公开(公告)号：US07599071B2

公开(公告)日：2009-10-06

申请号：US11910646

申请日：2006-04-04

Applicant: Robert F. Dillon ,  Roy D. Allen ,  Neil Judell ,  Yi Qian

Inventor： Robert F. Dillon ,  Roy D. Allen ,  Neil Judell ,  Yi Qian

IPC: G01B9/02 ,  G01B11/02

CPC classification number: G01B11/2441 ,  G01B11/2527

Abstract: Described is an interferometric surface contour measurement system for projecting structured light patterns onto an object. The measurement system includes an interferometric projector, an imager, and a processor. The imager is rigidly coupled to the projector to maintain a stable relationship to the projected, structured light pattern. The imager receives the structured light pattern and together with the processor, determines whether the projected image includes a positional error. In some embodiments, the projector is a multi-channel projector, each channel having an optical axis spatially separated from the others, one of the channels including the imager and dedicated for determining positional error. In other embodiments, the projector is a single-channel projector projecting a structured light pattern onto the object, a portion of the structured light pattern being tapped-off for determining positional error.

Abstract translation: 描述了一种用于将结构光图案投影到物体上的干涉测量表面轮廓测量系统。 测量系统包括干涉式投影仪，成像器和处理器。 成像器刚性耦合到投影仪以保持与投影的结构化光图案的稳定关系。 成像器接收结构化光图案并与处理器一起确定投影图像是否包括位置误差。 在一些实施例中，投影仪是多通道投影仪，每个通道具有与其它通道在空间上分离的光轴，其中一个通道包括成像器，专用于确定位置误差。 在其他实施例中，投影仪是将结构化光图案投射到物体上的单通道投影仪，结构化光图案的一部分被分接以确定位置误差。

公开(公告)号：US20080180693A1

公开(公告)日：2008-07-31

申请号：US11910646

申请日：2006-04-04

Applicant: Robert F. Dillon ,  Roy D. Allen ,  Neil Judell ,  Yi Qian

Inventor： Robert F. Dillon ,  Roy D. Allen ,  Neil Judell ,  Yi Qian

IPC: G01B9/02

CPC classification number: G01B11/2441 ,  G01B11/2527

Abstract: Described is an interferometric surface contour measurement system for projecting structured light patterns onto an object. The measurement system includes an interferometric projector, an imager, and a processor. The imager is rigidly coupled to the projector to maintain a stable relationship to the projected, structured light pattern. The imager receives the structured light pattern and together with the processor, determines whether the projected image includes a positional error. In some embodiments, the projector is a multi-channel projector, each channel having an optical axis spatially separated from the others, one of the channels including the imager and dedicated for determining positional error. In other embodiments, the projector is a single-channel projector projecting a structured light pattern onto the object, a portion of the structured light pattern being tapped-off for determining positional error.

Abstract translation: 描述了一种用于将结构光图案投影到物体上的干涉测量表面轮廓测量系统。 测量系统包括干涉式投影仪，成像器和处理器。 成像器刚性耦合到投影仪以保持与投影的结构化光图案的稳定关系。 成像器接收结构化光图案并与处理器一起确定投影图像是否包括位置误差。 在一些实施例中，投影仪是多通道投影仪，每个通道具有与其它通道在空间上分离的光轴，其中一个通道包括成像器，专用于确定位置误差。 在其他实施例中，投影仪是将结构化光图案投射到物体上的单通道投影仪，结构化光图案的一部分被分接以确定位置误差。

公开(公告)号：US07751063B2

公开(公告)日：2010-07-06

申请号：US11910638

申请日：2006-04-04

Applicant: Robert F. Dillon ,  Neil Judell ,  Yi Qian ,  Yunqing Zhu ,  D. Scott Ackerson ,  Gurpreet Singh

Inventor： Robert F. Dillon ,  Neil Judell ,  Yi Qian ,  Yunqing Zhu ,  D. Scott Ackerson ,  Gurpreet Singh

IPC: G01B9/02 ,  G01B11/02

CPC classification number: G01B11/2441 ,  G01B11/2527

Abstract: Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.

