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    Apparatus for all-optical self-aligning holographic phase modulation and motion sensing and method sensing and method for sensing such phase modulation
    3.
    发明授权
    Apparatus for all-optical self-aligning holographic phase modulation and motion sensing and method sensing and method for sensing such phase modulation 失效
    用于全光学自对准全息相位调制和运动感测的装置以及用于感测这种相位调制的方法感测和方法

    公开(公告)号：US5335062A

    公开(公告)日：1994-08-02

    申请号：US978811

    申请日：1992-11-19

    申请人： Rudolf Hofmeister ,  Amnon Yariv

    发明人： Rudolf Hofmeister ,  Amnon Yariv

    IPC分类号： G01D5/26 ,  G01H9/00 ,  G03H1/02 ,  G01B9/02

    CPC分类号： G03H1/02 ,  G01D5/266 ,  G01H9/00 ,  G03H2001/0033 ,  G03H2001/0268

    摘要： An all-optical, self-aligning, holographic phase modulation and motion sensing apparatus includes a crystal exhibiting a zero electric field photorefractive effect, a phase modulation or vibration source or mechanism, a source of coherent optical radiation, beam splitting and directing optics, and at least one optical radiation detector. The output from the optical radiation source is split into separate beams, one or all of which are phase modulated. The beams are directed through the crystal exhibiting a zero electric field photorefractive effect, and the resultant transmitted beams are detected by an optical radiation detector to provide a measurement of the phase modulation of the beams. The sensor functions in the absence of an electric field because of the unique characteristic of the crystal exhibiting the zero electric field photorefractive effect whereby if either the phase of the crystal's index grating or of the interfering beams is modulated with a phase change very much less than .pi./2, the intensity of the beam transmitted through the crystal varies linearly with the modulation. Such linear modulation allows crystals exhibiting the zero electric field photorefractive effect to remotely sense phase modulations or vibrations of any type in the absence of electrical signals in the vicinity of the sensor.

    摘要翻译： 全光学自对准全息相位调制和运动感测装置包括呈现零电场光折射效应的晶体，相位调制或振动源或机构，相干光辐射源，分束和引导光学器件，以及 至少一个光辐射检测器。 来自光辐射源的输出被分成单独的光束，其中一个或全部是相位调制的。 光束被引导通过呈现零电场光折射效应的晶体，并且所得到的透射光束由光学辐射检测器检测以提供光束的相位调制的测量。 由于具有零电场光折变效应的晶体的独特特性，传感器在不存在电场的情况下起作用，由此，如果晶体的折射率光栅的相位或干涉光束的相位相位变化非常小于 pi / 2，透射通过晶体的光束的强度随着调制线性变化。 这种线性调制允许呈现零电场光折变效应的晶体在传感器附近没有电信号的情况下远程检测任何类型的相位调制或振动。

    Passive alignment of laser with lens assembly
    5.
    发明申请
    Passive alignment of laser with lens assembly 有权
    激光与镜头组件的被动对准

    公开(公告)号：US20050226570A1

    公开(公告)日：2005-10-13

    申请号：US11027041

    申请日：2004-12-30

    申请人： Chris Togami ,  Rudolf Hofmeister ,  Mina Farr

    发明人： Chris Togami ,  Rudolf Hofmeister ,  Mina Farr

    IPC分类号： G02B6/42

    CPC分类号： G02B6/4246 ,  G02B6/4204 ,  G02B6/4292

    摘要： A transceiver and assembly process is provided to passively align a lens within a transmitting sleeve of a duplex port assembly with a light emitting component within an insert molded package during the assembly of the transceiver. The transceiver design and manufacturing process allow for pivoting of the receiving sleeve around a substantially common access such that a light detecting component may be actively aligned with a lens included in a receiving sleeve of the duplex port assembly.

    摘要翻译： 提供收发器和组装过程，以在收发器的组装期间将透镜在双重端口组件的发射套筒内与发光部件被动地对准插入模制封装内的发光部件。 收发器设计和制造过程允许接收套筒围绕基本上共同的接近方向枢转，使得光检测部件可以与包括在双工端口组件的接收套筒中的透镜主动对准。

    Methods and structures for testing optical subassemblies at higher and lower temperatures
    6.
    发明申请
    Methods and structures for testing optical subassemblies at higher and lower temperatures 审中-公开
    在较高和较低温度下测试光学组件的方法和结构

