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公开(公告)号:US20240379653A1
公开(公告)日:2024-11-14
申请号:US18782939
申请日:2024-07-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Vassilios Gerousis , Rwik Sengupta , Joon Goo Hong , Kevin Traynor , Tanya Abaya , Dharmendar Palle , Mark S. Rodder
IPC: H01L27/02 , G06F30/392 , H01L23/528
Abstract: A semiconductor cell block includes a series of layers arranged in a stack. The layers include one or more first layers each having a first height and one or more second layers each having a second height. The second height is larger than the first height, and the second height is a non-integer multiple of the first height. The semiconductor cell block also includes a first semiconductor logic cell having a first cell height in one of the series of layers, and a second semiconductor logic cell having a second cell height in one of the series of layers. The second cell height is larger than the first cell height, and the second cell height is a non-integer value multiple of the first cell height.
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公开(公告)号:US10566330B2
公开(公告)日:2020-02-18
申请号:US15977949
申请日:2018-05-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mark S. Rodder , Borna J. Obradovic , Dharmendar Palle , Rwik Sengupta , Mohammad Ali Pourghaderi
IPC: H01L27/092 , H01L29/78 , H01L29/417 , H01L29/66
Abstract: A CMOS system on chip including a series of partial gate-all-around field effect transistors. Each partial GAA FET includes a fin having a stack of channel regions, source and drain regions on opposite sides of the fin, a dielectric separation region including a dielectric material between first and second channel regions, a gate stack on the fin, and a pair of sidewall spacers on opposite sides of the gate stack. A portion of the dielectric separation region has a length from an outer edge of the dielectric separation region to an inner edge of a respective sidewall spacer. The length of the portion of the dielectric separation region of one of the partial GAA FETs is different than the length of the portion of the dielectric separation region of another one of the partial GAA FETs.
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公开(公告)号:US20210265334A1
公开(公告)日:2021-08-26
申请号:US16853535
申请日:2020-04-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Vassilios Gerousis , Rwik Sengupta , Joon Goo Hong , Kevin Traynor , Tanya Abaya , Dharmendar Palle , Mark S. Rodder
IPC: H01L27/02 , H01L23/528 , G06F30/392
Abstract: A semiconductor cell block includes a series of layers arranged in a stack. The layers include one or more first layers each having a first height and one or more second layers each having a second height. The second height is larger than the first height, and the second height is a non-integer multiple of the first height. The semiconductor cell block also includes a first semiconductor logic cell having a first cell height in one of the series of layers, and a second semiconductor logic cell having a second cell height in one of the series of layers. The second cell height is larger than the first cell height, and the second cell height is a non-integer value multiple of the first cell height.
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4.
公开(公告)号:US20200279605A1
公开(公告)日:2020-09-03
申请号:US16448820
申请日:2019-06-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ryan M. Hatcher , Titash Rakshit , Jorge Kittl , Rwik Sengupta , Dharmendar Palle , Joon Goo Hong
Abstract: A weight cell and device are herein disclosed. The weight cell includes a first field effect transistor (FET) and a first resistive memory element connected to a drain of the first FET, a second FET and a second resistive memory element connected to a drain of the second FET, the drain of the first FET is connected to a gate of the second FET and the drain of the second FET is connected to a gate of the first FET, and a third FET, and a load resistor connected to a drain of the third FET.
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公开(公告)号:US20200265892A1
公开(公告)日:2020-08-20
申请号:US16448799
申请日:2019-06-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ryan M. HATCHER , Titash Rakshit , Jorge Kittl , Rwik Sengupta , Dharmendar Palle , Joon Goo Hong
Abstract: A weight cell and device are herein disclosed. The weight cell includes a first field effect transistor (FET) and a first resistive memory element connected to a drain of the first FET, and a second FET and a second resistive memory element connected to a drain of the second FET. The drain of the first FET is connected to a gate of the second FET and the drain of the second FET is connected to a gate of the first FET.
