WAFER STACK AND FABRICATION METHOD THEREOF
    2.
    发明申请

    公开(公告)号:US20170316969A1

    公开(公告)日:2017-11-02

    申请号:US15219523

    申请日:2016-07-26

    CPC classification number: H01L21/76256 H01L24/94 H01L2224/94

    Abstract: A semiconductor device includes a first wafer and a second wafer. The first wafer has a top portion. The second wafer is disposed on the top portion of the first wafer, wherein the second wafer has a bottom portion bonded on the top portion of the first wafer, and a non-bonded area of the bottom portion has a width smaller than 0.5 mm. The bottom portion of the second wafer has a size smaller than or equal to that of the top portion of the first wafer. In some embodiments, the top portion of the first wafer has first rounded corners, and the bottom portion of the second wafer has second corners. A cross-sectional view of each of the second rounded corners has a radius smaller than that of each of first rounded corners. In some embodiments, the bottom portion of the second wafer has right angle corners.

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