Abstract translation: 描述了多通道干涉测量表面轮廓测量系统。 测量系统包括多通道干涉仪投影仪，数码相机和处理器。 该投影仪包括两个或更多个干涉仪通道。 每个通道具有与其他通​​道的光轴在空间上分开的光轴。 每个通道将条纹图案投射到要测量的对象的表面上。 通过数码相机获取投影在物体表面上的条纹图案的图像数据。 处理器控制不同空间频率的条纹图案的投影，调整每个条纹图案的相位并响应于相机图像数据生成表面轮廓数据。 多通道干涉测量表面轮廓测量系统提供了许多优于传统单通道干涉测量系统的优点，包括降低对光学噪声的灵敏度，改进的稳定性和增加的测量精度。

公开(公告)号：US20080165341A1

公开(公告)日：2008-07-10

申请号：US11910638

申请日：2006-04-04

Applicant: Robert F. Dillon ,  Neil Judell ,  Yi Qian ,  Yuqing Zhu ,  D. Scott Ackerson ,  Gurpreet Singh

Inventor： Robert F. Dillon ,  Neil Judell ,  Yi Qian ,  Yuqing Zhu ,  D. Scott Ackerson ,  Gurpreet Singh

IPC: G01C11/12 ,  G02B27/00 ,  G02B7/00 ,  G01N21/00

CPC classification number: G01B11/2441 ,  G01B11/2527

Abstract: Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.

Abstract translation: 描述了多通道干涉测量表面轮廓测量系统。 测量系统包括多通道干涉仪投影仪，数码相机和处理器。 该投影仪包括两个或更多个干涉仪通道。 每个通道具有与其他通​​道的光轴在空间上分开的光轴。 每个通道将条纹图案投射到要测量的对象的表面上。 通过数码相机获取投影在物体表面上的条纹图案的图像数据。 处理器控制不同空间频率的条纹图案的投影，调整每个条纹图案的相位并响应于相机图像数据生成表面轮廓数据。 多通道干涉测量表面轮廓测量系统提供了许多优于传统单通道干涉测量系统的优点，包括降低对光学噪声的灵敏度，改进的稳定性和增加的测量精度。

公开(公告)号：US20090324212A1

公开(公告)日：2009-12-31

申请号：US12553526

申请日：2009-09-03

Applicant: Robert F. Dillon ,  Neil Judell ,  Yi Qian ,  Yuqing Zhu ,  D. Scott Ackerson ,  Gurpreet Singh

Inventor： Robert F. Dillon ,  Neil Judell ,  Yi Qian ,  Yuqing Zhu ,  D. Scott Ackerson ,  Gurpreet Singh

IPC: G03B17/00

CPC classification number: G01B11/2441 ,  G01B11/2527

Abstract: Described is a multiple channel interferometric surface contour measurement system. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. The projector includes two or more interferometer channels. Each channel has an optical axis spatially separate from the optical axes of the other channels. Each channel projects a fringe pattern onto the surface of an object to be measured. Image data for the fringe patterns projected on the object surface are acquired by the digital camera. The processor controls the projection of the fringe patterns of different spatial frequencies, adjusts the phase of each fringe pattern and generates surface contour data in response to the camera image data. The multiple channel interferometric surface contour measurement system provides numerous advantages over conventional single channel interferometric systems, including reduced sensitivity to optical noise, improved stability and increased measurement accuracy.

Abstract translation: 描述了多通道干涉测量表面轮廓测量系统。 测量系统包括多通道干涉仪投影仪，数码相机和处理器。 该投影仪包括两个或更多个干涉仪通道。 每个通道具有与其他通​​道的光轴在空间上分开的光轴。 每个通道将条纹图案投射到要测量的对象的表面上。 通过数码相机获取投影在物体表面上的条纹图案的图像数据。 处理器控制不同空间频率的条纹图案的投影，调整每个条纹图案的相位并响应于相机图像数据生成表面轮廓数据。 多通道干涉测量表面轮廓测量系统提供了许多优于传统单通道干涉测量系统的优点，包括降低对光学噪声的灵敏度，改进的稳定性和增加的测量精度。

公开(公告)号：US07595892B2

公开(公告)日：2009-09-29

申请号：US11910642

申请日：2006-04-04

Applicant: Neil Judell ,  Robert F. Dillon

Inventor： Neil Judell ,  Robert F. Dillon

IPC: G01B11/02 ,  G01B9/02

CPC classification number: G01B11/2441 ,  G01B11/2527

Abstract: Described are a multiple channel interferometric surface contour measurement system and methods of determining surface contour data for the same. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. Fringe patterns generated by spatially separate channels in the projector are projected onto an object surface to be measured. The digital camera acquires images of the fringe patterns and the processor determines surface contour data from the fringe patterns. More specifically, fringe numbers are determined for points on the object surface based on image data. The fringe numbers are modified according to collinear adjustment values so that the modified fringe numbers correspond to a common, collinear axis for the interferometer projector. After unwrapping the modified fringe numbers, the unwrapped values are modified by the collinear adjustment values to obtain accurate fringe numbers for the pixels in each interferometer channel.