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公开(公告)号:US12080703B2
公开(公告)日:2024-09-03
申请号:US18048186
申请日:2022-10-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Vassilios Gerousis , Rwik Sengupta , Joon Goo Hong , Kevin Traynor , Tanya Abaya , Dharmendar Palle , Mark S. Rodder
IPC: H01L27/02 , G06F30/392 , H01L23/528
CPC classification number: H01L27/0207 , G06F30/392 , H01L23/5286
Abstract: A semiconductor cell block includes a series of layers arranged in a stack. The layers include one or more first layers each having a first height and one or more second layers each having a second height. The second height is larger than the first height, and the second height is a non-integer multiple of the first height. The semiconductor cell block also includes a first semiconductor logic cell having a first cell height in one of the series of layers, and a second semiconductor logic cell having a second cell height in one of the series of layers. The second cell height is larger than the first cell height, and the second cell height is a non-integer value multiple of the first cell height.
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7.
公开(公告)号:US11475933B2
公开(公告)日:2022-10-18
申请号:US16847741
申请日:2020-04-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ryan Hatcher , Titash Rakshit , Jorge Kittl , Joon Goo Hong , Dharmendar Palle
Abstract: A method, system and electronic device for mitigating variance in a two transistor two resistive memory element (2T2R) circuit is provided. The method includes calculating a sum of a number of logical 1's in a column of bitcells in the 2T2R circuit, N, of an input vector, sensing output current values from each current line in the column of bitcells and calculating an inner product, M, of the input vector and the bitcells in the column in the 2T2R circuit based on the sensed output current values.
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8.
公开(公告)号:US10832774B2
公开(公告)日:2020-11-10
申请号:US16448820
申请日:2019-06-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ryan M. Hatcher , Titash Rakshit , Jorge Kittl , Rwik Sengupta , Dharmendar Palle , Joon Goo Hong
Abstract: A weight cell and device are herein disclosed. The weight cell includes a first field effect transistor (FET) and a first resistive memory element connected to a drain of the first FET, a second FET and a second resistive memory element connected to a drain of the second FET, the drain of the first FET is connected to a gate of the second FET and the drain of the second FET is connected to a gate of the first FET, and a third FET, and a load resistor connected to a drain of the third FET.
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公开(公告)号:US20190181140A1
公开(公告)日:2019-06-13
申请号:US15977949
申请日:2018-05-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mark S. Rodder , Borna J. Obradovic , Dharmendar Palle , Rwik Sengupta , Mohammad Ali Pourghaderi
IPC: H01L27/092 , H01L29/78 , H01L29/66 , H01L29/417
Abstract: A CMOS system on chip including a series of partial gate-all-around field effect transistors. Each partial GAA FET includes a fin having a stack of channel regions, source and drain regions on opposite sides of the fin, a dielectric separation region including a dielectric material between first and second channel regions, a gate stack on the fin, and a pair of sidewall spacers on opposite sides of the gate stack. A portion of the dielectric separation region has a length from an outer edge of the dielectric separation region to an inner edge of a respective sidewall spacer. The length of the portion of the dielectric separation region of one of the partial GAA FETs is different than the length of the portion of the dielectric separation region of another one of the partial GAA FETs.
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公开(公告)号:US11217392B2
公开(公告)日:2022-01-04
申请号:US16417346
申请日:2019-05-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ryan M. Hatcher , Titash Rakshit , Jorge A. Kittl , Joon Goo Hong , Dharmendar Palle
IPC: H01L41/083 , H01G4/12 , H01L29/51 , H01L29/78 , H01G4/008
Abstract: A circuit element. In some embodiments, the circuit element includes a first terminal, a second terminal, and a layered structure. The layered structure may include a first conductive layer connected to the first terminal, a first piezoelectric layer on the first conductive layer, a second piezoelectric layer on the first piezoelectric layer, and a second conductive layer connected to the second terminal. The first piezoelectric layer may have a first piezoelectric tensor and a first permittivity tensor, and the second piezoelectric layer may have a second piezoelectric tensor and a second permittivity tensor, one or both of the second piezoelectric tensor and a second permittivity tensor differing, respectively, from the first piezoelectric tensor and the first permittivity tensor.
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