Abstract:
Described is an interferometric surface contour measurement system for projecting structured light patterns onto an object. The measurement system includes an interferometric projector, an imager, and a processor. The imager is rigidly coupled to the projector to maintain a stable relationship to the projected, structured light pattern. The imager receives the structured light pattern and together with the processor, determines whether the projected image includes a positional error. In some embodiments, the projector is a multi-channel projector, each channel having an optical axis spatially separated from the others, one of the channels including the imager and dedicated for determining positional error. In other embodiments, the projector is a single-channel projector projecting a structured light pattern onto the object, a portion of the structured light pattern being tapped-off for determining positional error.
Abstract:
Described is an interferometric surface contour measurement system for projecting structured light patterns onto an object. The measurement system includes an interferometric projector, an imager, and a processor. The imager is rigidly coupled to the projector to maintain a stable relationship to the projected, structured light pattern. The imager receives the structured light pattern and together with the processor, determines whether the projected image includes a positional error. In some embodiments, the projector is a multi-channel projector, each channel having an optical axis spatially separated from the others, one of the channels including the imager and dedicated for determining positional error. In other embodiments, the projector is a single-channel projector projecting a structured light pattern onto the object, a portion of the structured light pattern being tapped-off for determining positional error.
Abstract:
Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.
Abstract:
Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.
Abstract:
Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.
Abstract:
Described are an imaging device and method for determining three-dimensional position information of a surface of an object. The device includes a pair of optical fibers, a phase shifter, a detector array and a processor. The phase shifter is coupled to one of the optical fibers and is used to change a phase of optical radiation emitted from the optical fiber relative to a phase of optical radiation emitted from the other optical fiber. The detector array receives optical radiation scattered by the surface of the object. The processor communicates with the detector array and the phase shifter. Signals generated by the detector array are received by the processor and three-dimensional position information for the surface is calculated in response to the received optical radiation scattered by the surface of the object and the change in the relative phase of optical radiation emitted by the optical fibers.
Abstract:
Described are an imaging device and method for determining three-dimensional position information of a surface of an object. The device includes a pair of optical fibers, a phase shifter, a detector array and a processor. The phase shifter is coupled to one of the optical fibers and is used to change a phase of optical radiation emitted from the optical fiber relative to a phase of optical radiation emitted from the other optical fiber. The detector array receives optical radiation scattered by the surface of the object. The processor communicates with the detector array and the phase shifter. Signals generated by the detector array are received by the processor and three-dimensional position information for the surface is calculated in response to the received optical radiation scattered by the surface of the object and the change in the relative phase of optical radiation emitted by the optical fibers.
Abstract:
Systems and methods are provided in example embodiments for performing binary translation. A binary translation system converts, by a translator module, source instructions to target instructions. The binary translation system identifies a condition code block in the source instructions, where the condition code block includes a plurality of condition bits. In response to identifying the condition code block, the binary translation system provides an optimizer module to convert the condition code block. Then, the binary translation system performs a pre-execution on the condition code block to resolve the plurality of condition bits in the condition code block.
Abstract:
A method for preventing regression defects when updating software components is disclosed. In one embodiment, such a method includes providing a source repository storing multiple software components (e.g., software modules, source files, sections of program code, etc.). The method determines associations between the software components and stores these associations in a database. The method further enables a user to check out a software component from the source repository in order to make updates, and check in the software component to the source repository once updates are made. At a designated time, such as when the software component is checked in or out, the method automatically checks the database to determine whether the software component has an association with any other software component in the source repository. The method notifies the user if an association is discovered. A corresponding computer program product and apparatus are also disclosed.
Abstract:
In a computing system having a processor package, an operating system, and a physical I/O device, a partial virtual machine is provided to instantiate a virtual I/O device corresponding to the physical I/O device, the virtual I/O device having a virtual I/O controller. The partial virtual machine includes an I/O port trap to capture an I/O request to the virtual I/O device by the operating system; an I/O controller emulator coupled to the I/O port trap to handle an I/O control request to the virtual I/O controller, when the I/O request comprises an I/O control request; an I/O device emulator coupled to the I/O port trap component to handle an I/O access request to communicate with the virtual I/O device, when the I/O request comprises an I/O access request; and a device driver coupled to the I/O controller emulator and the I/O device emulator to communicate with the physical I/O device based at least in part on the I/O control request and the I/O access request. The partial virtual machine executes within a secure enclave session within the processor package, improving security of I/O transactions by preventing access to the partial virtual machine by the operating system.