公开(公告)号：US12037158B2

公开(公告)日：2024-07-16

申请号：US17746758

申请日：2022-05-17

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Massimiliano Pesaturo ,  Massimo Greppi

IPC: B65D1/36 ,  B65D85/68 ,  H05K13/00

CPC classification number: B65D1/36 ,  B65D85/68 ,  H05K13/0084 ,  B65D2585/86

Abstract: Tray for containing electronic components formed by a bearing body, substantially planar, having a first and a second face. First holding structures extend from the first face of the bearing body and second holding structures extend from the second face of the bearing body. Each second holding structure is aligned with a respective first holding structure in a vertical direction perpendicular to the first and the second faces of the bearing body. Each first holding structure is formed by first protrusions mutually spaced by first spaces and arranged along a first closed line; each second holding structure is formed by second protrusions mutually spaced by second spaces and arranged along a second closed line. Each second protrusion is aligned, in parallel with the vertical direction, with the first spaces and each first protrusion is aligned, in parallel with the vertical direction, with the second spaces.

公开(公告)号：US11852676B2

公开(公告)日：2023-12-26

申请号：US17672588

申请日：2022-02-15

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Carlo Caimi ,  Massimiliano Pesaturo ,  Stefano Antonio Mastrorosa ,  Alfredo Lorenzo Poli ,  Marco Della Seta

IPC: G01R31/28 ,  G01R31/00 ,  G01R31/317 ,  G01R31/3187 ,  G01R31/3185

CPC classification number: G01R31/2856 ,  G01R31/007 ,  G01R31/3187 ,  G01R31/31703 ,  G01R31/31724 ,  G01R31/318525

Abstract: An integrated circuit includes a sub-system and a reference sub-system. The reference sub-system is substantially identical to the sub-system but is non-operating by default. The integrated circuit includes a test circuit that obtains a parameter value of the sub-system and a reference parameter from the reference sub-system. The integrated circuit detects deterioration of the sub-system based on the parameter value and the reference parameter. The integrated circuit deactivates the sub-system and activates the reference sub-system responsive to detecting deterioration of the sub-system.

公开(公告)号：US12025506B2

公开(公告)日：2024-07-02

申请号：US17219433

申请日：2021-03-31

Applicant: STMicroelectronics S.r.l.

Inventor： Massimiliano Pesaturo ,  Marco Omar Ghidoni

IPC: G01K7/01 ,  H05K1/18

CPC classification number: G01K7/015 ,  H05K1/181 ,  H05K2201/10151 ,  H05K2201/10378 ,  H05K2201/10515 ,  H05K2201/1053

Abstract: An ambient temperature sensor is provided that may be coupled to a PCB. The ambient temperature sensor includes a package including a first cap and an insulating structure. The insulating structure is formed of thermally insulating material, and the first cap and the insulating structure delimit a first cavity. A semiconductor device is included and generates an electrical signal indicative of a temperature. The semiconductor device is fixed on top of the insulating structure and arranged within the first cavity. The package may be coupled to the PCB so that the insulating structure is interposed between the semiconductor device and the PCB. The insulating structure delimits a second cavity, which extends below the semiconductor device and is open laterally.

公开(公告)号：US11778358B2

公开(公告)日：2023-10-03

申请号：US17567777

申请日：2022-01-03

Applicant: STMicroelectronics S.r.l.

Inventor： Enrico Rosario Alessi ,  Fabio Passaniti ,  Tiziano Chiarillo ,  Massimiliano Pesaturo

IPC: H04R25/00 ,  H04R1/10 ,  G01R29/12 ,  H04R29/00

CPC classification number: H04R1/1016 ,  G01R29/12 ,  H04R1/1041 ,  H04R29/00 ,  H04R2420/07 ,  H04R2460/15

Abstract: A detection device includes a pressure sensor, which provides a pressure signal indicative of an ambient pressure in an operating environment. An electrostatic-charge-variation sensor provides a charge-variation signal indicative of a variation of electrostatic charge associated with the operating environment, and processing circuitry is coupled to the pressure sensor and to the electrostatic-charge-variation sensor so as to receive the pressure signal and the charge-variation signal, and jointly processes the pressure signal and the charge-variation signal for detecting a variation between a first operating environment and a second operating environment for the detection device. The second operating environment is different from the first operating environment.

公开(公告)号：US11353503B2

公开(公告)日：2022-06-07

申请号：US16451660

申请日：2019-06-25

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Paolo Aranzulla ,  Fabiano Frigoli ,  Massimo Greppi ,  Marco Camerani ,  Sebastiano Conti ,  Guglielmo Roccasalvo ,  Enrico Rosario Alessi ,  Massimiliano Pesaturo

IPC: G01R31/28 ,  G01M3/32

Abstract: A method for testing the hermetic seal of a packaged device, which includes: a package that delimits a device chamber; and a transducer device, which is arranged within the device chamber and generates an electrical signal indicating at least one physical quantity external to the package. The testing method includes the steps of: imposing a reference pressure in the device chamber; arranging the packaged device in a testing chamber in which a testing pressure is present, different from the reference pressure; and subsequently detecting possible pressure variations within the device chamber.