公开(公告)号：US10171266B2

公开(公告)日：2019-01-01

申请号：US15148026

申请日：2016-05-06

Applicant: Rohde & Schwarz GmbH & Co. KG

Inventor： Gottfried Holzmann ,  Werner Mittermaier ,  Ralf Plaumann ,  Thomas Lutz

IPC: H04L25/02 ,  H04W24/06 ,  G01R31/28 ,  G01R35/00 ,  G01R1/20 ,  H04B3/46

Abstract: A switch-extender is connected to a measurement system and to several DUTs. It splits a signal from the measurement system into several signals so that the several DUTs receive the same signal and can therefore be tested in parallel. The switch-extender further includes at least one amplifier and/or at least one attenuator for every output port so that every signal has the same signal level no matter what the individual attenuation factor of the signal connectors or of the internal printed circuit board is. Furthermore a method for calibrating the measurement system as well as for the switch-extender and the signal connectors describes how to obtain the needed calibration values both for the downlink path and for the uplink path without changing the signal connector.

公开(公告)号：US09628202B2

公开(公告)日：2017-04-18

申请号：US14633966

申请日：2015-02-27

Applicant: Rohde & Schwarz GmbH & Co. KG

Inventor： Gottfried Holzmann ,  Ralf Plaumann ,  Peter Wolanin ,  Wilfried Dilling ,  Rudolf Schindlmeier ,  Rolf Lorenzen ,  Anton Steinegger ,  Werner Mittermaier

IPC: H04B17/00 ,  G06F11/22 ,  G06F11/273

CPC classification number: H04B17/0085 ,  G06F11/2294 ,  G06F11/273

Abstract: A testing front end module for testing a plurality of devices under test (DUT) includes a testing signal interface, a vector signal generator (VSG) coupled to the testing signal interface and configured to generate testing signals upon reception of testing routine signals from a remote controller via the testing signal interface, a vector signal analyzer (VSA) coupled to the testing signal interface and configured to receive testing response signals from a plurality of DUTs and to transmit the received testing response signals to the remote controller via the testing signal interface, a multiplexer/demultiplexer (MUX/DEMUX) coupled to the VSG and the VSA, the MUX/DEMUX being configured to multiplex the received testing response signals and to demultiplex the generated testing signals, and a test device interface coupled to the MUX/DEMUX and configured to couple the testing front end module to the plurality of DUTs.