公开(公告)号：US20190103559A1

公开(公告)日：2019-04-04

申请号：US15996531

申请日：2018-06-04

Applicant: Samsung Display Co., Ltd.

Inventor： Byungchul LEE ,  Heungcheol Jeong ,  Myungsoo Huh ,  Jongsung Kim ,  Byoung-hoon Choi

IPC: H01L51/00 ,  H01L27/32 ,  H01L51/56 ,  G01B11/27 ,  G01N21/956

Abstract: A display panel manufacturing system includes a substrate providing module configured to provide a substrate including an active region on which thin-film transistors are disposed, and a peripheral region adjacent to the active region, a test substrate providing module configured to provide a test substrate, an organic film forming module configured to form an ink pattern on each of the substrate and the test substrate, the organic film forming module including a plurality of heads, each of which is configured to drop an ink, an offset inspection module configured to inspect the ink pattern on the substrate, a pattern inspection module configured to inspect the ink pattern on the test substrate, and a droplet inspection module configured to inspect an ink, which is dropped from a head selected from the heads.

公开(公告)号：US10686133B2

公开(公告)日：2020-06-16

申请号：US16667117

申请日：2019-10-29

Applicant: Samsung Display Co., Ltd.

Inventor： Byungchul Lee ,  Heungcheol Jeong ,  Myungsoo Huh ,  Jongsung Kim ,  Byoung-hoon Choi

IPC: H01L21/00 ,  H01L51/00 ,  H01L51/56 ,  G01N21/956 ,  G01B11/27 ,  B41J25/00 ,  B41J2/21 ,  B41J2/01 ,  H01L27/32

Abstract: A display panel manufacturing system includes a substrate providing module configured to provide a substrate including an active region on which thin-film transistors are disposed, and a peripheral region adjacent to the active region, a test substrate providing module configured to provide a test substrate, an organic film forming module configured to form an ink pattern on each of the substrate and the test substrate, the organic film forming module including a plurality of heads, each of which is configured to drop an ink, an offset inspection module configured to inspect the ink pattern on the substrate, a pattern inspection module configured to inspect the ink pattern on the test substrate, and a droplet inspection module configured to inspect an ink, which is dropped from a head selected from the heads.