Abstract translation: 描述了多通道干涉测量表面轮廓测量系统以及确定其表面轮廓数据的方法。 测量系统包括多通道干涉仪投影仪，数码相机和处理器。 将通过投影仪中的空间分离的通道产生的边缘图案投影到要测量的物体表面上。 数码相机获取条纹图案的图像，并且处理器从边缘图案确定表面轮廓数据。 更具体地说，基于图像数据确定物体表面上的点的条纹数。 根据共线调整值修改条纹数，使得修改的条纹数对应于用于干涉仪投影仪的共同的共线轴。 在展开修改的条纹编号之后，通过共线调整值修改展开的值，以获得每个干涉仪通道中的像素的精确边缘数。

公开(公告)号：US20080259348A1

公开(公告)日：2008-10-23

申请号：US11910642

申请日：2006-04-04

Applicant: Neil Judell ,  Robert F. Dillon

Inventor： Neil Judell ,  Robert F. Dillon

IPC: G01B11/24

CPC classification number: G01B11/2441 ,  G01B11/2527

Abstract: Described are a multiple channel interferometric surface contour measurement system and methods of determining surface contour data for the same. The measurement system includes a multiple channel interferometer projector, a digital camera and a processor. Fringe patterns generated by spatially separate channels in the projector are projected onto an object surface to be measured. The digital camera acquires images of the fringe patterns and the processor determines surface contour data from the fringe patterns. More specifically, fringe numbers arc determined for points on the object surface based on image data. The fringe numbers are modified according to collinear adjustment values so that the modified fringe numbers correspond to a common, collinear axis for the interferometer projector. After unwrapping the modified fringe numbers, the unwrapped values are modified by the collinear adjustment values to obtain accurate fringe numbers for the pixels in each interferometer channel.

Abstract translation: 描述了多通道干涉测量表面轮廓测量系统以及确定其表面轮廓数据的方法。 测量系统包括多通道干涉仪投影仪，数码相机和处理器。 将通过投影仪中的空间分离的通道产生的边缘图案投影到要测量的物体表面上。 数码相机获取条纹图案的图像，并且处理器从边缘图案确定表面轮廓数据。 更具体地，基于图像数据，对物体表面上的点确定条纹数。 根据共线调整值修改条纹数，使得修改的条纹数对应于用于干涉仪投影仪的共同的共线轴。 在展开修改的条纹编号之后，通过共线调整值修改展开的值以获得每个干涉仪通道中的像素的精确边缘数。

公开(公告)号：US08477318B2

公开(公告)日：2013-07-02

申请号：US12738207

申请日：2008-10-23

Applicant: Robert F. Dillon ,  Yi Qian ,  Gurpreet Singh

Inventor： Robert F. Dillon ,  Yi Qian ,  Gurpreet Singh

IPC: G01B11/02 ,  G01B9/21 ,  G01B11/24

CPC classification number: A61B5/0088 ,  A61B5/0084 ,  A61B5/4547 ,  A61B5/682 ,  A61C9/006 ,  A61C9/0073 ,  G01B11/2527

Abstract: Described are an imaging device and method for determining three-dimensional position information of a surface of an object. The device includes a pair of optical fibers, a phase shifter, a detector array and a processor. The phase shifter is coupled to one of the optical fibers and is used to change a phase of optical radiation emitted from the optical fiber relative to a phase of optical radiation emitted from the other optical fiber. The detector array receives optical radiation scattered by the surface of the object. The processor communicates with the detector array and the phase shifter. Signals generated by the detector array are received by the processor and three-dimensional position information for the surface is calculated in response to the received optical radiation scattered by the surface of the object and the change in the relative phase of optical radiation emitted by the optical fibers.

