公开(公告)号：US20170343787A1

公开(公告)日：2017-11-30

申请号：US15680962

申请日：2017-08-18

申请人： Thorlabs, Inc.

发明人： Alex CABLE ,  Jörn Wollenzin ,  Ross Johnstone ,  Kirk Gossage ,  Jeffrey S. Brooker ,  Jason Mills ,  James Jiang ,  Dierck Hillmann

IPC分类号： G02B21/24 ,  G02B7/28 ,  G01B9/02 ,  G02B21/00 ,  G02B21/26

CPC分类号： G02B21/245 ,  G01B9/02059 ,  G01B9/02063 ,  G01B9/02077 ,  G01B9/0209 ,  G02B7/28 ,  G02B21/0004 ,  G02B21/26

摘要： Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

公开(公告)号：US09989749B2

公开(公告)日：2018-06-05

申请号：US15680962

申请日：2017-08-18

申请人： Thorlabs, Inc.

发明人： Alex Cable ,  Jörn Wollenzin ,  Ross Johnstone ,  Kirk Gossage ,  Jeffrey S. Brooker ,  Jason Mills ,  James Jiang ,  Dierck Hillmann

IPC分类号： G02B21/24 ,  G02B7/28 ,  G01B9/02 ,  G02B21/00 ,  G02B21/26

CPC分类号： G02B21/245 ,  G01B9/02059 ,  G01B9/02063 ,  G01B9/02077 ,  G01B9/0209 ,  G02B7/28 ,  G02B21/0004 ,  G02B21/26

摘要： Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

公开(公告)号：US20160216501A1

公开(公告)日：2016-07-28

申请号：US14994835

申请日：2016-01-13

申请人： Thorlabs, Inc.

发明人： Alex CABLE ,  Jörn Wollenzin ,  Ross Johnstone ,  Kirk Gossage ,  Jeffrey S. Brooker ,  Jason Mills ,  James Jiang ,  Dierck Hillmann

IPC分类号： G02B21/24 ,  G02B21/26 ,  G02B5/12 ,  G02B21/08

CPC分类号： G02B21/245 ,  G01B9/02059 ,  G01B9/02063 ,  G01B9/02077 ,  G01B9/0209 ,  G02B7/28 ,  G02B21/0004 ,  G02B21/26

摘要： Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

摘要翻译： 公开了使用低相干干涉测量技术来创建用于光学显微镜的自动聚焦装置的几种技术方法。 这些方法允许自动聚焦在紧邻反射表面并在折射材料之后的薄结构，如覆盖滑动，以及将聚焦位置自动调节到样品区域中，而不受邻近表面反射的干扰。 补偿由覆盖样品的材料折射引起的测量偏移。 提出的是一种仪器的技术，允许在低相干干涉测量自动对焦系统中自动交换成像目标，这与TDI（时间延迟积分）成像，共聚焦和双光子荧光显微镜相结合是主要感兴趣的。

公开(公告)号：US09869852B2

公开(公告)日：2018-01-16

申请号：US14994835

申请日：2016-01-13

申请人： Thorlabs, Inc.

发明人： Alex Cable ,  Jörn Wollenzin ,  Ross Johnstone ,  Kirk Gossage ,  Jeffrey S. Brooker ,  Jason Mills ,  James Jiang ,  Dierck Hillmann

IPC分类号： G02B21/24 ,  G02B21/26 ,  G02B5/12 ,  G02B21/08 ,  G01B9/02 ,  G02B7/28 ,  G02B21/00

CPC分类号： G02B21/245 ,  G01B9/02059 ,  G01B9/02063 ,  G01B9/02077 ,  G01B9/0209 ,  G02B7/28 ,  G02B21/0004 ,  G02B21/26

摘要： Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.