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    Systems and methods for materials analysis
    2.
    发明授权
    Systems and methods for materials analysis 有权

    公开(公告)号：US10161887B2

    公开(公告)日：2018-12-25

    申请号：US14600511

    申请日：2015-01-20

    Applicant: UNITED TECHNOLOGIES CORPORATION

    Inventor： Iuliana Cernatescu ,  Vasisht Venkatesh ,  David Ulrich Furrer

    IPC: G01N23/207 ,  G01N23/20016

    Abstract: A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.

    SYSTEMS AND METHODS FOR X-RAY DIFFRACTION
    10.
    发明申请
    SYSTEMS AND METHODS FOR X-RAY DIFFRACTION 有权
    X射线衍射的系统和方法

    公开(公告)号：US20150253262A1

    公开(公告)日：2015-09-10

    申请号：US14639460

    申请日：2015-03-05

    Applicant: UNITED TECHNOLOGIES CORPORATION

    Inventor： Iuliana Cernatescu ,  David U. Furrer

    IPC: G01N23/20 ,  G01N23/207

    CPC classification number: G01N23/20008 ,  G01N23/20 ,  G01N23/20025 ,  G01N23/207 ,  H01J35/02 ,  H01J35/025 ,  H01J35/08 ,  H01J35/10 ,  H01J35/101 ,  H01J35/16 ,  H01J35/24 ,  H01J35/26 ,  H01J2235/081 ,  H01J2235/086

    Abstract: An x-ray diffraction system includes an x-ray source having a first interchangeable x-ray generating component, a second interchangeable x-ray generating component, an actuator and a controller operatively connected to the actuator. The first and second interchangeable x-ray generating components are interchangeable with one another. The actuator is operatively connected to the first and second interchangeable x-ray generating components. A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first x-ray generating component with a second x-ray generating component to form a modified x-ray source, and emitting a second x-ray beam from the modified x-ray source based on a second desired depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.

    Abstract translation: x射线衍射系统包括具有第一可互换x射线产生部件的X射线源，第二可互换x射线产生部件，致动器和可操作地连接到致动器的控制器。 第一和第二可互换的X射线产生部件彼此可互换。 致动器可操作地连接到第一和第二可互换的X射线产生部件。 用于非破坏性X射线衍射的方法包括基于第一期望深度从具有第一x射线产生部件的X射线源发射第一X射线束，以测量第一期望的样品的晶体学特征 将第一X射线产生部件与第二X射线产生部件交换以形成修改的X射线源，并且基于第二期望深度从修改的X射线源发射第二x射线束， 在第二个期望的深度上非破坏性地测量样品的结晶学特征。

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