THIN FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME
    1.
    发明申请
    THIN FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME 审中-公开
    薄膜晶体管及其制造方法

    公开(公告)号:US20150206976A1

    公开(公告)日:2015-07-23

    申请号:US14283063

    申请日:2014-05-20

    Abstract: A thin film transistor includes a gate electrode disposed on a substrate, a gate insulating layer disposed on the gate electrode and the substrate, an oxide semiconductor pattern disposed on the gate insulating layer, wherein a part of the oxide semiconductor overlaps the gate electrode, a source electrode disposed on a part of the oxide semiconductor pattern, and a drain electrode disposed on a part of the oxide semiconductor pattern spaced apart from the source electrode, wherein a thickness of the gate insulating layer in a channel region, the channel region overlapping the gate electrode, is thinner than a thickness of the gate insulating layer in a remaining region, the remaining region other than the channel region.

    Abstract translation: 薄膜晶体管包括设置在基板上的栅极电极,设置在栅极电极和基板上的栅极绝缘层,设置在栅极绝缘层上的氧化物半导体图案,其中氧化物半导体的一部分与栅电极重叠, 设置在所述氧化物半导体图案的一部分上的源极,以及设置在与所述源极间隔开的所述氧化物半导体图案的一部分上的漏电极,其中,所述沟道区中的所述栅极绝缘层的厚度与 栅电极比剩余区域中的栅极绝缘层的厚度薄,除了沟道区域之外的剩余区域。

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