Method and test system for performing a run-time measurement

    公开(公告)号:US11005579B1

    公开(公告)日:2021-05-11

    申请号:US16861531

    申请日:2020-04-29

    Inventor: Rolf Lorenzen

    Abstract: A test system and method of performing a run-time measurement for calibration of a device used for time-of-flight measurement are disclosed. The method comprises: providing a measurement device, a device under test and a directive component having three ports; connecting the directive component to a transmission port of the measurement device and a reception port of the measurement device; generating a signal by a signal generator; forwarding the signal to the directive component; receiving at least a response by a signal receiver; and determining a loop time indicative of the run-time between the directive component and the device under test as well as a time of internal processing of the device under test, wherein the loop time is independent of a signal processing time of a signal path between the measurement device and the directive component.

    Arbitrary waveform sequencer device and method

    公开(公告)号:US10921844B2

    公开(公告)日:2021-02-16

    申请号:US15995978

    申请日:2018-06-01

    Abstract: An arbitrary waveform sequencer device for playing a list of at least a first and a second arbitrary waveform file in a sequence is provided. The arbitrary waveform sequencer device comprises a list increment condition control unit configured to control an increment from the first to the second arbitrary waveform file as a function of an increment condition, and a transition control unit configured to control a timing of the increment.

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