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公开(公告)号:US12205914B2
公开(公告)日:2025-01-21
申请号:US17648425
申请日:2022-01-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Inhyung Song , Seokhyun Lee , Jongyoun Kim
IPC: H01L23/00 , H01L23/31 , H01L23/538 , H01L25/065 , H01L25/10
Abstract: A semiconductor package includes a base substrate; a redistribution substrate disposed on the base substrate, and that includes first insulating layers and redistribution pattern layers disposed on the first insulating layers, respectively; a semiconductor chip disposed on the redistribution substrate and electrically connected to the redistribution pattern layers; and a chip structure disposed on the redistribution substrate adjacent to the semiconductor chip and electrically connected to the semiconductor chip through the redistribution pattern layers, wherein the semiconductor chip includes a body that has an active surface that faces the redistribution substrate; first and second contact pads spaced apart from each other below the active surface; a first bump structure and a passive device electrically connected to the first connection pad at a lower level from the first connection pad; and a second bump structure electrically connected to the second connection pad at a lower level from the second connection pad.
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公开(公告)号:US20240136250A1
公开(公告)日:2024-04-25
申请号:US18197998
申请日:2023-05-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yeonho Jang , Inhyung Song , Kyungdon Mun , Hyeonjeong Hwang
IPC: H01L23/373 , H01L23/00 , H01L23/31 , H01L23/498 , H01L25/065 , H01L25/16
CPC classification number: H01L23/3738 , H01L23/3128 , H01L23/49816 , H01L24/08 , H01L24/16 , H01L24/32 , H01L24/73 , H01L25/0652 , H01L25/165 , H01L25/0657 , H01L2224/08145 , H01L2224/16148 , H01L2224/16225 , H01L2224/32145 , H01L2224/73204 , H01L2224/73253 , H01L2225/06513 , H01L2225/06524 , H01L2225/06541 , H01L2924/1431 , H01L2924/1436
Abstract: The present disclosure provides semiconductor packages including a heat dissipation structure. In some embodiments, the semiconductor package includes a package substrate, a stacked chip disposed on the package substrate and including a lower chip and an upper chip, a memory chip disposed on the package substrate adjacent to the stacked chip, and an encapsulant encapsulating at least a portion of the stacked chip and the memory chip on the package substrate. An upper surface of the upper chip is exposed from the encapsulant. A dummy silicon chip is in contact with the upper chip on the lower chip.
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公开(公告)号:US20240065002A1
公开(公告)日:2024-02-22
申请号:US18231341
申请日:2023-08-08
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dongkyu Kim , Joonsung Kim , Inhyung Song , Yeonho Jang
CPC classification number: H10B80/00 , H01L25/18 , H01L24/20 , H01L25/50 , H01L2224/0557 , H01L2224/06181 , H01L2224/19 , H01L2224/96 , H01L2224/214 , H01L2924/0105 , H01L2924/01049 , H01L2924/01083 , H01L2924/01051 , H01L2924/01029 , H01L2924/01047 , H01L2924/0103 , H01L2924/01082 , H01L24/32 , H01L2224/32145 , H01L24/33 , H01L2224/33181 , H01L24/73 , H01L2224/73204 , H01L2224/73253 , H01L2224/17181 , H01L24/16 , H01L24/17 , H01L24/05 , H01L24/06 , H01L24/19 , H01L24/96 , H01L2224/16145
Abstract: A semiconductor device including a first lower buffer chip, an upper buffer chip disposed on an upper surface of the first lower buffer chip, a plurality of conductive posts spaced apart from the first lower buffer chip and disposed on a lower surface of the upper buffer chip, and a first memory chip stack structure disposed on the upper buffer chip and including a plurality of first memory chips.
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公开(公告)号:US11887931B2
公开(公告)日:2024-01-30
申请号:US17213506
申请日:2021-03-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Inhyung Song , Kyoung Lim Suk , Jaegwon Jang , Wonkyoung Choi
IPC: H01L21/768 , H01L23/522 , H01L23/00 , H01L23/31 , H01L23/495 , H01L23/528 , H01L23/532 , H01L27/08 , H01L23/538
CPC classification number: H01L23/5384 , H01L23/3114 , H01L23/5386 , H01L24/14
Abstract: A semiconductor package includes a first semiconductor device on a first redistribution substrate, a first mold layer that covers the first semiconductor device and the first redistribution substrate, and a second redistribution substrate on the first mold layer, the second redistribution substrate including a first opening that exposes a top surface of the first mold layer, a sidewall of the second redistribution substrate that is exposed to the first opening having a stepwise structure.
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