    公开(公告)号：US20050025449A1

    公开(公告)日：2005-02-03

    申请号：US10929944

    申请日：2004-08-30

    申请人： John Dirkson ,  James Douma ,  Rudolf Hofmeister ,  Samantha Bench ,  Dev Kumar

    发明人： John Dirkson ,  James Douma ,  Rudolf Hofmeister ,  Samantha Bench ,  Dev Kumar

    IPC分类号： G02B6/00 ,  H04B10/08

    CPC分类号： H04B10/07

    摘要： An assembly and method for testing an optical subassembly by locally heating or cooling the optical subassembly. Locally heating or cooling the optical subassembly can include using a thermal transfer assembly. The thermal transfer assembly can include a thermoelectric cooler. A clamping assembly is provided to place the optical subassembly in electrical communication with a testing assembly. The thermal transfer assembly can be associated with the clamping assembly. After achieving the desired temperature, a data stream is transmitted through the optical subassembly and evaluated for compliance.

    摘要翻译： 通过局部加热或冷却光学组件来测试光学组件的组件和方法。 局部加热或冷却光学组件可包括使用热转印组件。 热转印组件可以包括热电冷却器。 提供夹紧组件以将光学子组件放置成与测试组件电连通。 热转印组件可与夹紧组件相关联。 达到所需温度后，通过光学组件传输数据流并进行评估。

    Aligning optical components with three degrees of translational freedom
    7.
    发明申请
    Aligning optical components with three degrees of translational freedom 有权
    将光学元件与三个平移自由度对准

    公开(公告)号：US20050281515A1

    公开(公告)日：2005-12-22

    申请号：US11125918

    申请日：2005-05-10

    申请人： Chris Togami ,  Gary Sasser ,  Rudolf Hofmeister ,  Paul Rosenberg ,  Frank Levinson ,  Axel Mehnert

    发明人： Chris Togami ,  Gary Sasser ,  Rudolf Hofmeister ,  Paul Rosenberg ,  Frank Levinson ,  Axel Mehnert

    IPC分类号： G02B6/36 ,  G02B6/42

    CPC分类号： G02B6/4204 ,  G02B6/423 ,  G02B6/4246

    摘要： The principles of the present invention relate to aligning optical components with three degrees of translational freedom. A lens pin, a lens base, and a molded package are aligned in a first direction, a second direction, and a third direction such that the signal strength of optical signals transferred between a lens included in the lens pin and the molded package is optimized. The lens pin is mechanically coupled to the lens base to fix the position of the lens relative to the molded package in the first direction. Subsequently, the lens base and the molded package are realigned in the second and third directions such that the signal strength is again optimized. The lens base is mechanically coupled to the molded package to fix the position of the lens base relative to the molded package in the second and third directions.

    摘要翻译： 本发明的原理涉及将具有三个平移自由度的光学部件对准。 透镜销，透镜基座和模制封装在第一方向，第二方向和第三方向上对准，使得在包括在透镜销的透镜和模制封装之间传输的光信号的信号强度被优化 。 透镜销被机械联接到透镜基座，以在第一方向上固定透镜相对于模制包装的位置。 随后，透镜基座和模制封装在第二和第三方向上重新对准，使得信号强度再次被优化。 透镜基座机械耦合到模制封装件，以在第二和第三方向上固定透镜基座相对于模制封装件的位置。

    Transceiver module and integrated circuit with clock and data recovery clock diplexing
    8.
    发明申请
    Transceiver module and integrated circuit with clock and data recovery clock diplexing 有权
    收发器模块和具有时钟和数据恢复时钟双工的集成电路

    公开(公告)号：US20050281193A1

    公开(公告)日：2005-12-22

    申请号：US11118172

    申请日：2005-04-29

    申请人： Rudolf Hofmeister ,  Lewis Aronson

    发明人： Rudolf Hofmeister ,  Lewis Aronson

    IPC分类号： H04L1/00 ,  H04L1/20 ,  H04L1/24

    CPC分类号： H04L1/243 ,  H04L1/205

    摘要： An integrated circuit. The integrated circuit is usable in a transceiver module. The integrated circuit includes an input port that is configured to receive a data stream. A clock port on the integrated circuit is configured to receive a reference clock diplexed with another signal or voltage used by the integrated circuit. An eye opening circuit is connected to the input port and clock. The eye opening circuit is configured to retime the data stream received at the input port. An output port is connected to the eye opening circuits The output port is configured to transmit a retimed signal from the eye opening circuit to a device external to the integrated circuit. A bypass circuit is connected to the input port and the output port. The bypass circuit may selectively bypass the eye opening circuit.

