Invention Application
US20160019111A1 PARTIAL BAD BLOCK DETECTION AND RE-USE USING EPWR FOR BLOCK BASED ARCHITECTURES
有权
使用基于块式结构的EPWR的部分块检测和重新使用
- Patent Title: PARTIAL BAD BLOCK DETECTION AND RE-USE USING EPWR FOR BLOCK BASED ARCHITECTURES
- Patent Title (中): 使用基于块式结构的EPWR的部分块检测和重新使用
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Application No.: US14336883Application Date: 2014-07-21
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Publication No.: US20160019111A1Publication Date: 2016-01-21
- Inventor: Mrinal Kochar , Abhijeet Bhalerao , Derek McAuley , Piyush Sagdeo
- Applicant: SanDisk Technologies Inc.
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C29/52
Abstract:
Systems and methods for partial bad block reuse may be provided. Data may be copied from a block of a first memory to a block of a second memory. A post write read error may be detected in a first portion the data copied to the block of the second memory without detection of a post write read error in a second portion of the data copied to the block of the second memory. The block of the second memory may be determined to be a partial bad block usable for storage in response to detection of the post write read error in the first portion of the data but not in the second portion of the data.
Public/Granted literature
- US09804922B2 Partial bad block detection and re-use using EPWR for block based architectures Public/Granted day:2017-10-31
Information query
