Systems and methods for materials analysis

    公开(公告)号:US10161887B2

    公开(公告)日:2018-12-25

    申请号:US14600511

    申请日:2015-01-20

    IPC分类号: G01N23/207 G01N23/20016

    摘要: A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.