公开(公告)号：US20210080330A1

公开(公告)日：2021-03-18

申请号：US17009849

申请日：2020-09-02

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Kan TAKEUCHI ,  Yoshio TAKAZAWA ,  Fumio TSUCHIYA ,  Daisuke OSHIDA ,  Naoya OTA ,  Masaki SHIMADA ,  Shinya KONISHI

IPC: G01K1/02 ,  H02P29/68 ,  G01K7/01 ,  G08C17/02

Abstract: A semiconductor device according to an embodiment includes a holding circuit including a buffer configured to obtain a heat stress information having a temperature dependency every predetermined period and a stress counter configured to accumulate the heat stress information and hold the accumulated value as a cumulative stress count value, a control circuit including an operation determination threshold value, and a wireless communication circuit. According to the semiconductor device according to the embodiment, while reducing the power consumption, it is possible to wirelessly transmit the cumulative heat stress information.

公开(公告)号：US20190154518A1

公开(公告)日：2019-05-23

申请号：US16126816

申请日：2018-09-10

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Kan TAKEUCHI ,  Shinya KONISHI ,  Fumio TSUCHIYA ,  Masaki SHIMADA

IPC: G01K7/01 ,  G01R31/30

Abstract: An object of the present invention is to provide a technique of duplexing monitor circuits in which a common cause failure can be eliminated. A semiconductor device has: a first monitor circuit monitoring that temperature or voltage of the semiconductor device is within a normal operation range; and a second monitor circuit monitoring normal operation of the first monitor circuit. The first and second monitor circuits generate information of temperature or voltage on the basis of different principles.

公开(公告)号：US20200081757A1

公开(公告)日：2020-03-12

申请号：US16543129

申请日：2019-08-16

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Naoya OTA ,  Kan TAKEUCHI ,  Fumio TSUCHIYA ,  Masaki SHIMADA ,  Shinya KONISHI ,  Daisuke OSHIDA

IPC: G06F11/07

Abstract: The semiconductor device has a module having a predetermined function, an error information acquisition circuit for acquiring error information about an error occurring in the module, a stress acquisition circuit for acquiring a stress accumulated value as an accumulated value of stress applied to the semiconductor device, and an analysis data storage for storing analysis data as data for analyzing the state of the semiconductor device, the error information and the stress accumulated value at the time of occurrence of the error being associated with each other.

公开(公告)号：US20170187358A1

公开(公告)日：2017-06-29

申请号：US15367019

申请日：2016-12-01

Applicant: Renesas Electronics Corporation

Inventor： Kan TAKEUCHI ,  Masaki SHIMADA ,  Takeshi OKAGAKI ,  Yoshio TAKAZAWA

IPC: H03K3/03 ,  H03K5/159 ,  H03K3/011

CPC classification number: H03K3/0315 ,  G01R31/2856 ,  G01R31/31725 ,  H03K3/011 ,  H03K5/159

Abstract: There is to provide a semiconductor device capable of predicting a wear-out failure based on the degradation stress cumulative amount of power supply voltage and environmental temperature imposed on the device, which includes a ring oscillator having a plurality of stages of inverters, and a control circuit that emphasizes the voltage dependency and temperature dependency of an oscillation frequency of the ring oscillator or a control circuit that emphasizes the temperature dependency not the voltage dependency.

公开(公告)号：US20160291078A1

公开(公告)日：2016-10-06

申请号：US14973561

申请日：2015-12-17

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Masaki SHIMADA ,  Kan TAKEUCHI

IPC: G01R31/26 ,  G01R31/28

CPC classification number: G01R31/2642 ,  G01R31/2834 ,  G01R31/2856 ,  G01R31/3004

Abstract: An object of the invention is to provide a semiconductor apparatus capable of achieving conditions that are stricter than the conditions in which the stable operation is guaranteed, without increasing the circuit size. A semiconductor apparatus (10) includes a semiconductor circuit (11); a voltage generator (12) that selects one of at least two types of voltages and applies a power supply voltage, the at least two types of voltages including a normal voltage at which the semiconductor circuit (11) normally operates and a low voltage which is lower than the normal voltage; and a clock generator (13) that supplies the semiconductor circuit (11) with a clock signal having a constant frequency regardless of the power supply voltage.

Abstract translation: 本发明的目的是提供一种半导体装置，其能够在不增加电路尺寸的情况下实现比稳定操作保证的条件更严格的条件。 半导体装置（10）包括半导体电路（11）; 电压发生器（12），其选择至少两种类型的电压中的一种并施加电源电压，所述至少两种类型的电压包括半导体电路（11）正常工作的正常电压和低电压 低于正常电压; 以及时钟发生器（13），其与所述电源电压无关地向所述半导体电路（11）提供具有恒定频率的时钟信号。