Abstract:
According to one general aspect, an apparatus may include a flip-flop circuit. The flip-flop circuit may include a selection circuit, a memory element circuit, a clock circuit. The selection circuit to select, as the selected input signal, between at least two input signals. The memory element circuit synchronously controlled by a clock signal, and configured to store the selected input signal. The clock circuit configured to output, at least, an earlier version of the clock signal and a later version of the clock signal. The selection circuit is configured to be synchronously controlled, at least in part, by the earlier version of the clock signal such that the selected input signal is held stable when being read by the memory element circuit.
Abstract:
According to one general aspect, an apparatus may include a first power signal having a high voltage. The apparatus may include a second power signal having a low voltage. The apparatus may include a third power signal having a voltage configured to switch between the high voltage and the low voltage. The apparatus may include a latching circuit powered by the first power signal and the second power signal. The apparatus may include a selection circuit configured to select between, at least, a first data signal and a second data signal, and powered by the first power signal, the second power signal, and the third power signal.
Abstract:
According to one general aspect, an apparatus may include a flip-flop circuit. The flip-flop circuit may include a selection circuit, a memory element circuit, a clock circuit. The selection circuit to select, as the selected input signal, between at least two input signals. The memory element circuit synchronously controlled by a clock signal, and configured to store the selected input signal. The clock circuit configured to output, at least, an earlier version of the clock signal and a later version of the clock signal. The selection circuit is configured to be synchronously controlled, at least in part, by the earlier version of the clock signal such that the selected input signal is held stable when being read by the memory element circuit.
Abstract:
Inventive aspects include integrated clock gating logic that can generate an internal glitch-free clock signal. Inventive aspects further include a toggle latch that is coupled to the integrated clock gating logic. The toggle latch can receive the internal clock signal from the integrated clock gating logic. The toggle latch can toggle and latch a data value responsive to the internal clock signal. The integrated clock gating logic can include a latch to latch a clock gating logic signal responsive to a clock signal. The clock gating logic signal can cause the internal clock signal to be quiescent when the input data to the flip-flop remains constant, thereby conserving power consumption.
Abstract:
According to one general aspect, an apparatus may include a latch circuit configured to, depending in part upon a state or at least one enable signal, pass a clock signal to an output signal. The latch circuit may include an input stage controlled by the clock signal and the enable signal(s). The latch may include an output stage configured to produce the output signal. The input and output stages may share a common transistor controlled by the clock signal.
Abstract:
According to one general aspect, an apparatus may include a metal layer having a metal pitch between metal elements, and a gate electrode layer having a gate pitch between gate electrode elements, wherein the gate electrode pitch is a ratio of the metal pitch. The apparatus may include at least two power rails coupled, by via staples, with the metal layer, wherein the via staples at least partially overlap one or more of the gate electrode elements. The apparatus may include even and odd pluralities of standard cells, each respectively located in even/odd placement sites wherein portions of the standard cells that carry signals within the metal layer do not connect to the via staples.
Abstract:
Embodiments include an integrated clock gating (ICG) cell. The low power ICG cell may include an input condition determination circuit configured to generate a temporary inverted clock signal and an inverted output signal. The low power ICG cell may include an enable control logic circuit configured to receive the temporary inverted clock signal and the inverted output signal from the input condition determination circuit. The low power ICG cell may include a latch circuit coupled to the enable control logic circuit and configured to latch an input value dependent on at least the inverted output signal and the temporary inverted clock signal. The input condition determination circuit is configured to generate the temporary inverted clock signal only when it is needed.
Abstract:
A standard cell architecture provides an improved immunity to power-supply voltage-drop, does not induce power-supply voltage drop on a continuous-row power rail of a standard cell, and maintains standard-cell environment compatibility. A circuit includes a first metal layer and a second metal layer that are formed different distances above a substrate. At least one first standard cell drives a first timing signal and includes at least one transistor receiving power from a first power rail in the first metal layer. At least one second standard cell drives a second timing signal and includes at least one transistor receiving power from a second power rail in the second metal layer. The second power rail has both a low peak noise level and a resistance that is lower than that of the first metal layer.
Abstract:
A scannable circuit element includes a data path and a scan-data path that are respectively selected in response to a first operational mode and a second operational mode. The scan-data path includes an input element having an input node, an output node, a first power node and a second power node. A signal path between the input node and the output node is part of the scan-data path. The first power node is coupled to a first voltage potential, and the second power node is coupled to a mode-control signal that is at substantially the first voltage potential in the first operational mode and that is at substantially a second voltage potential in the second operational mode. In the second operational mode, the scannable element exhibits no switching current and no leakage current.