagnetic field absorbing material is adapted to absorb the electromagnetic field and generate areas of thermal differences within the electromagnetic field absorbing material. The infrared camera is adapted to detect the areas of thermal differences.

    Abstract translation: 映射系统和方法。 映射系统包括电磁场发生器，物体上的电磁场吸收材料层和红外摄像机。 电磁场发生器适于产生电磁场，并将电磁场吸收材料暴露于电磁场。 电磁场吸收材料层适于吸收电磁场并产生电磁场吸收材料内的热差区域。 红外摄像机适用于检测热差异的区域。

    Method and structure for variable pitch microwave probe assembly
    10.
    发明申请
    Method and structure for variable pitch microwave probe assembly 失效

    公开(公告)号：US20070029988A1

    公开(公告)日：2007-02-08

    申请号：US11580033

    申请日：2006-10-13

    Applicant: Young Kwark

    Inventor： Young Kwark

    IPC: G01R31/02

    CPC classification number: G01R1/06772 ,  Y10T29/49002

    Abstract: A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center contact point and the at least one peripheral contact point is adjustable.

Patent Agency Ranking