    摘要翻译： 集成电路。 集成电路可用于收发器模块。 集成电路包括被配置为接收数据流的输入端口。 集成电路上的时钟端口被配置为接收与由集成电路使用的另一信号或电压双工的参考时钟。 打开电路连接到输入端口和时钟。 眼睛打开电路被配置为重新计算在输入端口处接收的数据流。 输出端口连接到眼睛打开电路。输出端口被配置为将重新定时信号从眼睛打开电路传输到集成电路外部的装置。 旁路电路连接到输入端口和输出端口。 旁路电路可以选择性地旁路眼睛打开电路。

    Electrical testing system with electrical adapter
    9.
    发明申请
    Electrical testing system with electrical adapter 失效
    带电器的电气测试系统

    公开(公告)号：US20050064743A1

    公开(公告)日：2005-03-24

    申请号：US10994581

    申请日：2004-11-22

    申请人： Rudolf Hofmeister ,  Samantha Bench

    发明人： Rudolf Hofmeister ,  Samantha Bench

    IPC分类号： H01R20060101 ,  H01R9/03 ,  H01R12/00 ,  H01R12/71 ,  H01R13/64 ,  H01R25/00 ,  H01R27/00 ,  H01R27/02 ,  H01R31/00 ,  H01R33/88 ,  H05K1/00

    CPC分类号： H01R12/716 ,  H01R2201/20

    摘要： A system for using an electrical adapter to test an electrical device is provided. The system includes a tester, an electrical device, and the electrical adapter. The electrical adapter includes a board having first and second planar surfaces, a first electrical socket coupled to the first planar surface of the printed circuit board and a second electrical socket coupled to the second planar surface of the printed circuit board. The board includes electrical connectors electrically coupling the first and second electrical sockets to each other. The first electrical socket of the adapter is suitable for temporary connection to an electrical interface of the tester, and the second electrical socket is suitable for temporary connection to an electrical interface of the electrical device. The electrical device can be one of a plurality of electrical devices and the tester can be one of a plurality of testers.

    摘要翻译： 提供了一种使用电气适配器测试电气设备的系统。 该系统包括测试仪，电气设备和电气适配器。 电适配器包括具有第一和第二平面的板，连接到印刷电路板的第一平面的第一电插座和耦合到印刷电路板的第二平面的第二电插座。 该电路板包括将第一和第二电插座彼此电耦合的电连接器。 适配器的第一个电源插座适合临时连接到测试仪的电气接口，第二个电源插座适合临时连接到电气设备的电气接口。 电气设备可以是多个电气设备中的一个，测试器可以是多个测试仪中的一个。

    Method for calibrating an optoelectronic device using apd bit error rate
    10.
    发明申请
    Method for calibrating an optoelectronic device using apd bit error rate 审中-公开
    使用apd误码率校准光电子器件的方法

    公开(公告)号：US20050001152A1

    公开(公告)日：2005-01-06

    申请号：US10899941

    申请日：2004-07-27

    申请人： James Stewart ,  Anthony Ho ,  Rudolf Hofmeister ,  Darin Douma ,  Stephen Hosking ,  Andreas Weber ,  Jeffrey Price

    发明人： James Stewart ,  Anthony Ho ,  Rudolf Hofmeister ,  Darin Douma ,  Stephen Hosking ,  Andreas Weber ,  Jeffrey Price

    IPC分类号： H04B10/158 ,  H01J40/14

    CPC分类号： H04B10/6931 ,  H04B10/6911

    摘要： Methods and processes are disclosed for calibrating optoelectronic devices, such as optoelectronic transceivers and optoelectronic receivers, based upon a measured avalanche photodiode bit error rate. In general, the method involves measuring a bit error rate for the avalanche photodiode and adjusting the reverse bias voltage of the avalanche photodiode until the bit error rate is minimized. This process is repeated for each of a variety of different thermal conditions. Information concerning each thermal condition and the corresponding reverse bias voltage is stored in a memory of the optoelectronic device.

    摘要翻译： 公开了基于测量的雪崩光电二极管误码率来校准光电器件（例如光电收发器和光电接收器）的方法和过程。 通常，该方法包括测量雪崩光电二极管的误码率，并调整雪崩光电二极管的反向偏置电压，直到误码率最小化为止。 对于各种不同的热条件，重复该过程。 关于每个热条件和相应的反向偏置电压的信息被存储在光电子器件的存储器中。