Abstract:
A mask substrate inspection system includes a measurement target module, a camera module, and a control module. The measurement target module includes a mask substrate and a surface light source supplying a light to the mask substrate. The camera module generates image information of the mask substrate using the light from the surface light source. The control module determines whether defects are present in the mask substrate using the image information, without damaging the mask substrate.
Abstract:
A display device includes a display panel and a scan driving circuit. The display panel includes a plurality of pixels and a plurality of sensors. The scan driving circuit drives a plurality of scan lines. Pixels in a j-th row among the plurality of pixels are connected to a j-th scan line among the plurality of scan lines, in which j is a positive integer. Sensors, which correspond to the pixels in the j-th row, from among the plurality of sensors are connected to an a-th scan line among the plurality of scan lines, in which a is a positive integer different from j.
Abstract:
A data processing device includes a first reference value generator which generates a first reference value corresponding to a ratio of a chromatic color using image signals or first image signals obtained by gamma-compensating the image signals, a white generator which generates a white image signal and second image signals using the first image signals and a second reference value corresponding to an amount of a white data in use, a third reference value generator which generates a third reference value using a first color coordinate corresponding to a color coordinate of the second image signals, a second color coordinate corresponding to a color coordinate of the white image signal, the first reference value, and the second reference value, and a gamut mapper which maps the second image signals to a color coordinate corresponding to the third reference value to generate third image signals.