摘要:
An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.
摘要:
An analog signal is sampled; a reference signal synchronized to the sampling is generated; the sampling result is compared to said reference signal; the time interval from the sampling point to the time the comparison result satisfies the prescribed condition is acquired; and the amplitude of the digital representation is determined from the acquired time interval and knowledge of the reference signal.
摘要:
A signal conditioner comprising a receiving part, a transmitting part, and a power supply part, wherein the main functions of these components are digitalized and common circuit elements are used for different functions. Signal conditions may be of several different types, each of which is a hardware which can accommodate various transmitters and actuators.
摘要:
An analog signal is sampled; a reference signal synchronized to the sampling is generated; the sampling result is compared to said reference signal; the time interval from the sampling point to the time the comparison result satisfies the prescribed condition is acquired; and the amplitude of the digital representation is determined from the acquired time interval and knowledge of the reference signal.
摘要:
A method for performing the analog to digital conversion of a repeating signal that includes performing the analog conversion of digital data and generating a reference signal, comparing the repeating signal and the reference signal, holding the comparison result at a prescribed time position of the repeating signal, and adjusting the digital data based on the held comparison result. In addition, an apparatus for performing the analog to digital conversion of a repeating signal by implementing the method described above.
摘要:
An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.
摘要:
The invention presents a circuit by which control of the output amplitude of digital analog converters can be carried out at high speed and with high precision. A first digital signal that is the same as the input signal and a second digital signal of a value slightly smaller than an input signal provided from a high-speed processor are selectively applied to plural D-A converters and the output therefrom is added. By changing the ratio with which the first digital signal and the second digital signal are selected, it is possible to control the analog output amplitude.