公开(公告)号：US11417572B2

公开(公告)日：2022-08-16

申请号：US16820149

申请日：2020-03-16

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Jongsung Kim ,  Honggi Min

IPC: H01L21/66 ,  H01L51/00 ,  H01L51/56

Abstract: A droplet measurement method is described. The droplet measurement method may include discharging a droplet on a substrate, scanning the droplet by moving a scanning unit, and calculating a volume of the droplet by using the thicknesses of the portions of the droplet. The scanning unit may include optical scanners arranged in multiple directions, storing thicknesses of portions of the droplet scanned by the scanning unit.

公开(公告)号：US20210005839A1

公开(公告)日：2021-01-07

申请号：US16812566

申请日：2020-03-09

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Jeongwon Han ,  Jongsung Kim

IPC: H01L51/52 ,  H01L27/32 ,  H01L51/00 ,  H01L51/56 ,  B65H18/14

Abstract: An apparatus for manufacturing a display device includes a first roller from which a film member is unwound, a second roller around which the film member is wound, a flatness maintainer that is arranged between the first roller and the second roller and keeps at least one of an upper surface and a lower surface of the film member, flat, and a sensing unit arranged on at least one of the upper surface of the film member and the lower surface of the film member and detecting droplets dropped from a head unit onto the film member.

公开(公告)号：US10686133B2

公开(公告)日：2020-06-16

申请号：US16667117

申请日：2019-10-29

Applicant: Samsung Display Co., Ltd.

Inventor： Byungchul Lee ,  Heungcheol Jeong ,  Myungsoo Huh ,  Jongsung Kim ,  Byoung-hoon Choi

IPC: H01L21/00 ,  H01L51/00 ,  H01L51/56 ,  G01N21/956 ,  G01B11/27 ,  B41J25/00 ,  B41J2/21 ,  B41J2/01 ,  H01L27/32

Abstract: A display panel manufacturing system includes a substrate providing module configured to provide a substrate including an active region on which thin-film transistors are disposed, and a peripheral region adjacent to the active region, a test substrate providing module configured to provide a test substrate, an organic film forming module configured to form an ink pattern on each of the substrate and the test substrate, the organic film forming module including a plurality of heads, each of which is configured to drop an ink, an offset inspection module configured to inspect the ink pattern on the substrate, a pattern inspection module configured to inspect the ink pattern on the test substrate, and a droplet inspection module configured to inspect an ink, which is dropped from a head selected from the heads.

公开(公告)号：US20210050270A1

公开(公告)日：2021-02-18

申请号：US16820149

申请日：2020-03-16

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Jongsung Kim ,  Honggi Min

IPC: H01L21/66 ,  H01L51/56 ,  H01L51/00

Abstract: A droplet measurement method is described. The droplet measurement method may include discharging a droplet on a substrate, scanning the droplet by moving a scanning unit, and calculating a volume of the droplet by using the thicknesses of the portions of the droplet. The scanning unit may include optical scanners arranged in multiple directions, storing thicknesses of portions of the droplet scanned by the scanning unit.

公开(公告)号：US20190103559A1

公开(公告)日：2019-04-04

申请号：US15996531

申请日：2018-06-04

Applicant: Samsung Display Co., Ltd.

Inventor： Byungchul LEE ,  Heungcheol Jeong ,  Myungsoo Huh ,  Jongsung Kim ,  Byoung-hoon Choi

IPC: H01L51/00 ,  H01L27/32 ,  H01L51/56 ,  G01B11/27 ,  G01N21/956

Abstract: A display panel manufacturing system includes a substrate providing module configured to provide a substrate including an active region on which thin-film transistors are disposed, and a peripheral region adjacent to the active region, a test substrate providing module configured to provide a test substrate, an organic film forming module configured to form an ink pattern on each of the substrate and the test substrate, the organic film forming module including a plurality of heads, each of which is configured to drop an ink, an offset inspection module configured to inspect the ink pattern on the substrate, a pattern inspection module configured to inspect the ink pattern on the test substrate, and a droplet inspection module configured to inspect an ink, which is dropped from a head selected from the heads.

公开(公告)号：US11563202B2

公开(公告)日：2023-01-24

申请号：US16929597

申请日：2020-07-15

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Jongsung Kim ,  Honggi Min

IPC: H01L21/00 ,  H01L51/56 ,  H01L27/32 ,  B05B12/08 ,  H01L51/00 ,  B05B12/00

Abstract: An apparatus for manufacturing a display device includes: a stage configured to hold a substrate; a movement unit configured to move relative to the stage; a head unit arranged on the movement unit and including a nozzle for discharging a liquid droplet onto the substrate; and a sensor unit configured to emit a laser to irradiate the liquid droplet falling from the head unit to the substrate to sense a portion of a planar shape of the liquid droplet. The apparatus is configured to control the movement unit or the head unit based on the sensed portion of the planar shape.

公开(公告)号：US11387433B2

公开(公告)日：2022-07-12

申请号：US16812566

申请日：2020-03-09

Applicant: SAMSUNG DISPLAY CO., LTD.

Inventor： Jeongwon Han ,  Jongsung Kim

IPC: H01L51/52 ,  B65H18/14 ,  H01L51/56 ,  H01L27/32 ,  H01L51/00

Abstract: An apparatus for manufacturing a display device includes a first roller from which a film member is unwound, a second roller around which the film member is wound, a flatness maintainer that is arranged between the first roller and the second roller and keeps at least one of an upper surface and a lower surface of the film member, flat, and a sensing unit arranged on at least one of the upper surface of the film member and the lower surface of the film member and detecting droplets dropped from a head unit onto the film member.