Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals
    1.
    发明授权
    Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals 失效
    用于测试具有用于测试数字和模拟信号的集成单元的集成电路的装置

    公开(公告)号:US06737881B2

    公开(公告)日:2004-05-18

    申请号:US10054139

    申请日:2002-01-22

    IPC分类号: G01R3126

    CPC分类号: G01R31/3167

    摘要: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.

    摘要翻译: 用于从集成电路测试数字和模拟信号的装置包括加法器或减法器17,用于从被测器件的集成电路输出的模拟信号和从驱动器11输出的信号,积分器14供给 具有从加法器或减法器17输出的模拟信号,用于选择性地将从积分器14输出的模拟信号和从积分电路输出的数字信号发送到比较器13的开关22和用于选择性地发送输出的信号的开关24 从存储器20和从比较器13输出到驱动器11的信号。至少一个开关22,24根据被测信号是模拟还是数字来操作。

    Analog to digital conversion method using track/hold circuit and time interval analyzer, and an apparatus using the method
    2.
    发明授权
    Analog to digital conversion method using track/hold circuit and time interval analyzer, and an apparatus using the method 有权
    使用跟踪/保持电路和时间间隔分析器的模数转换方法,以及使用该方法的装置

    公开(公告)号:US07248200B2

    公开(公告)日:2007-07-24

    申请号:US11397469

    申请日:2006-04-04

    IPC分类号: H03M1/50

    CPC分类号: H03M1/504

    摘要: An analog signal is sampled; a reference signal synchronized to the sampling is generated; the sampling result is compared to said reference signal; the time interval from the sampling point to the time the comparison result satisfies the prescribed condition is acquired; and the amplitude of the digital representation is determined from the acquired time interval and knowledge of the reference signal.

    摘要翻译: 对模拟信号进行采样; 产生与采样同步的参考信号; 将采样结果与所述参考信号进行比较; 获取从采样点到比较结果满足规定条件的时间间隔; 并且从所获取的时间间隔和参考信号的知识确定数字表示的幅度。

    Analog to digital conversion method using track/hold circuit and time interval analyzer, and an apparatus using the time method
    4.
    发明申请
    Analog to digital conversion method using track/hold circuit and time interval analyzer, and an apparatus using the time method 有权
    使用跟踪/保持电路和时间间隔分析仪的模数转换方法,以及使用时间法的装置

    公开(公告)号:US20060238398A1

    公开(公告)日:2006-10-26

    申请号:US11397469

    申请日:2006-04-04

    IPC分类号: H03M1/12

    CPC分类号: H03M1/504

    摘要: An analog signal is sampled; a reference signal synchronized to the sampling is generated; the sampling result is compared to said reference signal; the time interval from the sampling point to the time the comparison result satisfies the prescribed condition is acquired; and the amplitude of the digital representation is determined from the acquired time interval and knowledge of the reference signal.

    摘要翻译: 对模拟信号进行采样; 产生与采样同步的参考信号; 将采样结果与所述参考信号进行比较; 获取从采样点到比较结果满足规定条件的时间间隔; 并且从所获取的时间间隔和参考信号的知识确定数字表示的幅度。

    Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals
    6.
    发明授权
    Apparatus for testing integrated circuits having an integrated unit for testing digital and analog signals 有权
    用于测试具有用于测试数字和模拟信号的集成单元的集成电路的装置

    公开(公告)号:US06864699B2

    公开(公告)日:2005-03-08

    申请号:US10807948

    申请日:2004-03-24

    CPC分类号: G01R31/3167

    摘要: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.

    摘要翻译: 用于从集成电路测试数字和模拟信号的装置包括加法器或减法器17,用于从被测器件的集成电路输出的模拟信号和从驱动器11输出的信号,积分器14供给 具有从加法器或减法器17输出的模拟信号,用于选择性地将从积分器14输出的模拟信号和从积分电路输出的数字信号发送到比较器13的开关22和用于选择性地发送输出的信号的开关24 从存储器20和从比较器13输出到驱动器11的信号。至少一个开关22,24根据被测信号是模拟还是数字来操作。

    Output amplitude control circuit
    7.
    发明授权
    Output amplitude control circuit 有权
    输出幅度控制电路

    公开(公告)号:US06246279B1

    公开(公告)日:2001-06-12

    申请号:US09428612

    申请日:1999-10-27

    申请人: Takanori Komuro

    发明人: Takanori Komuro

    IPC分类号: G06F742

    CPC分类号: H03M1/70

    摘要: The invention presents a circuit by which control of the output amplitude of digital analog converters can be carried out at high speed and with high precision. A first digital signal that is the same as the input signal and a second digital signal of a value slightly smaller than an input signal provided from a high-speed processor are selectively applied to plural D-A converters and the output therefrom is added. By changing the ratio with which the first digital signal and the second digital signal are selected, it is possible to control the analog output amplitude.

    摘要翻译: 本发明提出了一种可以高速,高精度地进行数字模拟转换器输出振幅的控制的电路。 与输入信号相同的第一数字信号和稍微小于从高速处理器提供的输入信号的值的第二数字信号被选择性地施加到多个D-A转换器,并且添加其输出。 通过改变选择第一数字信号和第二数字信号的比率,可以控制模拟输出幅度。