ESD detection method for array substrate

    公开(公告)号:US10126343B2

    公开(公告)日:2018-11-13

    申请号:US14912924

    申请日:2016-01-29

    Abstract: The invention provides an ESD detection method for array substrate. By connecting the first metal layer on array substrate through the first wire to the first test point, connecting the second metal layer on array substrate through the second wire to the second test point, when ESD occurs on array substrate, the resistance detection device is used to measure the resistance between the first and second test points. If the resistance is positive infinity, ESD did not occur between the first and second metal layers; if the resistance is within a measurable range, ESD occurs between the first and second metal layers. The resistance is used to locate the location of ESD occurrence on array substrate. Compared to known method using microscope to search ESD location, the invention can locate ESD location on array substrate more accurately and rapidly to save time and labor as well as detection cost.

    Liquid crystal panel and pixel structure thereof

    公开(公告)号:US10156756B2

    公开(公告)日:2018-12-18

    申请号:US14907865

    申请日:2016-01-12

    Abstract: A liquid crystal panel and a pixel structure thereof are described. The pixel structure has a common electrode, a protecting layer, a plurality of pixel electrodes, and a plurality of first channels. The protecting layer is located on the common electrode; the pixel electrodes are located on the protecting layer; and the first channels are located between the neighboring pixel electrodes and pass through the protecting layer, so that the first channels expose a top surface of the common electrode.

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