公开(公告)号：US20170271336A1

公开(公告)日：2017-09-21

申请号：US15616455

申请日：2017-06-07

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang-Jine Park ,  Bo-Un Yoon ,  Ha-Young Jeon ,  Yeon-Jin Gil ,  Ji-Won Yun ,  Won-Sang Choi

IPC: H01L27/092 ,  H01L27/088 ,  H01L29/78 ,  H01L21/8238 ,  H01L29/165

CPC classification number: H01L27/0924 ,  H01L21/76224 ,  H01L21/823807 ,  H01L21/823821 ,  H01L21/823878 ,  H01L27/0886 ,  H01L29/165 ,  H01L29/7846 ,  H01L29/7848 ,  H01L29/785

Abstract: Semiconductor devices are provided. A semiconductor device includes a fin protruding from a substrate. Moreover, the semiconductor device includes first and second gate structures on the fin, and an isolation region between the first and second gate structures. The isolation region includes first and second portions having different respective widths. Related methods of forming semiconductor devices are also provided.

公开(公告)号：US20190043860A1

公开(公告)日：2019-02-07

申请号：US16158797

申请日：2018-10-12

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ji-Min Jeong ,  Kee-Sang Kwon ,  Jin-Wook Lee ,  Ki-Hyung Ko ,  Sang-Jine Park ,  Jae-Jik Baek ,  Bo-Un Yoon ,  Ji-Won Yun

IPC: H01L27/088 ,  H01L29/66 ,  H01L29/49 ,  H01L21/8234 ,  H01L29/423

Abstract: A semiconductor device is provided. The semiconductor device includes a gate spacer that defines a trench on a substrate and includes an upper part and a lower part, a gate insulating film that extends along sidewalls and a bottom surface of the trench and is not in contact with the upper part of the gate spacer, a lower conductive film that extends on the gate insulating film along the sidewalls and the bottom surface of the trench and is not overlapped with the upper part of the gate spacer, and an upper conductive film on an uppermost part of the gate insulating film on the lower conductive film.

公开(公告)号：US10128246B2

公开(公告)日：2018-11-13

申请号：US15616455

申请日：2017-06-07

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang-Jine Park ,  Bo-Un Yoon ,  Ha-Young Jeon ,  Yeon-Jin Gil ,  Ji-Won Yun ,  Won-Sang Choi

IPC: H01L21/70 ,  H01L27/092 ,  H01L29/78 ,  H01L27/088 ,  H01L21/762 ,  H01L29/165 ,  H01L21/8238

Abstract: Semiconductor devices are provided. A semiconductor device includes a fin protruding from a substrate. Moreover, the semiconductor device includes first and second gate structures on the fin, and an isolation region between the first and second gate structures. The isolation region includes first and second portions having different respective widths. Related methods of forming semiconductor devices are also provided.

公开(公告)号：US10734380B2

公开(公告)日：2020-08-04

申请号：US16158797

申请日：2018-10-12

Applicant: Samsung Electronics Co., Ltd.

Inventor： Ji-Min Jeong ,  Kee-Sang Kwon ,  Jin-Wook Lee ,  Ki-Hyung Ko ,  Sang-Jine Park ,  Jae-Jik Baek ,  Bo-Un Yoon ,  Ji-Won Yun

IPC: H01L27/088 ,  H01L29/49 ,  H01L29/423 ,  H01L29/66 ,  H01L21/8234

Abstract: A semiconductor device is provided. The semiconductor device includes a gate spacer that defines a trench on a substrate and includes an upper part and a lower part, a gate insulating film that extends along sidewalls and a bottom surface of the trench and is not in contact with the upper part of the gate spacer, a lower conductive film that extends on the gate insulating film along the sidewalls and the bottom surface of the trench and is not overlapped with the upper part of the gate spacer, and an upper conductive film on an uppermost part of the gate insulating film on the lower conductive film.