公开(公告)号：US09158317B2

公开(公告)日：2015-10-13

申请号：US14155544

申请日：2014-01-15

申请人： SK hynix Inc.

发明人： Jong Ho Son

IPC分类号： G05F3/02 ,  G05F1/10 ,  G05F1/46

CPC分类号： G05F1/46 ,  G05F1/565

摘要： An internal voltage generation circuit including a drive control signal generator and an internal voltage driver. The drive control signal generator generates a drive control signal in response to an active pulse signal and a drive signal. The internal voltage driver, electrically coupled to the drive control signal generator, divides a level of an internal voltage signal in response to the drive control signal to generate a division voltage signal, compares a level of the division voltage signal with a level of a reference voltage signal to generate the drive signal, and drives the internal voltage signal in response to the drive signal.

摘要翻译： 内部电压产生电路，包括驱动控制信号发生器和内部电压驱动器。 驱动控制信号发生器响应于有效脉冲信号和驱动信号产生驱动控制信号。 电耦合到驱动控制信号发生器的内部电压驱动器响应于驱动控制信号分配内部电压信号的电平以产生分压电压信号，将分压电压信号的电平与参考电平 电压信号以产生驱动信号，并根据驱动信号驱动内部电压信号。

公开(公告)号：US09460775B1

公开(公告)日：2016-10-04

申请号：US14818093

申请日：2015-08-04

申请人： SK hynix Inc.

发明人： Jun Yong Song ,  Jong Ho Son

IPC分类号： G11C7/00 ,  G11C11/4091 ,  G11C11/4074 ,  G11C11/4076 ,  G11C11/4094

CPC分类号： G11C11/4091 ,  G11C11/4074 ,  G11C11/4076 ,  G11C11/4094

摘要： A sense amplifier driving device may include a sense amplifier driving block configured to supply a post overdriving voltage to a pull-up power line coupled to a sense amplifier, the post overdriving voltage supplied to the sense amplifier during a post overdriving operation period in correspondence to a pull-up driving signal. The sense amplifier driving device may include a driving signal generation block configured to compare a reference voltage, set by a voltage trimming signal, with a level of a power supply voltage, and generate the pull-up driving signal for controlling whether to perform a post overdriving operation.

摘要翻译： 感测放大器驱动装置可以包括读出放大器驱动块，其构造成将后过驱动电压提供给耦合到读出放大器的上拉电源线，后过驱动电压在后驱动操作周期期间提供给读出放大器，对应于 上拉驱动信号。 读出放大器驱动装置可以包括：驱动信号生成块，被配置为将通过电压调整信号设置的参考电压与电源电压的电平进行比较，并且生成用于控制是否执行一个信号的上拉驱动信号 过驱动。

公开(公告)号：US09984733B2

公开(公告)日：2018-05-29

申请号：US15493508

申请日：2017-04-21

申请人： SK hynix Inc.

发明人： Jong Ho Son ,  Jae Wook Lee

IPC分类号： G11C7/00 ,  G11C7/12 ,  G11C7/06 ,  G11C5/14

CPC分类号： G11C7/12 ,  G11C5/147 ,  G11C5/148 ,  G11C7/065

摘要： A power control device and a semiconductor memory device including the same may be provided. The power control device, may include an amplifier configured to amplify an input signal having a second power-supply voltage level to a first power-supply voltage level having a voltage level different from the second power-supply voltage level. The power control device may include an output portion configured to set an output signal of the amplifier to a specific logic level upon receiving a control signal, and output the output signal having the specific logic level.

公开(公告)号：US09659629B2

公开(公告)日：2017-05-23

申请号：US15253389

申请日：2016-08-31

申请人： SK hynix Inc.

发明人： Jun Yong Song ,  Jong Ho Son ,  Saeng Hwan Kim

IPC分类号： G11C7/00 ,  G11C11/4076 ,  G11C11/4091 ,  G11C11/4094 ,  G11C11/4074

CPC分类号： G11C11/4076 ,  G11C7/08 ,  G11C11/4074 ,  G11C11/4091 ,  G11C11/4094

摘要： A sense amplifier driving device, and more particularly, a technology for improving the post overdriving operation characteristic of a semiconductor device. A sense amplifier driving device includes a driving signal generation block configured to compare a reference voltage set by a voltage trimming signal and a level of a power supply voltage, and generate a pull-up driving signal for controlling an operation of a sense amplifier; and a sense amplifier driving block configured to supply a driving voltage to a pull-up power line of the sense amplifier for an active operation period in correspondence to the pull-up driving signal, the driving signal generation block including a voltage divider configured to divide the power supply voltage, and output a divided voltage; and a voltage comparison section configured to compare the reference voltage and the divided voltage, and output a control signal for controlling an overdriving operation of the sense amplifier.

公开(公告)号：US09076550B2

公开(公告)日：2015-07-07

申请号：US13720319

申请日：2012-12-19

申请人： SK hynix Inc.

发明人： Jong Ho Son ,  Yong Ju Kim

IPC分类号： G11C11/40 ,  G01K7/42 ,  G11C11/406 ,  G11C29/50 ,  G11C29/56 ,  G11C11/41

CPC分类号： G11C11/40626 ,  G01K7/425 ,  G11C11/41 ,  G11C29/50016 ,  G11C29/56 ,  G11C29/56012 ,  G11C2029/5002

摘要： A test circuit of a semiconductor apparatus includes a test temperature information generation section, an erroneous operation prevention unit, and a refresh cycle adjustment unit. The test temperature information generation section outputs test temperature information having a plurality of bits in a test operation mode, and irregularly changes logic values of the plurality of bits and transition time points of the logic values. The erroneous operation prevention unit generates a temperature compensation signal in response to the test temperature information. The refresh cycle adjustment unit changes a cycle of a reference refresh signal in response to the temperature compensation signal, and generates a refresh signal.

摘要翻译： 半导体装置的测试电路包括测试温度信息产生部分，错误操作防止单元和刷新周期调节单元。 测试温度信息生成部分在测试操作模式下输出具有多个位的测试温度信息，并且不规则地改变逻辑值的多个位的逻辑值和转换时间点。 错误操作防止单元根据测试温度信息生成温度补偿信号。 刷新周期调整单元响应于温度补偿信号改变参考刷新信号的周期，并产生刷新信号。