Abstract translation: 描述了一种用于确定物体表面的三维位置信息的成像装置和方法。 该装置包括一对光纤，移相器，检测器阵列和处理器。 移相器耦合到光纤中的一个，并且用于改变从光纤相对于从另一光纤发射的光辐射的相位发射的光辐射的相位。 检测器阵列接收由物体表面散射的光辐射。 处理器与检测器阵列和移相器通信。 由检测器阵列产生的信号由处理器接收，并且响应于由物体的表面散射的接收的光辐射和由光学器件发射的光辐射的相对相位的变化来计算表面的三维位置信息 纤维。

公开(公告)号：US20100225927A1

公开(公告)日：2010-09-09

申请号：US12738207

申请日：2008-10-23

Applicant: Robert F. Dillon ,  Yi Qian ,  Gurpreet Singh

Inventor： Robert F. Dillon ,  Yi Qian ,  Gurpreet Singh

IPC: G01B11/02

CPC classification number: A61B5/0088 ,  A61B5/0084 ,  A61B5/4547 ,  A61B5/682 ,  A61C9/006 ,  A61C9/0073 ,  G01B11/2527

Abstract: Described are an imaging device and method for determining three-dimensional position information of a surface of an object. The device includes a pair of optical fibers, a phase shifter, a detector array and a processor. The phase shifter is coupled to one of the optical fibers and is used to change a phase of optical radiation emitted from the optical fiber relative to a phase of optical radiation emitted from the other optical fiber. The detector array receives optical radiation scattered by the surface of the object. The processor communicates with the detector array and the phase shifter. Signals generated by the detector array are received by the processor and three-dimensional position information for the surface is calculated in response to the received optical radiation scattered by the surface of the object and the change in the relative phase of optical radiation emitted by the optical fibers.

Abstract translation: 描述了一种用于确定物体表面的三维位置信息的成像装置和方法。 该装置包括一对光纤，移相器，检测器阵列和处理器。 移相器耦合到光纤中的一个，并且用于改变从光纤发射的光辐射相对于从另一光纤发射的光辐射的相位。 检测器阵列接收由物体表面散射的光辐射。 处理器与检测器阵列和移相器通信。 由检测器阵列产生的信号由处理器接收，并且响应于由物体的表面散射的接收的光辐射和由光学器件发射的光辐射的相对相位的变化来计算表面的三维位置信息 纤维。

公开(公告)号：US4851659A

公开(公告)日：1989-07-25

申请号：US015055

申请日：1987-02-17

Applicant: Robert F. Dillon ,  Cardinal Warde

Inventor： Robert F. Dillon ,  Cardinal Warde

IPC: H01J31/24 ,  H01J40/14

CPC classification number: H01J31/24

Abstract: In one voltage-driven embodiment, a high spatial resolution two-dimensional array of bistable completely cross-talk free light modulation elements is constituted as a lamination of an input two-dimensional photoconductor thin film layer and an output two-dimensional electroluminescent phosphor thin film layer disposed in etched wells individually defined in corresponding cores of the optical fibers of a fiber optic face plate. In another voltage-driven embodiment, a very low cost high spatial resolution 2-D array of bistable substantially cross-talk free light modulation elements is constituted as a lamination of a photoconductor thin film layer, a selectively dimensioned and apertured opaque masking thin film layer, and an electroluminescent phosphor thin film layer. In an electron-driven embodiment, a high spatial resolution two-dimensional array of substantially cross-talk free bistable light modulating elements is constituted as an assembly of a two-dimensional input window having a deposited photocathode thin film layer, a two-dimensional output window having a deposited cathodoluminescent phosphor, and a two-dimensional glass capillary array defining plural charge feed forward and light feedback channels mounted therebetween in a vacuum tight enclosure. In a further electron driven embodiment, a microchannel plate subassembly is mounted in the vacuum-tight enclosure in the place of the glass capillary array. In the several embodiments, voltages are applied via transparent conductors to the photoconductor and phosphor layers.

Abstract translation: 在一个电压驱动实施例中，双稳态完全无串扰光调制元件的高空间分辨率二维阵列被构成为输入二维光电导体薄膜层和输出二维电致发光荧光体薄膜 层设置在分别限定在光纤面板的光纤的相应芯中的蚀刻孔中。 在另一个电压驱动实施例中，双稳态基本上无串扰的光调制元件的非常低成本的高空间分辨率2-D阵列被构成为感光体薄膜层，选择性尺寸和开孔的不透明掩模薄膜层 ，以及电致发光荧光体薄膜层。 在电子驱动实施例中，基本上无串扰双稳态光调制元件的高空间分辨率二维阵列被构成为具有沉积的光电阴极薄膜层，二维输出的二维输入窗口的组件 窗口，其具有沉积的阴极发光荧光体，以及限定多个电荷前馈的二维玻璃毛细管阵列和安装在其间的真空密封外壳中的光反馈通道。 在另一个电子驱动实施例中，微通道板子组件安装在真空密封的外壳中，代替玻璃毛细管阵列。 在几个实施例中，通过透明导体将电压施加到感光体和荧光体层。