Abstract:
A thin film transistor includes a gate electrode disposed on a substrate, a gate insulating layer disposed on the gate electrode and the substrate, an oxide semiconductor pattern disposed on the gate insulating layer, wherein a part of the oxide semiconductor overlaps the gate electrode, a source electrode disposed on a part of the oxide semiconductor pattern, and a drain electrode disposed on a part of the oxide semiconductor pattern spaced apart from the source electrode, wherein a thickness of the gate insulating layer in a channel region, the channel region overlapping the gate electrode, is thinner than a thickness of the gate insulating layer in a remaining region, the remaining region other than the channel region.
Abstract:
A thin film transistor array panel is provided as follows. A gate electrode is disposed on a substrate. A semiconductor layer is disposed on the gate electrode. A gate insulating layer is disposed between the gate electrode and the semiconductor layer. A source electrode is disposed on a first side of the semiconductor layer, having a first lateral surface. A drain electrode is disposed on a second side of the semiconductor layer, having a second lateral surface. The first and second lateral surfaces define a spacing which overlaps the gate electrode. A metal silicide layer is disposed on the first and second lateral surfaces. A passivation layer is disposed on the metal silicide layer, the source electrode and the drain electrode. The passivation layer is not in contact with the first and second lateral surfaces.