Abstract:
An electronic device includes: a multilayered base substrate including a plurality of substrate bases stacked on each other; a first conductive via and a second conductive via penetrating the substrate bases and spaced from each other; a conductive line electrically connecting the first conductive via and the second conductive via to each other and disposed on at least one of the substrate bases of the plurality of substrate bases; and an open stub including a first end and a second end, wherein the first end is connected to a connector of the conductive line, and the second end is opened.
Abstract:
Step shape pad structure and wiring structure in vertical type semiconductor device are include a first conductive line having a first line shape and including first pad regions at an upper surface of an edge portion, and a second conductive line having s second line shape and being spaced apart from the first conductive line and provided on the first conductive line. An end portion of the first conductive line is extended to a first position. Second pad regions are included on an upper surface of an edge portion of the second conductive line. An end portion of the second conductive line is extended to the first position. The second conductive line includes a dent portion at a facing portion to the first pad regions in a vertical direction to expose the first pad regions. The pad structure may be used in a vertical type nonvolatile memory device.
Abstract:
Embodiments herein disclose methods and systems for accounting for MPTCP data usage. The embodiments include tracking MPTCP data usage of a plurality of applications. The embodiments include reporting the MPTCP data usage information to a data tracking module. Each of the plurality of applications is associated with a UID, which is tagged with MPTCP packets of the plurality of applications. The MPTCP packets of the plurality of applications can be transferred through at least one sub-socket, in at least one sub-flow. The at least one sub-flow can be associated with the system (OS) ID. The embodiments include updating the system UID, associated with the at least one sub-flow, with UIDs of the applications, whose data is included in the at least one sub-flow.
Abstract:
A memory module includes a printed circuit board; first memory chips disposed in parallel with a long axis of the printed circuit board along a first column; second memory chips disposed in parallel with the long axis of the printed circuit board along a second column; and passive elements disposed between the first memory chips and the second memory chips, wherein the passive elements are connected between input/output pins of each of the first and second memory chips and tap pins.
Abstract:
A semiconductor device includes a cell area, wherein the cell area includes: a cell array area; a connection area; a gate stacking structure including a plurality of gate electrodes, wherein the gate stacking structure includes an upper structure and a lower structure; a plurality of channel structures that penetrates the gate stacking structure in the cell array area; and a plurality of gate contact portions that penetrates the gate stacking structure in the connection area, wherein a bottom gate electrode in the cell array area is in a bottom portion of the upper structure and is adjacent to a channel structure among the plurality of channel structures, and wherein a bottom insulating portion in the connection area is in the bottom portion of the upper structure and is adjacent to a gate contact portion among the plurality of gate contact portions.
Abstract:
In an integrated circuit device and method of manufacturing the same, a resistor pattern is positioned on a device isolation layer of a substrate. The resistor pattern includes a resistor body positioned in a recess portion of the device isolation layer and a connector making contact with the resistor body and positioned on the device isolation layer around the recess portion. The connector has a metal silicide pattern having electric resistance lower than that of the resistor body at an upper portion. A gate pattern is positioned on the active region of the substrate and includes the metal silicide pattern at an upper portion. A resistor interconnection is provided to make contact with the connector of the resistor pattern. A contact resistance between the connector and the resistor interconnection is reduced.