公开(公告)号：US20230214702A1

公开(公告)日：2023-07-06

申请号：US18147366

申请日：2022-12-28

Applicant: Technion Research & Development Foundation Limited

Inventor： Raphael DAHAN ,  Alexey GORLACH ,  Gefen BARANES ,  Ron RUIMY ,  Ido KAMINER

IPC: G06N10/40

CPC classification number: G06N10/40

Abstract: A photonic quantum state generator is presented for generation of one or more predetermined photonic quantum states in a range from radiofrequency to X-ray. The generator comprises: a free particles source controllably operable to provide a flow of said free particles with predetermined one or more flow parameters; a shaping unit located in a vicinity of a flow of the free particles and adapted to apply wavefunction shaping to provide coherently shaped free particles in either one of time-energy domain or space-momentum domain; and an interaction unit comprising a photonic structure and defining an interaction region enabling in interactions (m≥1) between a photonic mode within said interaction region and the flow of the coherently shaped free particles having said one or more flow parameters satisfying a phase-matching condition with respect to the photonic mode, thereby generating said one or more predetermined photonic quantum states by a conditional displacement mechanism.

公开(公告)号：US20250056703A1

公开(公告)日：2025-02-13

申请号：US18790246

申请日：2024-07-31

Applicant: Technion Research & Development Foundation Limited

Inventor： Amnon BALANOV ,  Ido KAMINER

IPC: H05G2/00

Abstract: An X-ray generator is presented comprising: an electron source generating an accelerated electron beam propagating along a first propagation path with a first general propagation direction; a first crystalline structure located in the first propagation path, and defining a first crystal plane oriented at a predetermined non-zero angle with the first propagation path, and configured to transmit the electron beam therethrough and generate parametric x-ray (PXR) emission being first directional emission along a second propagation path tilted with respect to the first general propagation direction; and a second crystalline structure located in the second propagation path and configured as a monochromator with respect to the PXR emission, and defining a second crystal plane oriented at the predetermined non-zero angle with respect to the second propagation path to thereby provide second directionality for the PXR emission.

公开(公告)号：US20180294136A1

公开(公告)日：2018-10-11

申请号：US15570638

申请日：2016-05-08

Applicant: TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED

Inventor： Ido KAMINER ,  Maor MUTZAFI ,  Gal HARARI ,  Mordechay SEGEV

IPC: H01J37/153

CPC classification number: H01J37/153 ,  H01J37/26 ,  H01J37/263 ,  H01J2237/1538 ,  H01J2237/2614

Abstract: An electron beam shaping unit for use in electron beam column and a method for designing thereof is presented. The electron beam shaping unit is configured for affecting electron beams of high density or strong electron-electron repulsion. These 5 beams can always be modeled with multi electron wave function. The electron beam shaping unit comprises a mask unit configured for affecting propagation of electrons therethrough to thereby form a propagating electron beam having, at far field, radial shape as determined by multi-electron non-linear function being an eigen function determined by a multi-electron Hartree-Fock Hamiltonian.

公开(公告)号：US20240186102A1

公开(公告)日：2024-06-06

申请号：US18410075

申请日：2024-01-11

Applicant: TECHNION RESEARCH & DEVELOPMENT FOUNDATION LIMITED

Inventor： Raphael DAHAN ,  Ido KAMINER ,  Michael YANNAI ,  Tal FISHMAN

IPC: H01J37/147 ,  H01J37/28

CPC classification number: H01J37/147 ,  H01J37/28

Abstract: A charged particles beam column for inspecting a sample in a sample plane is presented. The charged particles beam column comprises: a charged particles source generating a charged particles beam propagating along a general propagation path towards the sample plane; and at least one charged particles beam shaping unit. The charged particles shaping unit comprises at least one high-frequency electromagnetic radiation generator located in a vicinity of said general propagation path of the charged particles beam and controllably operated to perform synchronized generation of said high-frequency electromagnetic radiation towards at least one interaction region in said general propagation path, to cause interaction between said radiation and the charged particles, thereby directly affecting energy properties of the charged particles passing through said at least one interaction region in the general propagation path and directly affecting spectral resolution of the charged particles beam at said sample plane.