公开(公告)号：US20170116076A1

公开(公告)日：2017-04-27

申请号：US14919363

申请日：2015-10-21

Applicant: SanDisk Technologies, Inc.

Inventor： Sahil Sharma ,  Abhijeet Manohar ,  Mrinal Kochar ,  Yong Huang ,  Derek McAuley ,  Mikhail Palityka ,  Ivan Baran ,  Aaron Lee

IPC: G06F11/10 ,  G11C29/52

CPC classification number: G06F11/1068 ,  G11C16/3418 ,  G11C29/02 ,  G11C29/028 ,  G11C29/42 ,  G11C29/44 ,  G11C29/52

Abstract: When the number of bad columns in a memory or plane is less than a threshold number then a first Error Correction Code (ECC) scheme encodes user data in first pages of a first size. If the number of bad columns is greater than the threshold number then a second ECC scheme encodes the user data in second pages of a second size that is smaller than the first size.

公开(公告)号：US09804922B2

公开(公告)日：2017-10-31

申请号：US14336883

申请日：2014-07-21

Applicant: SanDisk Technologies Inc.

Inventor： Mrinal Kochar ,  Abhijeet Bhalerao ,  Derek McAuley ,  Piyush Sagdeo

IPC: G06F11/00 ,  G06F11/10 ,  G11C29/52 ,  G06F12/08 ,  G06F11/07 ,  G11C29/00 ,  G06F11/14 ,  G06F11/16 ,  G06F11/20

CPC classification number: G06F11/1068 ,  G06F11/073 ,  G06F11/0751 ,  G06F11/141 ,  G06F11/1666 ,  G06F11/20 ,  G06F11/2094 ,  G06F12/0246 ,  G06F12/08 ,  G06F12/0868 ,  G06F2212/1024 ,  G06F2212/214 ,  G06F2212/313 ,  G06F2212/7201 ,  G06F2212/7203 ,  G11C29/52 ,  G11C29/765

Abstract: Systems and methods for partial bad block reuse may be provided. Data may be copied from a block of a first memory to a block of a second memory. A post write read error may be detected in a first portion the data copied to the block of the second memory without detection of a post write read error in a second portion of the data copied to the block of the second memory. The block of the second memory may be determined to be a partial bad block usable for storage in response to detection of the post write read error in the first portion of the data but not in the second portion of the data.

公开(公告)号：US20160019111A1

公开(公告)日：2016-01-21

申请号：US14336883

申请日：2014-07-21

Applicant: SanDisk Technologies Inc.

Inventor： Mrinal Kochar ,  Abhijeet Bhalerao ,  Derek McAuley ,  Piyush Sagdeo

IPC: G06F11/10 ,  G11C29/52

CPC classification number: G06F11/1068 ,  G06F11/073 ,  G06F11/0751 ,  G06F11/141 ,  G06F11/1666 ,  G06F11/20 ,  G06F11/2094 ,  G06F12/0246 ,  G06F12/08 ,  G06F12/0868 ,  G06F2212/1024 ,  G06F2212/214 ,  G06F2212/313 ,  G06F2212/7201 ,  G06F2212/7203 ,  G11C29/52 ,  G11C29/765

Abstract: Systems and methods for partial bad block reuse may be provided. Data may be copied from a block of a first memory to a block of a second memory. A post write read error may be detected in a first portion the data copied to the block of the second memory without detection of a post write read error in a second portion of the data copied to the block of the second memory. The block of the second memory may be determined to be a partial bad block usable for storage in response to detection of the post write read error in the first portion of the data but not in the second portion of the data.

Abstract translation: 可以提供用于部分坏块重用的系统和方法。 数据可以从第一存储器的块复制到第二存储器的块。 可以在复制到第二存储器的块的数据的第一部分中检测到写入后读取错误，而不检测复制到第二存储器的块的数据的第二部分中的写入后读取错误。 第二存储器的块可以被确定为响应于在数据的第一部分中但不在数据的第二部分中的后写入读取错误的检测而可用于存储的部分坏块。