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公开(公告)号:US11003072B2
公开(公告)日:2021-05-11
申请号:US16532389
申请日:2019-08-05
Applicant: Samsung Display Co., Ltd.
Inventor: Seunghyun Moon , Dongwook Yang , Hyundae Lee
Abstract: A mask substrate inspection system includes a measurement target module, a camera module, and a control module. The measurement target module includes a mask substrate and a surface light source supplying a light to the mask substrate. The camera module generates image information of the mask substrate using the light from the surface light source. The control module determines whether defects are present in the mask substrate using the image information, without damaging the mask substrate.
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公开(公告)号:US11862100B2
公开(公告)日:2024-01-02
申请号:US17731886
申请日:2022-04-28
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor: Kangbin Jo , Ilnam Kim , Seunghyun Moon , Dongwook Yang , Hyundae Lee , Goeun Cha
IPC: G09G3/3266 , G09G3/3233 , G06V40/13 , G06F3/041
CPC classification number: G09G3/3266 , G06F3/0412 , G06V40/1318 , G09G3/3233 , G09G2300/0426
Abstract: A display device includes a display panel and a scan driving circuit. The display panel includes a plurality of pixels and a plurality of sensors. The scan driving circuit drives a plurality of scan lines. Pixels in a j-th row among the plurality of pixels are connected to a j-th scan line among the plurality of scan lines, in which j is a positive integer. Sensors, which correspond to the pixels in the j-th row, from among the plurality of sensors are connected to an a-th scan line among the plurality of scan lines, in which a is a positive integer different from j.
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